TY  - JOUR
A1  - Avilov, Anatoly S.
A1  - Kulygin, Alexander K.
A1  - Pietsch, Ullrich
A1  - Spence, John C. H.
A1  - Tsirelson, Vladimir G.
A1  - Zuo, Ming J.
T1  - Scanning system for high-energy electron diffractometry
Y1  - 1999
UR  - http://www3.interscience.wiley.com/journal/118518709/home?CRETRY=1&SRETRY=0
U6  - https://doi.org/10.1107/S0021889899006755
SN  - 0021-8898
ER  -