TY  - JOUR
A1  - Saposhnikov, Vl. V. V. V.
A1  - Moshanin, Vl.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Experimental results for self-dual multi-output combinational circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Dimitriev, Alexej
A1  - Gössel, Michael
T1  - Self-dual duplication for error detection
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Otscheretnij, Vitalij
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Design of Fault-Tolerant Circuits by self-dual Duplication
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Ocheretnij, V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Modified TMR-system with reduced hardware overhead
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Moshanin, Vl.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Self-dual multi output combinational circuits with output data compaction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
A1  - Morosov, Andrej
T1  - A method of construction of combinational self-checking units with detection of all single faults
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, V. V.
A1  - Morosov, Andrej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - Design of self-checking unidirectional combinational circuits with low area overhead
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Saposhnikov, V. V.
A1  - Morosov, Andrej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - A new design method for self-checking unidirectional combinational circuits
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Otscheretnij, Vitalij
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Fault-tolerant self-dual circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Otscheretnij, Vitalij
A1  - Gössel, Michael
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
T1  - Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Morosov, Andrej
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Design of self dual fault-secure combinational circuits
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Morosov, Andrej
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Self-Checking circuits with unidiectionally independent outputs
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Morosov, Andrej
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, VL. V.
T1  - Design of combinational self-testing devices with unidirectionally independent outputs
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Dmitriev, Alexej
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - Self-dual sequential circuits for concurrent chechking
Y1  - 1999
SN  - 0-7695-0390-X ; 0-7695-0391-8
ER  - 
TY  - JOUR
A1  - Dimitriev, Alexej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
A1  - Saposhnikov, V. V.
T1  - On-line testing by self-dual duplication
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Dimitriev, Alexej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
A1  - Saposhnikov, V. V.
T1  - Self-dual duplication - a new method for on-line testing
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Dimitriev, Alexej
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - Concurrent checking of sequential circuits by alternating inputs
Y1  - 1999
ER  -