TY  - JOUR
A1  - Draude, F.
A1  - Pelster, A.
A1  - Koersgen, M.
A1  - Kassenboehmer, R.
A1  - Schwerdtle, Tanja
A1  - Muething, J.
A1  - Arlinghaus, H. F.
T1  - ToF-SIMS imaging of plasma membrane lipids with sub-micrometer resolution
JF  - Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis surfaces, interfaces and thin films
N2  - Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used for label-free analyses of the molecular lateral distribution of two different epithelial cell membranes (PANC-1 and UROtsa). The goal of the research was to enhance the ion yield of specific membrane molecules for improving the membrane imaging capability of ToF-SIMS on the nanoscale lateral dimension. For this task, a special silicon wafer sandwich preparation technique was optimized using different wafer materials, spacers, and washing procedures. Under optimized preparation conditions, the yield could be significantly enhanced, allowing imaging of the inhomogeneous distribution of phosphocholine (common head group for phosphatidylcholine and sphingomyelin) of a PANC-1 cell membrane's outer lipid layer with a lateral resolution of less than 200nm. Copyright (c) 2014 John Wiley & Sons, Ltd.
KW  - ToF-SIMS
KW  - high-resolution imaging
KW  - membrane analysis
KW  - lipid analysis
KW  - yield enhancement
KW  - sample preparation
Y1  - 2014
U6  - https://doi.org/10.1002/sia.5576
SN  - 0142-2421
SN  - 1096-9918
VL  - 46
SP  - 127
EP  - 130
PB  - Wiley-Blackwell
CY  - Hoboken
ER  -