TY  - JOUR
A1  - Geue, Thomas
A1  - Stumpe, Joachim
A1  - Pietsch, Ullrich
A1  - Haak, M.
A1  - Kaupp, G.
T1  - Photochemically induced changes of optical anisotropy and surface of LB-multilayers built up by an amphiphilic and liquid crystalline copolymer conating azobenzene moieties
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Barberka, Thomas Andreas
A1  - Pietsch, Ullrich
A1  - Höhne, U.
T1  - Investigation of the chain-chain interface in a lead-stearate multilayer using neutron reflectivity
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Barberka, Thomas Andreas
A1  - Pietsch, Ullrich
A1  - Höhne, U.
A1  - Reiche, Jürgen
A1  - Dietzel, Birgit
T1  - Neutronenreflektivität an Langmuir-Blodgett-Strukturen
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Penacorada, Florencio
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - In-plane structure of uranylarachidate multilayers
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Möhle, Marcus
A1  - Pietsch, Ullrich
T1  - Accurate structure determination for GaAs using Pendellösung oscillation
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Hansen, N. K.
T1  - A critical review of the valence charge density in GaAs
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Lichanot, Albert
A1  - Azavant, P.
A1  - Pietsch, Ullrich
T1  - Ab-initio Hartree-Fock study of the electronic charge density of the cubic boron nitride and its comparison with the experiment
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Knochenhauer, Gerald
A1  - Dietel, Reinhard
A1  - Freydank, Anke-Christine
A1  - Zetzsche, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
T1  - Structure of thermally treated oxadiazoleamide Langmuir-Blodgett films
N2  - The thermal treatment of Y-type Langmuir-Blodgett (LB) films formed from the amphiphilic derivative of 2,5- diphenyl-1,3,4-oxadiazole 1 results in changes of the molecular packing. These changes have been analysed by a combination of X-ray specular reflectivity data, X-ray grazing incidence diffraction data and scanning force microscopy images, On the basis of these experimental data we have simulated possible supramolecular structures, These simulations provide insight into the intermolecular interactions giving rise to the observed structural transitions. The crystalline structure induced by thermal treatment of the LB films is characterized by a uniaxial texture, which is correlated with the dipping direction during deposition of the LB film.
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Penacorada, Florencio
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - Monolayers and multilayers of uranyl arachidate : in-plane structure of uranyl arachidate multilayers
N2  - The molecular in-plane structure of uranyl arachidate Langmuir-Blodgett (LB) films formed at different subphase pH values was analysed by means of X-ray grazing-incidence diffraction. For multilayers formed at low subphase pH a reorganisation of the arachidic acid film structure is confirmed. At appropriate subphase pH values, reorganisation of the film structure, e.g. via the formation of three-dimensional crystallites, is prevented by the presence of the uranyl ions and by the subsequent introduction of conformational disorder (gauche defects) in the alkyl chains. The observation of a macroscopic flow-induced in-plane texture in these uranyl arachidate LB films has profound implications for the design of ordered, supramolecular structures by the Langmuir-Blodgett technique.
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
A1  - Stömmer, Ralph
T1  - X-ray scattering from thin organic films and multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Gutberlet, T.
A1  - Seitz, R.
A1  - Oeser, R.
A1  - Pietsch, Ullrich
T1  - Thermally induced rearrangement of fatty acid salt molecules in Langmuir-Blodgett multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Baumbach, Tilo
A1  - Zeimer, Ute
T1  - Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Rose, Dirk
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
T1  - Characterization of InGaAs single quantum wells buried in GaAs[001] by grazing incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Bolm, A.
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Gerstenberger, M.
A1  - Pietsch, Ullrich
T1  - Temperature and time dependent investigations of cd- and uranyl-stearate multilayers by means of neutron reflectivity measurements
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Herrmann, A.
A1  - Kaupp, G.
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
T1  - AFM and GID investigations of the gas-solid diazotation of 4-sulfanil-acid-monohydrat single crystals
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Paschke, K.
A1  - Geue, Thomas
A1  - Barberka, Thomas Andreas
A1  - Bolm, A.
