TY - JOUR A1 - Anger, Christian A1 - Gebser, Martin A1 - Linke, Thomas A1 - Neumann, Andre A1 - Schaub, Torsten T1 - The nomore++ approach to answer set solving Y1 - 2005 UR - http://www.cs.uni-potsdam.de/wv/pdfformat/angelinesc05c.pdf ER - TY - JOUR A1 - Anger, Christian A1 - Gebser, Martin A1 - Linke, Thomas A1 - Neumann, Andre A1 - Schaub, Torsten T1 - The nomore++ approach to answer set solving Y1 - 2005 UR - http://www.cs.uni-potsdam.de/wv/pdfformat/angelinesc05c.pdf ER - TY - JOUR A1 - Anger, Christian A1 - Gebser, Martin A1 - Janhunen, Tomi A1 - Schaub, Torsten T1 - What's a head without a body? Y1 - 2006 ER - TY - JOUR A1 - Andjelković, Marko A1 - Chen, Junchao A1 - Simevski, Aleksandar A1 - Schrape, Oliver A1 - Krstić, Miloš A1 - Kraemer, Rolf T1 - Monitoring of particle count rate and LET variations with pulse stretching inverters JF - IEEE transactions on nuclear science : a publication of the IEEE Nuclear and Plasma Sciences Society N2 - This study investigates the use of pulse stretching (skew-sized) inverters for monitoring the variation of count rate and linear energy transfer (LET) of energetic particles. The basic particle detector is a cascade of two pulse stretching inverters, and the required sensing area is obtained by connecting up to 12 two-inverter cells in parallel and employing the required number of parallel arrays. The incident particles are detected as single-event transients (SETs), whereby the SET count rate denotes the particle count rate, while the SET pulsewidth distribution depicts the LET variations. The advantage of the proposed solution is the possibility to sense the LET variations using fully digital processing logic. SPICE simulations conducted on IHP's 130-nm CMOS technology have shown that the SET pulsewidth varies by approximately 550 ps over the LET range from 1 to 100 MeV center dot cm(2) center dot mg(-1). The proposed detector is intended for triggering the fault-tolerant mechanisms within a self-adaptive multiprocessing system employed in space. It can be implemented as a standalone detector or integrated in the same chip with the target system. KW - Particle detector KW - pulse stretching inverters KW - single-event transient KW - (SET) count rate KW - SET pulsewidth distribution Y1 - 2021 U6 - https://doi.org/10.1109/TNS.2021.3076400 SN - 0018-9499 SN - 1558-1578 VL - 68 IS - 8 SP - 1772 EP - 1781 PB - Institute of Electrical and Electronics Engineers CY - New York, NY ER - TY - JOUR A1 - Andjelkovic, Marko A1 - Simevski, Aleksandar A1 - Chen, Junchao A1 - Schrape, Oliver A1 - Stamenkovic, Zoran A1 - Krstić, Miloš A1 - Ilic, Stefan A1 - Ristic, Goran A1 - Jaksic, Aleksandar A1 - Vasovic, Nikola A1 - Duane, Russell A1 - Palma, Alberto J. A1 - Lallena, Antonio M. A1 - Carvajal, Miguel A. T1 - A design concept for radiation hardened RADFET readout system for space applications JF - Microprocessors and microsystems N2 - Instruments for measuring the absorbed dose and dose rate under radiation exposure, known as radiation dosimeters, are indispensable in space missions. They are composed of radiation sensors that generate current or voltage response when exposed to ionizing radiation, and processing electronics for computing the absorbed dose and dose rate. Among a wide range of existing radiation sensors, the Radiation Sensitive Field Effect Transistors (RADFETs) have unique advantages for absorbed dose measurement, and a proven record of successful exploitation in space missions. It has been shown that the RADFETs may be also used for the dose rate monitoring. In that regard, we propose a unique design concept that supports the simultaneous operation of a single RADFET as absorbed dose and dose rate monitor. This enables to reduce the cost of implementation, since the need for other types of radiation sensors can be minimized or eliminated. For processing the RADFET's response we propose a readout system composed of analog signal conditioner (ASC) and a self-adaptive multiprocessing system-on-chip (MPSoC). The soft error rate of MPSoC is monitored in real time with embedded sensors, allowing the autonomous switching between three operating modes (high-performance, de-stress and fault-tolerant), according to the application requirements and radiation conditions. KW - RADFET KW - Radiation hardness KW - Absorbed dose KW - Dose rate KW - Self-adaptive MPSoC Y1 - 2022 U6 - https://doi.org/10.1016/j.micpro.2022.104486 SN - 0141-9331 SN - 1872-9436 VL - 90 PB - Elsevier CY - Amsterdam ER - TY - THES A1 - Andjelkovic, Marko T1 - A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells T1 - Eine Methode zur Charakterisierung, Modellierung und Minderung von SET Effekten in kombinierten CMOS-Standardzellen N2 - With the downscaling of CMOS technologies, the radiation-induced Single Event Transient (SET) effects in combinational logic have become a critical reliability issue for modern integrated circuits (ICs) intended for operation under harsh radiation conditions. The SET pulses generated in combinational logic may propagate through the circuit and eventually result in soft errors. It has thus become an imperative to address the SET effects in the early phases of the radiation-hard IC design. In