TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
A1  - Smirnitzki, V.
A1  - Bugge, F.
T1  - Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Shen, W.
A1  - Kycia, S.
T1  - X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
T1  - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
A1  - Zhuang, Y.
A1  - Zerlauth, S.
A1  - Bauer, Günther
T1  - In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Baumbach, Tilo
A1  - Lübbert, Daniel
A1  - Pietsch, Uwe
A1  - Darowski, Nora
A1  - Leprince, L.
A1  - Talneau, A.
A1  - Schneck, J.
T1  - Grazing incidence diffraction by epitaxial multilayered gratings
Y1  - 1998
ER  -