A1  - Pietsch, Ullrich
A1  - Rösch, M.
A1  - Batke, Edwin
A1  - Faller, F.
A1  - Kerkel, K.
A1  - Oshiniwo, J.
A1  - Forchel, Alfred
T1  - Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Siebrecht, R.
A1  - Schreyer, A.
A1  - Englisch, Uwe
A1  - Pietsch, Ullrich
A1  - Zabel, Hartmut
T1  - The new reflectometer ADAM at the ILL
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Neißendorfer, Frank
A1  - Bolm, A.
A1  - Pietsch, Ullrich
T1  - Energy dispersive X-ray reflectometry and X-ray grazing incidence diffraction from organic multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Shen, W.
A1  - Kycia, S.
T1  - X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Haier, P.
A1  - Herrmann, B. A.
A1  - Esser, N.
A1  - Pietsch, Ullrich
A1  - Lüders, K.
A1  - Richter, W.
T1  - Influence of the deposition rate on the structure of thin metal layers
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pucher, Andreas
A1  - Geue, Thomas
A1  - Daniel, A.
A1  - Pietsch, Ullrich
T1  - Electric field induced electron density response of GaAs and ZnSe
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
A1  - Zhuang, Y.
A1  - Zerlauth, S.
A1  - Bauer, Günther
T1  - In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - X-ray scattering from silicon surfaces
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Martin, C. R.
A1  - Geue, Thomas
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
A1  - Smirnitzki, V.
A1  - Bugge, F.
T1  - Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
T1  - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Klemradt, U.
A1  - Pietsch, Ullrich
T1  - Investigation of strain relaxation in GaInAs/GaAs superlattices by x-ray diffuse scattering
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Schomburg, E.
A1  - Lingott, I.
A1  - Ignotov, A. a.
A1  - Renk, K. F.
A1  - Pietsch, Ullrich
A1  - Rose, Dirk
A1  - Zeimer, Ute
A1  - Melzer, B. J.
A1  - Ivanov, S.
A1  - Schaposchnikov, S.
A1  - Kop'ev, P. S.
A1  - Pavel'ev, D. G.
A1  - Koschurinov, Yu.
T1  - X-ray and transport characterization of an Esaki-Tsu superlattice device
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Möhle, Marcus
A1  - Pietsch, Ullrich
T1  - Comparison of theoretical and experimental structure amplitudes of GaAs
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Tsirelson, Vladimir G.
A1  - Abramov, Yury Fedorovich
A1  - Zavodnik, Valerie E.
A1  - Stash, Adam I.
A1  - Belokoneva, Elena L.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
A1  - Feil, Dirk
T1  - Critical pionts in a crystal an procrystal
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Samoilenko, I.
A1  - Pietsch, Ullrich
T1  - Investigation of the vertical molecular exchange in a complex organic multilayer system
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Holý, Václav
A1  - Stangl, Jochen
A1  - Darhuber, A.
A1  - Mikulik, P.
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
T1  - Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Baumbach, Tilo
A1  - Grenzer, Jörg
A1  - Lübbert, Daniel
A1  - Mazuelas, A.
A1  - Pietsch, Ullrich
A1  - Erbert, G.
T1  - In-situ characterization of strain distribution in broad-area high-power lasers under operation by high- resolution x-ray diffrcation and topography using synchrotron radiation
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Katholy, Stefan
A1  - Penacorada, Florencio
A1  - Reiche, Jürgen
A1  - Pietsch, Ullrich
T1  - Investigation of molecular diffusion across organic multilayers using neutron specular reflectivity
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Darowski, Nora
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
T1  - Evaluation of strain distribution in freestanding and bruied lateral nanostructures
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pucher, Andreas
A1  - Pietsch, Ullrich
A1  - Zellner, J.
A1  - Weckert, E.
T1  - Experimental determination of electric field induced differences in structure factor phases in the order of 2%
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Veldkamp, Markus
A1  - Erko, Alexei
A1  - Gudat, Wolfgang
A1  - Abrosimov, Nikolai V.
