TY - JOUR A1 - Henneberg, Oliver A1 - Panzner, Tobias A1 - Pietsch, Ullrich A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Rochon, Paul A1 - Finkelstein, Kenneth D. T1 - X-ray and VIS light scattering from light-induced polymer gratings N2 - Sinusoidally shaped surface relief gratings made of polymer films containing, azobenzene moieties can be created by holographic illumination with laser light of about lambda approximate to 500 nm. The remarkable material transport takes place at temperatures far (100 K) below the glass transition temperature of the material. As probed by visible light scattering the efficiency of grating formation crucially depends on the polarization state of the laser light and is maximal when circular polarization is used. In contrast to VIS light scattering X-ray diffraction is most sensitive for periodic surface undulations with amplitudes below 10 nm. Thus, combined in-situ X-ray and visible light scattering at CHESS were used to investigate the dynamics of surface relief grating formations upon laser illumination. The time development of grating peaks up to 9th order at laser power of P = 20 mW/cm(2) could be investigated, even the onset of grating formation as a function of light polarization. A linear growth of grating amplitude was observed for all polarizations. The growth velocity is maximal using circularly polarized light but very small for s-polarized light Y1 - 2004 UR - 1960 = doi:10.1524/zkri.219.4.218.30438 SN - 0044-2968 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Geue, Thomas A1 - Finkelstein, Kenneth D. T1 - Simultaneous X-ray and visible light diffraction for the investigation of surface relief and density grating formation in azobenzene containing polymer films N2 - The development of surface relief and density patterns in azobenzene polymer films was studied by diffraction at two different wavelengths. We used x-ray diffraction of synchrotron radiation at 0.124 nm in combination with visible light diffraction at a wavelength of 633 nm. In contrast to visible light scattering x-ray diffraction allows the separation of a surface relief and a density grating contribution due to the different functional dependence of the scattering power. Additionally, the x-ray probe is most sensitive for the onset of the surface grating formation Y1 - 2006 UR - http://www.informaworld.com/smpp/title~content=t713644168~db=all U6 - https://doi.org/10.1080/15421400500383345 SN - 1542-1406 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Rochon, Paul A1 - Panzner, Tobias A1 - Finkelstein, Kenneth D. A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Pietsch, Ullrich T1 - In-situ Investigation of Surface Relief Grating Formation in Photosensitive Polymers Y1 - 2004 UR - http://www.chess.cornell.edu/pubs/csnm2004/research/insitu.pdf ER - TY - JOUR A1 - Joshi, Siddharth A1 - Pingel, Patrick A1 - Grigorian, Souren A1 - Panzner, Tobias A1 - Pietsch, Ullrich A1 - Neher, Dieter A1 - Forster, Michael A1 - Scherf, Ullrich T1 - Bimodal temperature behavior of structure and mobility in high molecular weight p3ht thin films N2 - We report a temperature dependent crystalline structure of spin-coated thin films of high molecular weight regioregular poly(3-hexylthiophene) (P3HT) (M-n similar to 30000 g/mol) and its correlation with charge carrier mobility. These investigations show a reversible change of the crystalline structure, where the interlayer lattice spacing (100)along the alkyl side chains continuously increases up to a temperature of about 220 degrees C; in contrast, the in-plane pi-pi distance reduces with increasing temperature. These changes in structure are reversible and can be repeated several times. The temperature-induced structural properties differ for thick and thin films, pointing to a surface/interface role in stabilization of the layer morphology. In contrast to the structural changes, the carrier mobility is rather constant in the temperature range from room temperature up to 100-120 degrees C, followed by a continuous decrease. For thick layers this drop is significant and the transistor performance almost vanishes at high temperature, however, it completely recovers upon cooling back to roorn temperature. The drop of the charge carrier mobility at higher temperatures is in contrast with expectations front the structural studies, considering the increase of crystalline fraction of the polycrystalline layer. our electrical measurements Underscore that the reduction of the macroscopic mobility is mostly caused