TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A multi-mode scannable memory element for high test application efficiency and delay testing
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Singh, Adit D.
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
A1  - Seuring, Markus
T1  - Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural approach for space compaction for sequential circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural method for output compaction of sequential automata implemented as circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V. V. V.
A1  - Moshanin, Vl.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Experimental results for self-dual multi-output combinational circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Ocheretnij, V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Modified TMR-system with reduced hardware overhead
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
A1  - Morosov, Andrej
T1  - A method of construction of combinational self-checking units with detection of all single faults
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Otscheretnij, Vitalij
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Fault-tolerant self-dual circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Morosov, Andrej
A1  - Gössel, Michael
A1  - Hartje, Hendrik
T1  - Reduced area overhead of the input party for code-disjoint circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
A1  - Morosov, Andrej
T1  - A new totally error propagating compactor for arbitrary cores with digital interfaces
Y1  - 1999
ER  -