TY  - JOUR
A1  - Ovsyannikov, Ruslan
A1  - Karlsson, P.
A1  - Lundqvist, M.
A1  - Lupulescu, C.
A1  - Eberhardt, W.
A1  - Föhlisch, Alexander
A1  - Svensson, S.
A1  - Martensson, N.
T1  - Principles and operation of a new type of electron spectrometer - ArTOF
JF  - Journal of electron spectroscopy and related phenomena : the international journal on theoretical and experimental aspects of electron spectroscopy
N2  - A new energy and angular electron analyzer ArTOF (Angular Resolved Time of Flight) is described. The analyzer is based on simultaneous measurement of flight times and angles in an advanced electron lens system. In angular modes the new analyzer combines an increase in transmission by almost three orders of magnitude with improved resolution, in comparison to standard state-of-the-art electron spectrometers. In this report we describe some design principles and we give a review of calibration and alignment procedures necessary for the use of the ArTOF on a synchrotron radiation facility. Our program scripts to handle the large datasets are also discussed. Furthermore we give a broad description of the new research fields that benefit from the use of the ArTOF and give a short summary of the first results of angle resolved photoemission measurement with ArTOF using the single-bunch X-ray pulses from the BESSY II storage ring facility. (C) 2013 Published by Elsevier B.V.
KW  - ARPES
KW  - Time of flight
KW  - Synchrotron
KW  - Electron spectroscopy
Y1  - 2013
U6  - https://doi.org/10.1016/j.elspec.2013.08.005
SN  - 0368-2048
SN  - 1873-2526
VL  - 191
IS  - 12
SP  - 92
EP  - 103
PB  - Elsevier
CY  - Amsterdam
ER  - 
TY  - JOUR
A1  - Rader, Oliver
A1  - Fauth, K.
A1  - Gould, C.
A1  - Ruster, C.
A1  - Schott, G. M.
A1  - Schmidt, G.
A1  - Brunner, K.
A1  - Molenkamp, Laurens W.
A1  - Schutz, G.
A1  - Kronast, F.
A1  - Durr, H. A.
A1  - Eberhardt, W.
A1  - Gudat, Wolfgang
T1  - Identification of extrinsic Mn contributions in Ga1-xMnxAs by field-dependent magnetic circular X-ray dichroism
N2  - We combine sensitivity to atomic number, chemical shifts, probing depth, and magnetic order in a field- dependent magnetic circular X-ray dichroism study at the Mn L-edge of the diluted ferromagnetic semiconductor Ga1-xMnxAs and observe different Mn constituents: ferromagnetic Mn with an n(d) > 5 lineshape and paramagnetic Mn with distinct n(d) = 5 lineshape. The paramagnetic Mn is assigned to interstitials with surface segregation tendency. (c) 2005 Elsevier B.V. All rights reserved
Y1  - 2005
SN  - 0368-2048
ER  -