TY  - JOUR
A1  - Schick, Daniel
A1  - Herzog, Marc
A1  - Wen, Haidan
A1  - Chen, Pice
A1  - Adamo, Carolina
A1  - Gaal, Peter
A1  - Schlom, Darrell G.
A1  - Evans, Paul G.
A1  - Li, Yuelin
A1  - Bargheer, Matias
T1  - Localized excited charge carriers generate ultrafast inhomogeneous strain in the multiferroic BiFeO3
JF  - Physical review letters
N2  - We apply ultrafast x-ray diffraction with femtosecond temporal resolution to monitor the lattice dynamics in a thin film of multiferroic BiFeO3 after above-band-gap photoexcitation. The sound-velocity limited evolution of the observed lattice strains indicates a quasi-instantaneous photoinduced stress which decays on a nanosecond time scale. This stress exhibits an inhomogeneous spatial profile evidenced by the broadening of the Bragg peak. These new data require substantial modification of existing models of photogenerated stresses in BiFeO3: the relevant excited charge carriers must remain localized to be consistent with the data.
Y1  - 2014
U6  - https://doi.org/10.1103/PhysRevLett.112.097602
SN  - 0031-9007
SN  - 1079-7114
VL  - 112
IS  - 9
PB  - American Physical Society
CY  - College Park
ER  -