TY  - JOUR
A1  - Gaal, P.
A1  - Schick, Daniel
A1  - Herzog, Marc
A1  - Bojahr, Andre
A1  - Shayduk, Roman
A1  - Goldshteyn, J.
A1  - Navirian, Hengameh A.
A1  - Leitenberger, Wolfram
A1  - Vrejoiu, Ionela
A1  - Khakhulin, D.
A1  - Wulff, M.
A1  - Bargheer, Matias
T1  - Time-domain sampling of x-ray pulses using an ultrafast sample response
JF  - Applied physics letters
N2  - We employ the ultrafast response of a 15.4 nm thin SrRuO3 layer grown epitaxially on a SrTiO3 substrate to perform time-domain sampling of an x-ray pulse emitted from a synchrotron storage ring. Excitation of the sample with an ultrashort laser pulse triggers coherent expansion and compression waves in the thin layer, which turn the diffraction efficiency on and off at a fixed Bragg angle during 5 ps. This is significantly shorter than the duration of the synchrotron x-ray pulse of 100 ps. Cross-correlation measurements of the ultrafast sample response and the synchrotron x-ray pulse allow to reconstruct the x-ray pulse shape.
Y1  - 2012
U6  - https://doi.org/10.1063/1.4769828
SN  - 0003-6951
VL  - 101
IS  - 24
PB  - American Institute of Physics
CY  - Melville
ER  -