A1  - Alex, Volker
A1  - Khasanov, Salavat
A1  - Neissendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Shekhtman, Veniamin
T1  - Si(1-x)Ge(x) laterally graded crystals as monochromators for X-Ray absorption spectroscopy studies
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Baumbach, Tilo
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Wiebach, T.
T1  - Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Holý, Václav
A1  - Darhuber, A.
A1  - Stangl, Jochen
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
A1  - Vavra, I.
T1  - HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Neißendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Breszisinski, G.
A1  - Möhwald, Helmuth
T1  - Energy-dispersive reflectometry and diffractometry at the WLS of BESSY-I
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
A1  - Ponti, S.
A1  - Pietsch, Ullrich
A1  - Leprince, L.
A1  - Schneck, J.
A1  - Talneau, A.
T1  - Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Schultz, M.
A1  - Englisch, Uwe
A1  - Stömmer, Ralph
A1  - Pietsch, Ullrich
A1  - Meine, Kerstin
A1  - Vollhard, D.
T1  - Investigation of pH-dependent domain structure of fatty acid salt Langmuir-Blodgett films by means of X-ray diffuse scattering and Atomic Force Microscopy
Y1  - 1999
ER  - 
TY  - BOOK
A1  - Holý, Václav
A1  - Pietsch, Ullrich
A1  - Baumbach, Tilo
T1  - High-resolution x-ray scattering from thin films and multilayers
T3  - Springer tracts in modern physics
Y1  - 1999
SN  - 3-540-62029-X
U6  - https://doi.org/10.1007/BFb0109385
VL  - 149
PB  - Springer
CY  - Berlin, Heidelberg
ER  - 
TY  - JOUR
A1  - Metzger, T. H.
A1  - Pietsch, Ullrich
A1  - Garstein, E.
T1  - High-resolution lattice parameter measurement by x-ray grazing incidence diffraction: Application to the interface of silicon on sapphire
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Brehmer, Ludwig
A1  - Pietsch, Ullrich
T1  - X-ray and neutron reflection analysis of the structure and the molecular exchange process in simple and complex fatty acid salt Langmuir-Blodgett multilayers
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Holý, Václav
A1  - Stangl, Jochen
A1  - Zerlauth, S.
A1  - Bauer, Günther
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
T1  - Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Struth, Bernd
A1  - Decher, Gero
A1  - Schmitt, J.
A1  - Hofmeister, Wolfgang
A1  - Neißendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Brezesinski, Gerald
A1  - Möhwald, Helmuth
T1  - Chemical modification of Topaz surfaces
Y1  - 1999
SN  - 0928-4931
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Haferkorn, J.
A1  - Stumpe, Joachim
A1  - Date, R. W.
A1  - Fawcett, A. H.
T1  - Competition of alignment and aggregation? : Phenomena in constrained films of LC poly(olefin ulfone)s and maleic anhydride co- and terpolymers
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Bugge, F.
A1  - Gramlich, S.
A1  - Smirnitzki, V.
A1  - Weyers, Markus
A1  - Tränkle, G.
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Cassabois, G.
A1  - Emiliani, V.
A1  - Lienau, C.
T1  - Evidence for strain-induced lateral carrier confinement in InGaAs quantum wells by low-temperature near-field spectroscopy
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Mukherjee, M.
A1  - Bhattacharya, M. K.
A1  - Sanyal, M. K.
A1  - Geue, Thomas
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
T1  - Temperature dependent thickness and surface tension of polymer films
Y1  - 2000
SN  - 81-7371295-6
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
Y1  - 2000
SN  - 0011-3891
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Pietsch, Ullrich
A1  - Stangl, Jochen
A1  - Holý, Vaclav
A1  - Darowski, Nora
A1  - Grenzer, Jörg
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
T1  - In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Schelling, Christoph
A1  - Stangl, Jochen
A1  - Penn, C.
A1  - Senz, S.
A1  - Schäffler, Friedrich
A1  - Roche, T.
A1  - Daniel, A.
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Bauer, Günther
T1  - Structural and optical properties of Si/Si{1-x}Ge{x} wires
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Daniel, A.