general, the soft error mitigation solutions should accommodate both static and dynamic measures to ensure the optimal utilization of available resources. An efficient soft-error-aware design should address synergistically three main aspects: (i) characterization and modeling of soft errors, (ii) multi-level soft error mitigation, and (iii) online soft error monitoring. Although significant results have been achieved, the effectiveness of SET characterization methods, accuracy of predictive SET models, and efficiency of SET mitigation measures are still critical issues. Therefore, this work addresses the following topics: (i) Characterization and modeling of SET effects in standard combinational cells, (ii) Static mitigation of SET effects in standard combinational cells, and (iii) Online particle detection, as a support for dynamic soft error mitigation. Since the standard digital libraries are widely used in the design of radiation-hard ICs, the characterization of SET effects in standard cells and the availability of accurate SET models for the Soft Error Rate (SER) evaluation are the main prerequisites for efficient radiation-hard design. This work introduces an approach for the SPICE-based standard cell characterization with the reduced number of simulations, improved SET models and optimized SET sensitivity database. It has been shown that the inherent similarities in the SET response of logic cells for different input levels can be utilized to reduce the number of required simulations. Based on characterization results, the fitting models for the SET sensitivity metrics (critical charge, generated SET pulse width and propagated SET pulse width) have been developed. The proposed models are based on the principle of superposition, and they express explicitly the dependence of the SET sensitivity of individual combinational cells on design, operating and irradiation parameters. In contrast to the state-of-the-art characterization methodologies which employ extensive look-up tables (LUTs) for storing the simulation results, this work proposes the use of LUTs for storing the fitting coefficients of the SET sensitivity models derived from the characterization results. In that way the amount of characterization data in the SET sensitivity database is reduced significantly. The initial step in enhancing the robustness of combinational logic is the application of gate-level mitigation techniques. As a result, significant improvement of the overall SER can be achieved with minimum area, delay and power overheads. For the SET mitigation in standard cells, it is essential to employ the techniques that do not require modifying the cell structure. This work introduces the use of decoupling cells for improving the robustness of standard combinational cells. By insertion of two decoupling cells at the output of a target cell, the critical charge of the cell’s output node is increased and the attenuation of short SETs is enhanced. In comparison to the most common gate-level techniques (gate upsizing and gate duplication), the proposed approach provides better SET filtering. However, as there is no single gate-level mitigation technique with optimal performance, a combination of multiple techniques is required. This work introduces a comprehensive characterization of gate-level mitigation techniques aimed to quantify their impact on the SET robustness improvement, as well as introduced area, delay and power overhead per gate. By characterizing the gate-level mitigation techniques together with the standard cells, the required effort in subsequent SER analysis of a target design can be reduced. The characterization database of the hardened standard cells can be utilized as a guideline for selection of the most appropriate mitigation solution for a given design. As a support for dynamic soft error mitigation techniques, it is important to enable the online detection of energetic particles causing the soft errors. This allows activating the power-greedy fault-tolerant configurations based on N-modular redundancy only at the high radiation levels. To enable such a functionality, it is necessary to monitor both the particle flux and the variation of particle LET, as these two parameters contribute significantly to the system SER. In this work, a particle detection approach based on custom-sized pulse stretching inverters is proposed. Employing the pulse stretching inverters connected in parallel enables to measure the particle flux in terms of the number of detected SETs, while the particle LET variations can be estimated from the distribution of SET pulse widths. This approach requires a purely digital processing logic, in contrast to the standard detectors which require complex mixed-signal processing. Besides the possibility of LET monitoring, additional advantages of the proposed particle detector are low detection latency and power consumption, and immunity to error accumulation. The results achieved in this thesis can serve as a basis for establishment of an overall soft-error-aware database for a given digital library, and a comprehensive multi-level radiation-hard design flow that can be implemented with the standard IC design tools. The following step