by it pronounced decrease of the intergrain transport. The thermally induced crystallization along(100) direction and the creation of numerous small crystallites at the film-substrate interface reduce the number of long polymer chain, bridging crystalline domains, which ultimately limits the macroscopic charge transport. Y1 - 2009 UR - http://pubs.acs.org/journal/mamobx U6 - https://doi.org/10.1021/Ma900021w SN - 0024-9297 ER - TY - JOUR A1 - Panzner, Tobias A1 - Gleber, Gudrun A1 - Sant, Tushar A1 - Leitenberger, Wolfram A1 - Pietsch, Ullrich T1 - Coherence experiments at the white-beam beamline of BESSYI N2 - The third-generation X-ray source BESSYII (Berlin, Germany) provides coherent X-ray radiation which can be used for static and dynamic speckle analysis. Recently we have demonstrated that one can perform experiments with coherent white radiation provided by a bending magnet (5 < E < 20 keV). In this paper we show that the diffraction figure of the initial pinhole must be considered for the interpretation of coherent experiments. The reflectivity spectrum of a sample results from the Fresnel diffraction of the incident pinhole deformed by the static speckle features of the sample surface. For dynamical experiments all speckle like features alter with time whereas the pure Fresnel fringes remain constant. (c) 2007 Published by Elsevier B.V. Y1 - 2007 UR - http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW0-4N08M4P-1- F&_cdi=5548&_user=1584062&_orig=search&_coverDate=05%2F23%2F2007&_sk=994849985&view=c&wchp=dGLbVzW- zSkWA&md5=3a09375f874dccd9b382488e9d0 U6 - https://doi.org/10.1016/j.tsf.2006.12.002 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Jarre, A. A1 - Salditt, T. A1 - Panzner, Tobias A1 - Pfeiffer, F. T1 - White beam x-ray waveguide optics N2 - We report a white beam x-ray waveguide (WG) experiment. A resonant beam coupler x-ray waveguide (RBC) is used simultaneously as a broad bandpass (or multibandpass) monochromator and as a beam compressor. We show that, depending on the geometrical properties of the WG, the exiting beam consists of a defined number of wavelengths which can be shifted by changing the angle of incidence of the white x-ray synchrotron beam. The characteristic far-field pattern is recorded as a function of exit angle and energy. This x-ray optical setup may be used to enhance the intensity of coherent x-ray WG beams since the full energetic acceptance of the WG mode is transmitted. (C) 2004 American Institute of Physics Y1 - 2004 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Leitenberger, Wolfram A1 - Wendrock, Horst A1 - Bischoff, Lothar A1 - Panzner, Tobias A1 - Grenzer, Jörg A1 - Pucher, Andreas T1 - Double pinhole diffraction of white synchrotron radiation Y1 - 2003 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Leitenberger, Wolfram A1 - Grenzer, Jörg A1 - Bodenthin, Th. A1 - Geue, Thomas A1 - Möhwald, Helmuth T1 - Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II Y1 - 2003 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Leitenberger, Wolfram A1 - Vartanyants, Ivan A. T1 - Coherence experiments using white synchrotron radiation N2 - Experiments at the bending magnet beamline at BESSY II (EDR beamline) profit from the excellent coherence properties of third generation synchrotron sources. Considering the exponentially decaying incident spectrum, and because no optical elements are installed except slits and vacuum windows, coherence experiments can be performed between 5 keV < E < 15 keV. First, the energy dependence of spatial coherence properties were determined measuring diffraction at single and double pinholes. Next, the coherent white radiation was used to probe the morphology of thin films in reflection geometry. The recorded intensity maps (reflectivity versus sample position) provide speckle patterns which reveal the locally varying sample morphology. Setting the incident angle, alpha(i), smaller or larger than the critical angle of total external reflection, alpha(c), one should be able to separate the surface height profile from the subsurface density modulation of a sample. The validity of this approach is verified at the example of reciprocal space maps taken from a polymer surface where we could reconstruct the lateral height profile from speckle data. (C) 2004 Elsevier B.V. All rights reserved Y1 - 2005 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Leitenberger, Wolfram A1 - Vartanyants, Ivan A. T1 - Coherence experiments at the EDR-beamline of BESSY II Y1 - 2005 ER -