TY  - THES
A1  - Baumbach, Tilo
T1  - X-Ray scattering by periodic nanostructures
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
T1  - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
A1  - Ponti, S.
A1  - Pietsch, Ullrich
A1  - Leprince, L.
A1  - Schneck, J.
A1  - Talneau, A.
T1  - Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Baumbach, Tilo
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Wiebach, T.
T1  - Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Baumbach, Tilo
A1  - Grenzer, Jörg
A1  - Lübbert, Daniel
A1  - Mazuelas, A.
A1  - Pietsch, Ullrich
A1  - Erbert, G.
T1  - In-situ characterization of strain distribution in broad-area high-power lasers under operation by high- resolution x-ray diffrcation and topography using synchrotron radiation
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Baumbach, Tilo
A1  - Zeimer, Ute
T1  - Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - BOOK
A1  - Holý, Václav
A1  - Pietsch, Ullrich
A1  - Baumbach, Tilo
T1  - High-resolution x-ray scattering from thin films and multilayers
T3  - Springer tracts in modern physics
Y1  - 1999
SN  - 3-540-62029-X
U6  - https://doi.org/10.1007/BFb0109385
VL  - 149
PB  - Springer
CY  - Berlin, Heidelberg
ER  - 
TY  - BOOK
A1  - Pietsch, Ullrich
A1  - Holý, Václav
A1  - Baumbach, Tilo
T1  - High resolution X-ray scattering from thin films and lateral nanostructures
T3  - Advanced texts in physics : physics and astronomy online library
Y1  - 2004
SN  - 0-387-40092-3
PB  - Springer
CY  - New York
ET  - 2. ed.
ER  - 
TY  - JOUR
A1  - Baumbach, Tilo
A1  - Lübbert, Daniel
A1  - Pietsch, Uwe
A1  - Darowski, Nora
A1  - Leprince, L.
A1  - Talneau, A.
A1  - Schneck, J.
T1  - Grazing incidence diffraction by epitaxial multilayered gratings
Y1  - 1998
ER  -