TY - JOUR A1 - Geue, Thomas A1 - Henneberg, Oliver A1 - Pietsch, Ullrich T1 - X-ray reflectivity from sinusoidal surface relief gratings Y1 - 2002 SN - 0023-4753 ER - TY - JOUR A1 - Geue, Thomas A1 - Pietsch, Ullrich A1 - Haferkorn, J. A1 - Stumpe, Joachim A1 - Date, R. W. A1 - Fawcett, A. H. T1 - Competition of alignment and aggregation? : Phenomena in constrained films of LC poly(olefin ulfone)s and maleic anhydride co- and terpolymers Y1 - 1999 ER - TY - JOUR A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Henneberg, Oliver A1 - Pietsch, Ullrich A1 - Rochon, Paul A1 - Natansohn, Almeria T1 - Formation mechanism and dynamics in polymer surface gratings Y1 - 2002 ER - TY - JOUR A1 - Geue, Thomas A1 - Schultz, M. A1 - Englisch, Uwe A1 - Stömmer, Ralph A1 - Pietsch, Ullrich A1 - Meine, Kerstin A1 - Vollhard, D. T1 - Investigation of pH-dependent domain structure of fatty acid salt Langmuir-Blodgett films by means of X-ray diffuse scattering and Atomic Force Microscopy Y1 - 1999 ER - TY - JOUR A1 - Geue, Thomas A1 - Stumpe, Joachim A1 - Pietsch, Ullrich A1 - Haak, M. A1 - Kaupp, G. T1 - Photochemically induced changes of optical anisotropy and surface of LB-multilayers built up by an amphiphilic and liquid crystalline copolymer conating azobenzene moieties Y1 - 1995 ER - TY - JOUR A1 - Gorfman, S. V. A1 - Tsirelson, Vladimir G. A1 - Pietsch, Ullrich T1 - X-ray diffraction by a crystal in a permanent external electric field : general considerations N2 - The variations of X-ray diffraction intensities from a crystal in the presence of a permanent external electric field is modeled analytically using a first-order stationary perturbation theory. The change in a crystal, induced by an external electric field, is separated into two contributions. The first one is related to a pure polarization of an electron subsystem, while the second contribution can be reduced to the displacements of the rigid pseudoatoms from their equilibrium positions. It is shown that a change of the X-ray diffraction intensities mainly originates from the second contribution, while the influence of the pure polarization of a crystal electron subsystem is negligibly small. The quantities restored from an X-ray diffraction experiment in the presence of an external electric field were analyzed in detail in terms of a rigid pseudoatomic model of electron density and harmonic approximation for the atomic thermal motion. Explicit relationships are derived that link the properties of phonon spectra with E-field-induced variations of a structure factor, pseudoatomic displacements and piezoelectric strains. The displacements can be numerically estimated using a model of independent atomic motion if the Debye - Waller factors and pseudoatomic charges are known either from a previous single-crystal X-ray diffraction study or from density functional theory calculations. The above estimations can be used to develop an optimum strategy for a data collection that avoids the measurements of reflections insensitive to the electric-field-induced variations Y1 - 2005 SN - 0108-7673 ER - TY - JOUR A1 - Grenzer, Jörg A1 - Darowski, Nora A1 - Geue, Thomas A1 - Pietsch, Ullrich A1 - Daniel, A. A1 - Rennon, Siegfried A1 - Reithmaier, Johann-Peter A1 - Forchel, Alfred T1 - Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation Y1 - 2001 ER - TY - JOUR A1 - Grenzer, Jörg A1 - Darowski, Nora A1 - Pietsch, Ullrich A1 - Daniel, A. A1 - Reithmaier, Johann-Peter A1 - Rennon, Siegfried A1 - Forchel, Alfred T1 - Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation Y1 - 2000 ER - TY - JOUR A1 - Grenzer, Jörg A1 - Schomburg, E. A1 - Lingott, I. A1 - Ignotov, A. a. A1 - Renk, K. F. A1 - Pietsch, Ullrich A1 - Rose, Dirk A1 - Zeimer, Ute A1 - Melzer, B. J. A1 - Ivanov, S. A1 - Schaposchnikov, S. A1 - Kop'ev, P. S. A1 - Pavel'ev, D. G. A1 - Koschurinov, Yu. T1 - X-ray and transport characterization of an Esaki-Tsu superlattice device Y1 - 1998 ER - TY - JOUR A1 - Haier, P. A1 - Herrmann, B. A. A1 - Esser, N. A1 - Pietsch, Ullrich A1 - Lüders, K. A1 - Richter, W. T1 - Influence of the deposition rate on the structure of thin metal layers Y1 - 1998 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Chi, Li Feng A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Pietsch, Ullrich A1 - Rochon, Paul A1 - Natansohn, Almeria T1 - Atomic force microscopy inspection of the early state of formation of polymer surface relief grating Y1 - 2001 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Geue, Thomas A1 - Pietsch, Ullrich A1 - Winter, Bernd T1 - Investigation of azobenzene side group orientation in polymer surface relief gratings by means of photoelectron spectroscopy N2 - The molecular orientation of azobenzene side groups in polymer films before (nonpatterned) and after (patterned) development of a surface relief grating has been investigated by photoelectron spectroscopy using synchrotron radiation. The photoemission spectra obtained for 60-100 eV photons of a patterned and a nonpatterned surface are similar when the polarization vector of the synchrotron light is parallel to the grating vector. However, for perpendicular excitation, considerable spectral intensity differences can be observed for 9-14 eV electron binding energy. The observed changes are attributed to the formation of well-oriented azobenzenes at the surface. (C) 2004 American Institute of Physics Y1 - 2004 UR - http://scitation.aip.org/journals/doc/APPLAB-ft/vol_84/iss_9/1561_1.html ER - TY - JOUR A1 - Henneberg, Oliver A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Pietsch, Ullrich A1 - Rochon, Paul T1 - X-ray and VIS light scattering from light-induced polymer gratings Y1 - 2003 UR - http://stacks.iop.org/0022-3727/36/A241 U6 - https://doi.org/10.1088/0022-3727/36/10A/350 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Pietsch, Ullrich A1 - Rochon, Paul A1 - Natansohn, Almeria T1 - Formation and dynamics of polymer surface relief gratings Y1 - 2001 SN - 0378-5963 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Panzner, Tobias A1 - Pietsch, Ullrich A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Rochon, Paul A1 - Finkelstein, Kenneth D. T1 - X-ray and VIS light scattering from light-induced polymer gratings N2 - Sinusoidally shaped surface relief gratings made of polymer films containing, azobenzene moieties can be created by holographic illumination with laser light of about lambda approximate to 500 nm. The remarkable material transport takes place at temperatures far (100 K) below the glass transition temperature of the material. As probed by visible light scattering the efficiency of grating formation crucially depends on the polarization state of the laser light and is maximal when circular polarization is used. In contrast to VIS light scattering X-ray diffraction is most sensitive for periodic surface undulations with amplitudes below 10 nm. Thus, combined in-situ X-ray and visible light scattering at CHESS were used to investigate the dynamics of surface relief grating formations upon laser illumination. The time development of grating peaks up to 9th order at laser power of P = 20 mW/cm(2) could be investigated, even the onset of grating formation as a function of light polarization. A linear growth of grating amplitude was observed for all polarizations. The growth velocity is maximal using circularly polarized light but very small for s-polarized light Y1 - 2004 UR - 1960 = doi:10.1524/zkri.219.4.218.30438 SN - 0044-2968 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Geue, Thomas A1 - Finkelstein, Kenneth D. T1 - Simultaneous X-ray and visible light diffraction for the investigation of surface relief and density grating formation in azobenzene containing polymer films N2 - The development of surface relief and density patterns in azobenzene polymer films was studied by diffraction at two different wavelengths. We used x-ray diffraction of synchrotron radiation at 0.124 nm in combination with visible light diffraction at a wavelength of 633 nm. In contrast to visible light scattering x-ray diffraction allows the separation of a surface relief and a density grating contribution due to the different functional dependence of the scattering power. Additionally, the x-ray probe is most sensitive for the onset of the surface grating formation Y1 - 2006 UR - http://www.informaworld.com/smpp/title~content=t713644168~db=all U6 - https://doi.org/10.1080/15421400500383345 SN - 1542-1406 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Rochon, Paul A1 - Panzner, Tobias A1 - Finkelstein, Kenneth D. A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Pietsch, Ullrich T1 - In-situ Investigation of Surface Relief Grating Formation in Photosensitive Polymers Y1 - 2004 UR - http://www.chess.cornell.edu/pubs/csnm2004/research/insitu.pdf ER - TY - JOUR A1 - Herrmann, A. A1 - Kaupp, G. A1 - Geue, Thomas A1 - Pietsch, Ullrich T1 - AFM and GID investigations of the gas-solid diazotation of 4-sulfanil-acid-monohydrat single crystals Y1 - 1997 ER - TY - JOUR A1 - Holý, Václav A1 - Darhuber, A. A1 - Stangl, Jochen A1 - Zerlauth, S. A1 - Schäffler, F. A1 - Bauer, Günther A1 - Darowski, Nora A1 - Lübbert, Daniel A1 - Pietsch, Ullrich A1 - Vavra, I. T1 - HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer Y1 - 1999 ER - TY - BOOK A1 - Holý, Václav A1 - Pietsch, Ullrich A1 - Baumbach, Tilo T1 - High-resolution x-ray scattering from thin films and multilayers T3 - Springer tracts in modern physics Y1 - 1999 SN - 3-540-62029-X U6 - https://doi.org/10.1007/BFb0109385 VL - 149 PB - Springer CY - Berlin, Heidelberg ER -