TY  - JOUR
A1  - Reiche, Jürgen
A1  - Barberka, Thomas Andreas
A1  - Janietz, Dietmar
A1  - Hofmann, Dieter
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - X-ray structure investigation and computer modelling of Langmuir-Blodgett films formed from disc-shaped pentaalkines
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
A1  - Stömmer, Ralph
T1  - X-ray scattering from thin organic films and multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - X-ray scattering from silicon surfaces
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Tsirelson, Vladimir G.
A1  - Gorfan, S. V.
T1  - X-ray scattering amplitude of an atom in a permanent external electric field
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Kubowicz, Stephan
A1  - Thünemann, Andreas F.
A1  - Geue, Thomas
A1  - Watson, M. D.
A1  - Tchebotareva, N.
A1  - Müllen, K.
T1  - X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Pietsch, Ullrich
T1  - X-ray reflectivity from sinusoidal surface relief gratings
Y1  - 2002
SN  - 0023-4753
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - X-ray reflectivity from sinusoidal surface relief gratings
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Poloucek, P.
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Symietz, Christian
A1  - Brezesinski, Gerald
T1  - X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Saphiannikova, Marina
T1  - X-ray investigations of formation efficiency of buried azobenzene polymer density gratings
Y1  - 2003
UR  - http://scitation.aip.org/journals/doc/JAPIAU-ft/vol_93/iss_6/3161_1.html
U6  - https://doi.org/10.1063/1.1554753
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Hesse, A.
A1  - Zhuang, Y.
A1  - Holý, Vaclav
A1  - Stangl, Jochen
A1  - Zerlauth, S.
A1  - Schaffler, F.
A1  - Bauer, Günther
T1  - X-ray grazing-incidence study of inhomogeneous strain relaxation in Si/SiGe wires
Y1  - 2003
SN  - 0168-583X
ER  -