TY  - JOUR
A1  - Eichhorn, Holger
A1  - Bruce, Duncan W.
A1  - Guillon, D.
A1  - Gallani, Jean Louis
A1  - Fischer, Thomas
A1  - Stumpe, Joachim
A1  - Geue, Thomas
T1  - Metal ion mediated mesomorphism and thin film behaviour of amphitropic tetraazaporphyrin complexes
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Darowski, Nora
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Daniel, A.
A1  - Rennon, Siegfried
A1  - Reithmaier, Johann-Peter
A1  - Forchel, Alfred
T1  - Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Chi, Li Feng
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Atomic force microscopy inspection of the early state of formation of polymer surface relief grating
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Formation and dynamics of polymer surface relief gratings
Y1  - 2001
SN  - 0378-5963
ER  - 
TY  - JOUR
A1  - Mukhopadhyay, M. K.
A1  - Datta, A.
A1  - Sanyal, M. K.
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
T1  - Synchrotron Studies of Melting of Langmuir-Blodgett Films
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Grenzer, Jörg
A1  - Geue, Thomas
A1  - Neißendorfer, Frank
A1  - Brezesinski, Gerald
A1  - Symietz, Christian
A1  - Möhwald, Helmuth
A1  - Gudat, Wolfgang
T1  - The energy dispersive reflectometer at BESSY II : a challenge for thin film analysis
Y1  - 2001
SN  - 0167- 5087
ER  - 
TY  - JOUR
A1  - Poloucek, P.
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Symietz, Christian
A1  - Brezesinski, Gerald
T1  - X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
Y1  - 2001
ER  -