TY  - JOUR
A1  - Singh, Adit D.
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
A1  - Seuring, Markus
T1  - Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
T1  - Built-in self test mit multi-mode scannable memory elementen
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural method for output compaction of sequential automata implemented as circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural approach for space compaction for sequential circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A structural approach for space compaction for concurrent checking and BIST
Y1  - 1998
ER  -