TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Davaasambuu, Jav
A1  - Pucher, Andreas
A1  - Kochin, V.
T1  - Atomistic origin of the inverse piezoelectric effect in alpha-SiO2 and alpha-GaPO4
Y1  - 2003
UR  - http://www.edpsciences.org/articles/epl/pdf/2003/12/7666.pdf?access=ok
SN  - 0295-5075
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Leitenberger, Wolfram
A1  - Wendrock, Horst
A1  - Bischoff, Lothar
A1  - Panzner, Tobias
A1  - Grenzer, Jörg
A1  - Pucher, Andreas
T1  - Double pinhole diffraction of white synchrotron radiation
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - Evidence of a density grating under light induced formation of surface relief gratings at polymers containing azobenzene moieties
Y1  - 2003
UR  - http://scitation.aip.org/getpdf/servlet/ GetPDFServlet?filetype=pdf&id=JAPIAU000094000002000963000001&idtype=cvips
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Hesse, A.
A1  - Zhuang, Y.
A1  - Holý, Vaclav
A1  - Stangl, Jochen
A1  - Zerlauth, S.
A1  - Schaffler, F.
A1  - Bauer, Günther
T1  - X-ray grazing-incidence study of inhomogeneous strain relaxation in Si/SiGe wires
Y1  - 2003
SN  - 0168-583X
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Tsirelson, Vladimir G.
A1  - Gorfan, S. V.
T1  - X-ray scattering amplitude of an atom in a permanent external electric field
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Grigorian, Souren A.
A1  - Grenzer, Jörg
A1  - Vartanyants, Ivan A.
T1  - Thermal diffuse scattering in grazing incidence diffraction
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Panzner, Tobias
A1  - Leitenberger, Wolfram
A1  - Grenzer, Jörg
A1  - Bodenthin, Th.
A1  - Geue, Thomas
A1  - Möhwald, Helmuth
T1  - Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Grigorian, Souren A.
A1  - Grenzer, Jörg
A1  - Feranchuk, S.
A1  - Zeimer, Ute
T1  - Grazing-incidence diffraction study of strain-modulated single quantum well nanostructures
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Bhattacharya, M. K.
A1  - Mukherjee, M.
A1  - Sanyal, M. K.
A1  - Geue, Thomas
A1  - Grenzer, Jörg
T1  - Energy dispersive x-ray reflectivity technique to study thermal properties of polymer films
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
A1  - Grenzer, Jörg
A1  - Grigorian, Souren A.
A1  - Fricke, J.
A1  - Gramlich, S.
A1  - Bugge, F.
A1  - Weyers, Markus
A1  - Trankle, G.
T1  - Influence of lateral patterning geometry on lateral carrier confinement in strain-modulated InGaAs- nanostructures
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Kubowicz, Stephan
A1  - Thünemann, Andreas F.
A1  - Geue, Thomas
A1  - Watson, M. D.
A1  - Tchebotareva, N.
A1  - Müllen, K.
T1  - X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - Thin Layers of columns of an amphiphilic hexa-peri-hexabenzocoronene at silicon wafer surfaces
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
T1  - X-ray and VIS light scattering from light-induced polymer gratings
Y1  - 2003
UR  - http://stacks.iop.org/0022-3727/36/A241
U6  - https://doi.org/10.1088/0022-3727/36/10A/350
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Saphiannikova, Marina
T1  - X-ray investigations of formation efficiency of buried azobenzene polymer density gratings
Y1  - 2003
UR  - http://scitation.aip.org/journals/doc/JAPIAU-ft/vol_93/iss_6/3161_1.html
U6  - https://doi.org/10.1063/1.1554753
ER  -