A1  - Reithmaier, Johann-Peter
A1  - Rennon, Siegfried
A1  - Forchel, Alfred
T1  - Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Karcenko, Anatolij V.
A1  - Englisch, Uwe
A1  - Grenzer, Jörg
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Siebrecht, R.
T1  - Investigation of partially deuterated multilayers by means of X-ray and polarized neutron reflectometry
Y1  - 2000
SN  - 1044-8632
ER  - 
TY  - JOUR
A1  - Thünemann, Andreas F.
A1  - Kubowicz, Stephan
A1  - Pietsch, Ullrich
T1  - Ultra-thin solid polyelectrolyte-surfactant complex films : structure and wetting
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Formation of a buried lateral density grating in azopenzene polymer films
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Darowski, Nora
A1  - Ulyanenkov, A.
A1  - Grenzer, Jörg
A1  - Wang, K. H.
A1  - Forchel, Alfred
T1  - Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Geue, Thomas
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
T1  - Interaction of short-chain alkanes with surface and interfaces of multilayer films built from amphiphilic molecules: an in-situ X-ray and neutron scattering probe
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Neumann, Werner
A1  - Buchsteiner, Alexandra
A1  - Mahler, Willy
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
T1  - Dielectric loss spectroscopy at fatty acid salt multilayers
N2  - Dielectric loss spectroscopy (DLS) was performed at compact samples and lamellary organized Langmuir-Blodgett (LB) films from various fatty acid salts. Previous thermoanalytical measurements at compact samples revealed the appearance of two different phase transition temperatures; the lower one is related to the acid the second one to the acid salt molecules. In spite of ill defined electrical contacts with the film the characteristic DLS frequencies obtained from about 100nm thick multilayer films are similar to those recorded from bulk samples. No significant variations of frequencies were found changing the counter ions. Besides conductivity influence at low frequncies we found two relaxations related to the mobility of the dipolar carboxylat-metal group at about 100 and 10000Hz. One of these frequencies is related to the rotation around the chain axis. The strength of this relaxation increases significantly with increasing the sample temperature above 105°C. This temperature is connected with a structural phase transition observed by X-ray reflectometry. In case of Pb-stearate the results of the dielectric measurements help to interprete this structural change as a transition from an orthorhombic into a free-rotator phase. The uncorrelated rotation of molecules around their molecular axes initiates a much increased relaxation strength at the carboxylat-metal sites.
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Mukhopadhyay, M. K.
A1  - Datta, A.
A1  - Sanyal, M. K.
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
T1  - Synchrotron Studies of Melting of Langmuir-Blodgett Films
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Avilov, Anatoly S.
A1  - Lepeshov, G. G.
A1  - Pietsch, Ullrich
A1  - Tsirelson, Vladimir G.
T1  - Multipole analysis of the electron density and electrostatic potential in Germanium by high-resolution electron diffraction
Y1  - 2001
SN  - 0022-3697
ER  - 
TY  - JOUR
A1  - Davaasambuu, Jav
A1  - Daniel, A.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
T1  - Comparison of experimental and theoretical valence charge densites in cubic ZnSe
Y1  - 2001
SN  - 0022-3697
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Darowski, Nora
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Daniel, A.
A1  - Rennon, Siegfried
A1  - Reithmaier, Johann-Peter
A1  - Forchel, Alfred
T1  - Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Bugge, F.
A1  - Smirnitzki, V.
A1  - Weyers, Markus
T1  - Investigation of strain-modulated InGaAs-nanostructures by grazing-incidence x-ray diffraction and photoluminescence
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Bugge, F.
A1  - Gramlich, S.
A1  - Smirnitzki, V.
A1  - Weyers, Markus
A1  - Tränkle, G.
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Cassabois, G.
A1  - Emiliani, V.
