TY  - JOUR
A1  - Haferkorn, J.
A1  - Geue, Thomas
A1  - Date, R. W.
A1  - Fawcett, A. H.
A1  - Stumpe, Joachim
T1  - Aggregation and orientation phenomena in constrained films of Poly(olefine sulfone)s.
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Martin, C. R.
A1  - Geue, Thomas
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pucher, Andreas
A1  - Geue, Thomas
A1  - Daniel, A.
A1  - Pietsch, Ullrich
T1  - Electric field induced electron density response of GaAs and ZnSe
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Katholy, Stefan
A1  - Reiche, Jürgen
A1  - Brehmer, Ludwig
A1  - Caliebe, W.
T1  - Grazing incidence x-ray diffraction (GIXD) measurements of uranyl arachidate (UO2A2) LB films
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Date, R. W.
A1  - Fawcett, A. H.
A1  - Geue, Thomas
A1  - Haferkorn, J.
A1  - Malcolm, R. K.
A1  - Stumpe, Joachim
T1  - Self-ordering within thin films of poly(olefin sulfone)s.
Y1  - 1998
ER  -