TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Baumbach, Tilo
A1  - Zeimer, Ute
T1  - Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Rose, Dirk
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
T1  - Characterization of InGaAs single quantum wells buried in GaAs[001] by grazing incidence diffraction
Y1  - 1997
ER  -