TY - JOUR A1 - Rychkov, Dmitry A1 - Kuznetsov, Alexey A1 - Rychkov, Andrey T1 - Electret properties of polyethylene and polytetrafluoroethylene films with chemically modified surface JF - IEEE transactions on dielectrics and electrical insulation N2 - This paper investigates the effect of chemical surface modification of polytetrafluoroethylene (PTFE) and low density polyethylene (LDPE) films on their electret properties. PTFE films were subjected to wet treatment with three different chemicals: orthophosphoric acid, tetrabutyl titanate and tetraethoxysilane. The technique based on the principles of molecular layer deposition (MLD) method was used to modify the surface of LDPE films with phosphorus trichloride vapors. The surfaces of the films were then corona charged, and the electret charge stability was studied by means of isothermal and thermally stimulated surface potential decay. Both PTFE and LDPE films, after the surface treatment, displayed a considerable enhancement in the charge stability compared to the virgin samples. It is important to note that the enhancement of the charge stability was achieved in the positively charged PTFE films, a result important to practical applications. We attribute this effect of charge stabilization to the formation of new energetically deep traps on the modified surface. Decrease in molecular mobility, due to attachment of new chemical structures to the surface macromolecules, may also contribute to the overall growth of the charge stability. KW - Electrets KW - surface treatment KW - charge stability KW - charge carrier processes KW - polytetrafluoroethylene KW - polyethylene Y1 - 2011 U6 - https://doi.org/10.1109/TDEI.2011.5704487 SN - 1070-9878 VL - 18 IS - 1 SP - 8 EP - 14 PB - Inst. of Electr. and Electronics Engineers CY - Piscataway ER - TY - JOUR A1 - Rychkov, Dmitry A1 - Gerhard, Reimund A1 - Ivanov, Vadim A1 - Rychkov, Andrey T1 - Enhanced electret charge stability on Polyethylene Films treated with Titanium-Tetrachloride vapor JF - IEEE transactions on dielectrics and electrical insulation N2 - Low-density polyethylene (LDPE) films have been treated with titanium-tetrachloride vapor by means of the molecular-layer-deposition method. It is shown that such a treatment leads to a considerable improvement of the electret properties for both positively and negatively charged films. The temperature stability of the electret homo-charge has been increased by approximately 60 degrees C. At the same time, the temporal stability of charge is also considerably improved. Modified low-density polyethylene films show no "cross-over phenomenon" when charged to higher voltages. Thus, it is now possible to produce electrets from polyethylene films with high initial charge densities, but without a strongly reduced charge stability. The influence of a chemical treatment with titanium-tetrachloride vapor on charge injection from aluminum electrodes into polyethylene films was also investigated. It is found that the interface between an aluminum electrode and a modified LDPE surface layer has different injection properties for positive and negative charges. Electrons can be injected across the modified interface, whereas injection of holes is either very limited or non-existent. KW - Electrets KW - chemical modification KW - surface treatment KW - space-charge stability KW - charge-carrier transport KW - polyethylene KW - low-density polyethylene KW - injection Y1 - 2012 SN - 1070-9878 VL - 19 IS - 4 SP - 1305 EP - 1311 PB - Inst. of Electr. and Electronics Engineers CY - Piscataway ER - TY - JOUR A1 - Rychkov, Dmitry A1 - Gerhard, Reimund A1 - Kuznetsov, Alexey A1 - Rychkov, Andrey T1 - Influence of charge density on the trap energy spectrum in fluoroethylenepropylene copolymer films with chemically modified surfaces JF - IEEE transactions on dielectrics and electrical insulation N2 - Tetrafluoroethylene-hexafluoropropylene copolymer (FEP) films were treated with titanium-tetrachloride vapor by means of molecular-layer deposition. The treatment leads to considerable improvements of the electret-charge stability on positively charged films. A slight improvement is also observed for negatively charged films. In line with our previous findings, we attribute the improvement in electret properties to the formation of deeper traps on the chemically modified polymer surfaces. Here, we investigate the influence of the charge density on electret stability of FEP films with modified surfaces. Trap-energy spectra obtained from thermally-stimulated-discharge measurements indicate that the charge stability on modified FEP films depends on how the surface traps are populated and on the availability of additional deeper traps. KW - Electrets KW - chemical modification KW - surface treatment KW - space-charge stability KW - charge-carrier transport KW - polytetrafluoroethylene (PTFE) KW - fluoroethylenepropylene (FEP) copolymer Y1 - 2018 U6 - https://doi.org/10.1109/TDEI.2018.007437 SN - 1070-9878 SN - 1558-4135 VL - 25 IS - 3 SP - 840 EP - 844 PB - Inst. of Electr. and Electronics Engineers CY - Piscataway ER - TY - GEN A1 - Rychkov, Andrey A1 - Stojharov, Valery A1 - Kuznetsov, Alexey A1 - Rychkov, Dmitry T1 - The influence of recrystallization regimes on electret charge stability in low-density polyethylene films T2 - 2018 IEEE 2nd International Conference on Dielectrics (ICD) N2 - The electret state stability in nonpolar semicrystalline polymers is largely determined by the traps located at crystalline/ amorphous phase interfaces. Thus, the thermal history of such polymers should considerably influence their electret properties. In the present work, we investigate how recrystallization influences charge stability in low-density polyethylene corona electrets. It has been found that electret charge stability in quenched samples is higher than in slowly-crystallized ones. Phenomenologicaly, this can be explained by the increased number of deeper traps in samples with smaller crystallite size. KW - electrets KW - low-density polyethylene KW - crystallinity KW - quenching KW - recrystallization Y1 - 2018 SN - 978-1-5386-6389-9 SN - 978-1-5386-6388-2 SN - 978-1-5386-6390-5 U6 - https://doi.org/10.1109/ICD.2018.8514638 PB - IEEE CY - New York ER -