A1  - Linau, Christoph
T1  - Evidence of strain-induced lateral carrier confinement in InGaAs-quantum wells by low-temperature near-field spectroscopy
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Grenzer, Jörg
A1  - Geue, Thomas
A1  - Neißendorfer, Frank
A1  - Brezesinski, Gerald
A1  - Symietz, Christian
A1  - Möhwald, Helmuth
A1  - Gudat, Wolfgang
T1  - The energy dispersive reflectometer at BESSY II : a challenge for thin film analysis
Y1  - 2001
SN  - 0167- 5087
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
A1  - Hofmann, L.
A1  - Grenzer, Jörg
A1  - Gramlich, S.
T1  - Strain induced compositional modulations in AlGaAs overlayers induced by lateral surface gratings
Y1  - 2001
SN  - 0272-9172
ER  - 
TY  - JOUR
A1  - Davaasambuu, Jav
A1  - Daniel, A.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
T1  - Harmonic and anharmonic thermal vibrations in cubic ZnSe
Y1  - 2001
SN  - 0044-2968
ER  - 
TY  - JOUR
A1  - Tsirelson, Vladimir G.
A1  - Avilov, Anatoly S.
A1  - Lepeshov, G. G.
A1  - Kuligin, A. K.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
A1  - Spence, J. C. H.
T1  - Quantitative Analysis of the Inner-Crystal Electrostatic Potential of several Rock-Salt-Structure Crystals Using Accurate Electron-Diffraction Data
Y1  - 2001
SN  - 1089-5647
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
A1  - Blaha, Pawel
A1  - Schwarz, K. H.
T1  - Electric field induced charge-density variations in covalently bonded compounds
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Poloucek, P.
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Symietz, Christian
A1  - Brezesinski, Gerald
T1  - X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Stahn, Jochen
A1  - Davaasambuu, Jav
A1  - Pucher, Andreas
T1  - Electric field induced charge density variations in partially-ionic compounds
Y1  - 2001
SN  - 0022-3697
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Chi, Li Feng
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Atomic force microscopy inspection of the early state of formation of polymer surface relief grating
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Formation and dynamics of polymer surface relief gratings
Y1  - 2001
SN  - 0378-5963
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - Reversible negative thermal expansion of polymer films
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - X-ray reflectivity from sinusoidal surface relief gratings
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Bodenthin, Yves
A1  - Grenzer, Jörg
A1  - Lauter, Robert
A1  - Pietsch, Ullrich
A1  - Lehmann, Pit
A1  - Kurth, Dirk G.
A1  - Möhwald, Helmuth
T1  - Temperature and time resolved x-ray scattering at thin organic films
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Pietsch, Ullrich
T1  - X-ray reflectivity from sinusoidal surface relief gratings
Y1  - 2002
SN  - 0023-4753
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Henneberg, Oliver
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Formation mechanism and dynamics in polymer surface gratings
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Natansohn, Almeria
A1  - Rochon, Paul
A1  - Finkelstein, Kenneth D.
T1  - Formation of a buried density grating on thermal erasure of azobenzene polymer surface gratings
Y1  - 2002
SN  - 0927-7757
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Kubowicz, Stephan
A1  - Thünemann, Andreas F.
A1  - Geue, Thomas
A1  - Watson, M. D.
A1  - Tchebotareva, N.
A1  - Müllen, K.
T1  - X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Hesse, A.
A1  - Zhuang, Y.
A1  - Holý, Vaclav
A1  - Stangl, Jochen
A1  - Zerlauth, S.
A1  - Schaffler, F.
A1  - Bauer, Günther
T1  - X-ray grazing-incidence study of inhomogeneous strain relaxation in Si/SiGe wires
Y1  - 2003
SN  - 0168-583X
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
A1  - Grenzer, Jörg
A1  - Grigorian, Souren A.
A1  - Fricke, J.
A1  - Gramlich, S.
A1  - Bugge, F.
A1  - Weyers, Markus
A1  - Trankle, G.
T1  - Influence of lateral patterning geometry on lateral carrier confinement in strain-modulated InGaAs- nanostructures
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Bhattacharya, M. K.
A1  - Mukherjee, M.
A1  - Sanyal, M. K.
A1  - Geue, Thomas
A1  - Grenzer, Jörg
T1  - Energy dispersive x-ray reflectivity technique to study thermal properties of polymer films
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Grigorian, Souren A.