will be to evaluate the achieved results with the irradiation experiments. N2 - Mit der Verkleinerung der Strukturen moderner CMOS-Technologien sind strahlungsinduzierte Single Event Transient (SET)-Effekte in kombinatorischer Logik zu einem kritischen Zuverlässigkeitsproblem in integrierten Schaltkreisen (ICs) geworden, die für den Betrieb unter rauen Strahlungsbedingungen (z. B. im Weltraum) vorgesehen sind. Die in der Kombinationslogik erzeugten SET-Impulse können durch die Schaltungen propagieren und schließlich in Speicherelementen (z.B. Flip-Flops oder Latches) zwischengespeichert werden, was zu sogenannten Soft-Errors und folglich zu Datenbeschädigungen oder einem Systemausfall führt. Daher ist es in den frühen Phasen des strahlungsharten IC-Designs unerlässlich geworden, die SET-Effekte systematisch anzugehen. Im Allgemeinen sollten die Lösungen zur Minderung von Soft-Errors sowohl statische als auch dynamische Maßnahmen berücksichtigen, um die optimale Nutzung der verfügbaren Ressourcen sicherzustellen. Somit sollte ein effizientes Soft-Error-Aware-Design drei Hauptaspekte synergistisch berücksichtigen: (i) die Charakterisierung und Modellierung von Soft-Errors, (ii) eine mehrstufige-Soft-Error-Minderung und (iii) eine Online-Soft-Error-Überwachung. Obwohl signifikante Ergebnisse erzielt wurden, sind die Wirksamkeit der SET-Charakterisierung, die Genauigkeit von Vorhersagemodellen und die Effizienz der Minderungsmaßnahmen immer noch die kritischen Punkte. Daher stellt diese Arbeit die folgenden Originalbeiträge vor: • Eine ganzheitliche Methodik zur SPICE-basierten Charakterisierung von SET-Effekten in kombinatorischen Standardzellen und entsprechenden Härtungskonfigurationen auf Gate-Ebene mit reduzierter Anzahl von Simulationen und reduzierter SET-Sensitivitätsdatenbank. • Analytische Modelle für SET-Empfindlichkeit (kritische Ladung, erzeugte SET-Pulsbreite und propagierte SET-Pulsbreite), basierend auf dem Superpositionsprinzip und Anpassung der Ergebnisse aus SPICE-Simulationen. • Ein Ansatz zur SET-Abschwächung auf Gate-Ebene, der auf dem Einfügen von zwei Entkopplungszellen am Ausgang eines Logikgatters basiert, was den Anstieg der kritischen Ladung und die signifikante Unterdrückung kurzer SETs beweist. • Eine vergleichende Charakterisierung der vorgeschlagenen SET-Abschwächungstechnik mit Entkopplungszellen und sieben bestehenden Techniken durch eine quantitative Bewertung ihrer Auswirkungen auf die Verbesserung der SET-Robustheit einzelner Logikgatter. • Ein Partikeldetektor auf Basis von Impulsdehnungs-Invertern in Skew-Größe zur Online-Überwachung des Partikelflusses und der LET-Variationen mit rein digitaler Anzeige. Die in dieser Dissertation erzielten Ergebnisse können als Grundlage für den Aufbau einer umfassenden Soft-Error-aware-Datenbank für eine gegebene digitale Bibliothek und eines umfassenden mehrstufigen strahlungsharten Designflusses dienen, der mit den Standard-IC-Designtools implementiert werden kann. Im nächsten Schritt werden die mit den Bestrahlungsexperimenten erzielten Ergebnisse ausgewertet. KW - Single Event Transient KW - radiation hardness design KW - Single Event Transient KW - Strahlungshärte Entwurf Y1 - 2022 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:517-opus4-534843 ER - TY - THES A1 - Alsadeh, Ahmad T1 - Augmented secure neighbor discovery: aligning security, privacy and usability Y1 - 2013 CY - Potsdam ER - TY - JOUR A1 - Alnemr, Rehab T1 - Context-aware Reputation in SOA and future internet Y1 - 2010 SN - 978-3-86956-036-6 ER - TY - THES A1 - Alnemr, Rehab T1 - Reputation object representation model for enabling reputation interoperability Y1 - 2011 CY - Potsdam ER - TY - GEN A1 - Alhosseini Almodarresi Yasin, Seyed Ali A1 - Bin Tareaf, Raad A1 - Najafi, Pejman A1 - Meinel, Christoph T1 - Detect me if you can BT - Spam Bot Detection Using Inductive Representation Learning T2 - Companion Proceedings of The 2019 World Wide Web Conference N2 - Spam Bots have become a threat to online social networks with their malicious behavior, posting misinformation messages and influencing online platforms to fulfill their motives. As spam bots have become more advanced over time, creating algorithms to identify bots remains an open challenge. Learning low-dimensional embeddings for nodes in graph structured data has proven to be useful in various domains. In this paper, we propose a model based on graph convolutional neural networks (GCNN) for spam bot detection. Our hypothesis is that to better detect spam bots, in addition to defining a features set, the social graph must also be taken into consideration. GCNNs are able to leverage both the features of a node and aggregate the features of a node’s neighborhood. We compare our approach, with two methods that work solely on a features set and on the structure of the graph. To our knowledge, this work is the first attempt of using graph convolutional neural networks in spam bot detection. KW - Social Media Analysis KW - Bot Detection KW - Graph Embedding KW - Graph Convolutional Neural Networks Y1 - 2019 SN - 978-1-4503-6675-5 U6 - https://doi.org/10.1145/3308560.3316504 SP - 148 EP - 153 PB - Association for Computing Machinery CY - New York ER -