TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
A1  - Stömmer, Ralph
T1  - X-ray scattering from thin organic films and multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Kubowicz, Stephan
A1  - Thünemann, Andreas F.
A1  - Geue, Thomas
A1  - Watson, M. D.
A1  - Tchebotareva, N.
A1  - Müllen, K.
T1  - X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface
Y1  - 2003
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Pietsch, Ullrich
T1  - X-ray reflectivity from sinusoidal surface relief gratings
Y1  - 2002
SN  - 0023-4753
ER  - 
TY  - JOUR
A1  - Poloucek, P.
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Symietz, Christian
A1  - Brezesinski, Gerald
T1  - X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Schultz, Michael
A1  - Grenzer, Jörg
A1  - Natansohn, Almeria
A1  - Rochon, Paul
T1  - X-ray investigations of the molecular mobility with polymer surface gratings
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Saphiannikova, Marina
T1  - X-ray investigations of formation efficiency of buried azobenzene polymer density gratings
Y1  - 2003
UR  - http://scitation.aip.org/journals/doc/JAPIAU-ft/vol_93/iss_6/3161_1.html
U6  - https://doi.org/10.1063/1.1554753
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
T1  - X-ray and VIS light scattering from light-induced polymer gratings
Y1  - 2003
UR  - http://stacks.iop.org/0022-3727/36/A241
U6  - https://doi.org/10.1088/0022-3727/36/10A/350
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Panzner, Tobias
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Rochon, Paul
A1  - Finkelstein, Kenneth D.
T1  - X-ray and VIS light scattering from light-induced polymer gratings
N2  - Sinusoidally shaped surface relief gratings made of polymer films containing, azobenzene moieties can be created by holographic illumination with laser light of about lambda approximate to 500 nm. The remarkable material transport takes place at temperatures far (100 K) below the glass transition temperature of the material. As probed by visible light scattering the efficiency of grating formation crucially depends on the polarization state of the laser light and is maximal when circular polarization is used. In contrast to VIS light scattering X-ray diffraction is most sensitive for periodic surface undulations with amplitudes below 10 nm. Thus, combined in-situ X-ray and visible light scattering at CHESS were used to investigate the dynamics of surface relief grating formations upon laser illumination. The time development of grating peaks up to 9th order at laser power of P = 20 mW/cm(2) could be investigated, even the onset of grating formation as a function of light polarization. A linear growth of grating amplitude was observed for all polarizations. The growth velocity is maximal using circularly polarized light but very small for s-polarized light
Y1  - 2004
UR  - 1960 = doi:10.1524/zkri.219.4.218.30438
SN  - 0044-2968
ER  - 
TY  - JOUR
A1  - Stiller, Burkhard
A1  - Karageorgiev, Peter
A1  - Buchsteiner, Andrea
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Brehmer, Ludwig
A1  - Natansohn, Almeria
A1  - Hollricher, Olga
T1  - Using light as a tool : optically Induced mass transport generated in Near-Fields
Y1  - 2003
SN  - 0038-7355 -
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Mukhopadhyay, M. K.
A1  - Sanyal, M. K.
A1  - Datta, A.
A1  - Mukherjee, M.
A1  - Geue, Thomas
A1  - Grenzer, Jörg
T1  - Transition from two-dimensional to three-dimensional melting in Langmuir-Blodgett films
N2  - Results of energy-dispersive x-ray reflectivity and grazing incidence diffraction studies of Langmuir-Blodgett films exhibited evolution of conventional three-dimensional melting from continuous melting, characteristic of two- dimensional systems, as a function of deposited monolayers. Continuous expansion followed by a sharp phase transition of the in-plane lattice was observed before the melting point and found to be independent of number of deposited layers. Evolution of conventional melting with an increase in the number of monolayers could be quantified by measuring stiffness against tilting of the vertical stack of molecules, which are kept together by an internal field. The internal field as defined in this model reduces as the in-plane lattice expands and the sample temperature approaches melting point. The sharpness of the melting transition, which has been approximated by a Langevin function, increases with the number of deposited monolayers
Y1  - 2004
ER  -