A1  - Grenzer, Jörg
A1  - Feranchuk, S.
A1  - Zeimer, Ute
T1  - Grazing-incidence diffraction study of strain-modulated single quantum well nanostructures
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Panzner, Tobias
A1  - Leitenberger, Wolfram
A1  - Grenzer, Jörg
A1  - Bodenthin, Th.
A1  - Geue, Thomas
A1  - Möhwald, Helmuth
T1  - Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Saphiannikova, Marina
T1  - X-ray investigations of formation efficiency of buried azobenzene polymer density gratings
Y1  - 2003
UR  - http://scitation.aip.org/journals/doc/JAPIAU-ft/vol_93/iss_6/3161_1.html
U6  - https://doi.org/10.1063/1.1554753
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - Evidence of a density grating under light induced formation of surface relief gratings at polymers containing azobenzene moieties
Y1  - 2003
UR  - http://scitation.aip.org/getpdf/servlet/ GetPDFServlet?filetype=pdf&id=JAPIAU000094000002000963000001&idtype=cvips
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Grigorian, Souren A.
A1  - Grenzer, Jörg
A1  - Vartanyants, Ivan A.
T1  - Thermal diffuse scattering in grazing incidence diffraction
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Tsirelson, Vladimir G.
A1  - Gorfan, S. V.
T1  - X-ray scattering amplitude of an atom in a permanent external electric field
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - Thin Layers of columns of an amphiphilic hexa-peri-hexabenzocoronene at silicon wafer surfaces
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
T1  - X-ray and VIS light scattering from light-induced polymer gratings
Y1  - 2003
UR  - http://stacks.iop.org/0022-3727/36/A241
U6  - https://doi.org/10.1088/0022-3727/36/10A/350
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Leitenberger, Wolfram
A1  - Wendrock, Horst
A1  - Bischoff, Lothar
A1  - Panzner, Tobias
A1  - Grenzer, Jörg
A1  - Pucher, Andreas
T1  - Double pinhole diffraction of white synchrotron radiation
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Davaasambuu, Jav
A1  - Pucher, Andreas
A1  - Kochin, V.
T1  - Atomistic origin of the inverse piezoelectric effect in alpha-SiO2 and alpha-GaPO4
Y1  - 2003
UR  - http://www.edpsciences.org/articles/epl/pdf/2003/12/7666.pdf?access=ok
SN  - 0295-5075
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Mukhopadhyay, M. K.
A1  - Sanyal, M. K.
A1  - Datta, A.
A1  - Mukherjee, M.
A1  - Geue, Thomas
A1  - Grenzer, Jörg
T1  - Transition from two-dimensional to three-dimensional melting in Langmuir-Blodgett films
N2  - Results of energy-dispersive x-ray reflectivity and grazing incidence diffraction studies of Langmuir-Blodgett films exhibited evolution of conventional three-dimensional melting from continuous melting, characteristic of two- dimensional systems, as a function of deposited monolayers. Continuous expansion followed by a sharp phase transition of the in-plane lattice was observed before the melting point and found to be independent of number of deposited layers. Evolution of conventional melting with an increase in the number of monolayers could be quantified by measuring stiffness against tilting of the vertical stack of molecules, which are kept together by an internal field. The internal field as defined in this model reduces as the in-plane lattice expands and the sample temperature approaches melting point. The sharpness of the melting transition, which has been approximated by a Langevin function, increases with the number of deposited monolayers
Y1  - 2004
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Davaasambuu, Jav
A1  - Kochin, V.
A1  - Schwarz, K. H.
