TY  - JOUR
A1  - Stömmer, Ralph
A1  - Zeimer, Ute
A1  - Pietsch, Ullrich
T1  - Diffuse Röntgenstreuung an LB-Filmen
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
A1  - Stömmer, Ralph
T1  - X-ray scattering from thin organic films and multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - X-ray scattering from silicon surfaces
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Martin, C. R.
A1  - Geue, Thomas
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy
Y1  - 1998
ER  - 
TY  - THES
A1  - Stömmer, Ralph
T1  - X-ray scattering from silicon surfaces and thin oxides on silicon substrates
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Schultz, M.
A1  - Englisch, Uwe
A1  - Stömmer, Ralph
A1  - Pietsch, Ullrich
A1  - Meine, Kerstin
A1  - Vollhard, D.
T1  - Investigation of pH-dependent domain structure of fatty acid salt Langmuir-Blodgett films by means of X-ray diffuse scattering and Atomic Force Microscopy
Y1  - 1999
ER  -