TY  - JOUR
A1  - Geue, Thomas
A1  - Schultz, Michael
A1  - Grenzer, Jörg
A1  - Natansohn, Almeria
A1  - Rochon, Paul
T1  - X-ray investigations of the molecular mobility with polymer surface gratings
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Daniel, A.
A1  - Reithmaier, Johann-Peter
A1  - Rennon, Siegfried
A1  - Forchel, Alfred
T1  - Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Karcenko, Anatolij V.
A1  - Englisch, Uwe
A1  - Grenzer, Jörg
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Siebrecht, R.
T1  - Investigation of partially deuterated multilayers by means of X-ray and polarized neutron reflectometry
Y1  - 2000
SN  - 1044-8632
ER  - 
TY  - JOUR
A1  - Mukherjee, M.
A1  - Bhattacharya, M. K.
A1  - Sanyal, M. K.
A1  - Geue, Thomas
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
T1  - Temperature dependent thickness and surface tension of polymer films
Y1  - 2000
SN  - 81-7371295-6
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Darowski, Nora
A1  - Ulyanenkov, A.
A1  - Grenzer, Jörg
A1  - Wang, K. H.
A1  - Forchel, Alfred
T1  - Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Geue, Thomas
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
T1  - Interaction of short-chain alkanes with surface and interfaces of multilayer films built from amphiphilic molecules: an in-situ X-ray and neutron scattering probe
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Bugge, F.
A1  - Gramlich, S.
A1  - Smirnitzki, V.
A1  - Weyers, Markus
A1  - Tränkle, G.
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Cassabois, G.
A1  - Emiliani, V.
A1  - Lienau, C.
T1  - Evidence for strain-induced lateral carrier confinement in InGaAs quantum wells by low-temperature near-field spectroscopy
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Pietsch, Ullrich
A1  - Stangl, Jochen
A1  - Holý, Vaclav
A1  - Darowski, Nora
A1  - Grenzer, Jörg
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
T1  - In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Schelling, Christoph
A1  - Stangl, Jochen
A1  - Penn, C.
A1  - Senz, S.
A1  - Schäffler, Friedrich
A1  - Roche, T.
A1  - Daniel, A.
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Bauer, Günther
T1  - Structural and optical properties of Si/Si{1-x}Ge{x} wires
Y1  - 2000
ER  -