TY  - JOUR
A1  - Gruber, W.
A1  - Chakravarty, S.
A1  - Baehtz, C.
A1  - Leitenberger, Wolfram
A1  - Bruns, M.
A1  - Kobler, A.
A1  - Kübel, Christian
A1  - Schmidt, H.
T1  - Strain relaxation and vacancy creation in thin platinum films
JF  - Physical review letters
N2  - Synchrotron based combined in situ x-ray diffractometry and reflectometry is used to investigate the role of vacancies for the relaxation of residual stress in thin metallic Pt films. From the experimentally determined relative changes of the lattice parameter a and of the film thickness L the modification of vacancy concentration and residual strain was derived as a function of annealing time at 130 degrees C. The results indicate that relaxation of strain resulting from compressive stress is accompanied by the creation of vacancies at the free film surface. This proves experimentally the postulated dominant role of vacancies for stress relaxation in thin metal films close to room temperature.
Y1  - 2011
U6  - https://doi.org/10.1103/PhysRevLett.107.265501
SN  - 0031-9007
VL  - 107
IS  - 26
PB  - American Physical Society
CY  - College Park
ER  -