A1  - Blaha, Pawel
T1  - The atomistic origin of the inverse piezoelectric effect in a-quartz
N2  - Ab initio calculations have been carried out using the FP-APW+lo method in order to understand the atomic origin of the inverse piezoelectric effect in x-quartz. The external electric field was modelled by a saw-like potential V-ext in order to achieve translational symmetry within a supercell (SC) containing 72 atoms. The original trigonal quartz structure was repeated along the [110] direction, which corresponds to the direction of the external field. An electric field with 550 kV/mm was applied and the atomic positions of the SC were relaxed until the forces acting on the atoms vanished. In parts of the SC, V-ext changes almost linearly and thus the relaxed atomic positions can be used to determine the structural response due to the external electric field. The calculations provide the piezoelectric modulus of the correct order of magnitude. In contrast to previous models and in agreement with recent experimental results, the atomic origin of the piezoelectric effect can be described by a rotation of slightly deformed SiO4 tetrahedra against each other. The change of the Si-O bond lengths and the tetrahedral O-Si-O angles is one order of magnitude smaller than that of the Si-O-Si angles between neighbouring tetrahedra. The calculated changes of X-ray structure factors are in agreement with experiment when the theoretical data are extrapolated down to the much smaller field strength that is applied in the experiment (E < 10 kV/mm). (C) 2004 Elsevier Ltd. All rights reserved
Y1  - 2004
ER  - 
TY  - JOUR
A1  - Saphiannikova, Marina
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Morawetz, Knut
A1  - Pietsch, Ullrich
T1  - Linear viscoelastic analysis of formation and relaxation of azobenzene polymer gratings
N2  - Surface relief gratings on azobenzene containing polymer films were prepared under irradiation by actinic light. Finite element modeling of the inscription process was carried out using linear viscoelastic analysis. It was assumed that under illumination the polymer film undergoes considerable plastification, which reduces its original Young's modulus by at least three orders of magnitude. Force densities of about 10(11) N/m(3) were necessary to reproduce the growth of the surface relief grating. It was shown that at large deformations the force of surface tension becomes comparable to the inscription force and therefore plays an essential role in the retardation of the inscription process. In addition to surface profiling the gradual development of an accompanying density grating was predicted for the regime of continuous exposure. Surface grating development under pulselike exposure cannot be explained in the frame of an incompressible fluid model. However, it was easily reproduced using the viscoelastic model with finite compressibility. (C) 2004 American Institute of Physics
Y1  - 2004
U6  - https://doi.org/10.1063/1.1642606
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Jarre, A.
A1  - Salditt, T.
A1  - Panzner, Tobias
A1  - Pfeiffer, F.
T1  - White beam x-ray waveguide optics
N2  - We report a white beam x-ray waveguide (WG) experiment. A resonant beam coupler x-ray waveguide (RBC) is used simultaneously as a broad bandpass (or multibandpass) monochromator and as a beam compressor. We show that, depending on the geometrical properties of the WG, the exiting beam consists of a defined number of wavelengths which can be shifted by changing the angle of incidence of the white x-ray synchrotron beam. The characteristic far-field pattern is recorded as a function of exit angle and energy. This x-ray optical setup may be used to enhance the intensity of coherent x-ray WG beams since the full energetic acceptance of the WG mode is transmitted. (C) 2004 American Institute of Physics
Y1  - 2004
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Panzner, Tobias
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Rochon, Paul
A1  - Finkelstein, Kenneth D.
T1  - X-ray and VIS light scattering from light-induced polymer gratings
N2  - Sinusoidally shaped surface relief gratings made of polymer films containing, azobenzene moieties can be created by holographic illumination with laser light of about lambda approximate to 500 nm. The remarkable material transport takes place at temperatures far (100 K) below the glass transition temperature of the material. As probed by visible light scattering the efficiency of grating formation crucially depends on the polarization state of the laser light and is maximal when circular polarization is used. In contrast to VIS light scattering X-ray diffraction is most sensitive for periodic surface undulations with amplitudes below 10 nm. Thus, combined in-situ X-ray and visible light scattering at CHESS were used to investigate the dynamics of surface relief grating formations upon laser illumination. The time development of grating peaks up to 9th order at laser power of P = 20 mW/cm(2) could be investigated, even the onset of grating formation as a function of light polarization. A linear growth of grating amplitude was observed for all polarizations. The growth velocity is maximal using circularly polarized light but very small for s-polarized light
Y1  - 2004
UR  - 1960 = doi:10.1524/zkri.219.4.218.30438
SN  - 0044-2968
ER  -