TY  - JOUR
A1  - Reiche, Jürgen
A1  - Kratz, Karl
A1  - Hofmann, Dieter
A1  - Lendlein, Andreas
T1  - Current status of Langmuir monolayer degradation of polymeric biomaterials
JF  - The international journal of artificial organs
N2  - Langmuir monolayer degradation (LMD) experiments with polymers possessing outstanding biomedical application potential yield information regarding the kinetics of their hydrolytic or enzymatic chain scission under well-defined and adjustable degradation conditions. A brief review is given of LMD investigations, including the author's own work on 2-dimensional (2D) polymer systems, providing chain scission data, which are not disturbed by simultaneously occurring transport phenomena, such as water penetration into the sample or transport of scission fragments out of the sample.
 A knowledge-based approach for the description and simulation of polymer hydrolytic and enzymatic degradation based on a combination of fast LMD experiments and computer simulation of the water penetration is briefly introduced. Finally, the advantages and disadvantages of this approach are discussed.
KW  - Monolayer
KW  - Hydrolytic degradation
KW  - Enzymatic degradation
KW  - Biomaterial
KW  - Degradable polymer
Y1  - 2011
U6  - https://doi.org/10.5301/IJAO.2011.6401
SN  - 0391-3988
VL  - 34
IS  - 2
SP  - 123
EP  - 128
PB  - Wichtig
CY  - Milano
ER  - 
TY  - JOUR
A1  - Dietrich, Paul M.
A1  - Glamsch, Stephan
A1  - Ehlert, Christopher
A1  - Lippitz, Andreas
A1  - Kulak, Nora
A1  - Unger, Wolfgang E. S.
T1  - Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon
JF  - Applied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces
N2  - The analysis of chemical and elemental in-depth variations in ultra-thin organic layers with thicknesses below 5 nm is very challenging. Energy- and angle-resolved XPS (ER/AR-XPS) opens up the possibility for non-destructive chemical ultra-shallow depth profiling of the outermost surface layer of ultra-thin organic films due to its exceptional surface sensitivity. For common organic materials a reliable chemical in-depth analysis with a lower limit of the XPS information depth z(95) of about 1 nm can be performed. As a proof-of-principle example with relevance for industrial applications the ER/AR-XPS analysis of different organic monolayers made of amino- or benzamidosilane molecules on silicon oxide surfaces is presented. It is demonstrated how to use the Si 2p core-level region to non-destructively depth-profile the organic (silane monolayer) - inorganic (SiO2/Si) interface and how to quantify Si species, ranging from elemental silicon over native silicon oxide to the silane itself. The main advantage of the applied ER/AR-XPS method is the improved specification of organic from inorganic silicon components in Si 2p core-level spectra with exceptional low uncertainties compared to conventional laboratory XPS. (C) 2015 Elsevier B.V. All rights reserved.
KW  - Synchrotron radiation XPS
KW  - Depth profiling
KW  - Silanes
KW  - Monolayer
KW  - Amines
KW  - Amides
Y1  - 2016
U6  - https://doi.org/10.1016/j.apsusc.2015.12.052
SN  - 0169-4332
SN  - 1873-5584
VL  - 363
SP  - 406
EP  - 411
PB  - Elsevier
CY  - Amsterdam
ER  -