TY  - JOUR
A1  - Schulz, Günter
A1  - Braun, Michael
A1  - Geissler, Heinz
T1  - Contributions to the structural and chemical composition of plasma chemically synthesized silica powders
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Baier, Frank W.
A1  - Lima-Neto, G. B.
A1  - Wipper, H.
A1  - Braun, Michael
T1  - Optical and X-ray structures of galaxy clusters I
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Schulz, Günter
A1  - Geissler, Heinz
A1  - Braun, Michael
T1  - Properties of plasma silica powders used to SAPO molecular sieve synthesis
Y1  - 1995
ER  - 
TY  - THES
A1  - Braun, Michael
T1  - Sternentstehung in irregulären Galaxien : UGCA 86 und die Magellanschen Wolken
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Hilscher, Martin
A1  - Braun, Michael
A1  - Richter, Michael
A1  - Leininger, Andreas
A1  - Gössel, Michael
T1  - X-tolerant test data compaction with accelerated shift registers
N2  - Using the timing flexibility of modern automatic test equipment (ATE) test response data can be compacted without the need for additional X-masking logic. In this article the test response is compacted by several multiple input shift registers without feedback (NF-MISR). The shift registers are running on a k-times higher clock frequency than the test clock. For each test clock cycle only one out of the k outputs of each shift register is evaluated by the ATE. The impact of consecutive X values within the scan chains is reduced by a periodic permutation of the NF-MISR inputs. As a result, no additional external control signals or test set dependent control logic is required. The benefits of the proposed method are shown by the example of an implementation on a Verigy ATE. Experiments on three industrial circuits demonstrate the effectiveness of the proposed approach in comparison to a commercial DFT solution.
Y1  - 2009
UR  - http://www.springerlink.com/content/100286
U6  - https://doi.org/10.1007/s10836-009-5107-5
SN  - 0923-8174
ER  -