TY  - JOUR
A1  - Serrano-Munoz, Itziar
A1  - Fernández Serrano, Ricardo
A1  - Saliwan-Neumann, Romeo
A1  - Gonzalez-Doncel, Gaspar
A1  - Bruno, Giovanni
T1  - Dislocation substructures in pure aluminium after creep deformation as studied by electron backscatter diffraction
JF  - Journal of applied crystallography / International Union of Crystallography
N2  - In the present work, electron backscatter diffraction was used to determine the microscopic dislocation structures generated during creep (with tests interrupted at the steady state) in pure 99.8% aluminium. This material was investigated at two different stress levels, corresponding to the power-law and power-law breakdown regimes. The results show that the formation of subgrain cellular structures occurs independently of the crystallographic orientation. However, the density of these cellular structures strongly depends on the grain crystallographic orientation with respect to the tensile axis direction, with (111) grains exhibiting the highest densities at both stress levels. It is proposed that this behaviour is due to the influence of intergranular stresses, which is different in (111) and (001) grains.
KW  - creep
KW  - pure aluminium
KW  - electron backscatter diffraction (EBSD)
KW  - cellular
KW  - structures
KW  - power law and power-law breakdown
Y1  - 2022
U6  - https://doi.org/10.1107/S1600576722005209
SN  - 1600-5767
VL  - 55
SP  - 860
EP  - 869
PB  - Munksgaard
CY  - Copenhagen
ER  -