TY  - JOUR
A1  - Zink, Christof
A1  - Werner, Nils
A1  - Jechow, Andreas
A1  - Heuer, Axel
A1  - Menzel, Ralf
T1  - Multi-wavelength operation of a single broad area diode laser by spectral beam combining
JF  - IEEE photonics technology letters
N2  - Stabilized multi-wavelength emission from a single emitter broad area diode laser (BAL) is realized by utilizing an external cavity with a spectral beam combining architecture. Self-organized emitters that are equidistantly spaced across the slow axis are enforced by the spatially distributed wavelength selectivity of the external cavity. This resulted in an array like near-field emission although the BAL is physically a single emitter without any epitaxial sub-structuring and only one electrical contact. Each of the self-organized emitters is operated at a different wavelength and the emission is multiplexed into one spatial mode with near-diffraction limited beam quality. With this setup, multi-line emission of 31 individual spectral lines centered around and a total spectral width of 3.6 nm is realized with a 1000 mu m wide BAL just above threshold. To the best of our knowledge, this is the first demonstration of such a self-organization of emitters by optical feedback utilizing a spectral beam combining architecture.
KW  - Laser resonators
KW  - semiconductor lasers
KW  - optical feedback
Y1  - 2014
U6  - https://doi.org/10.1109/LPT.2013.2291963
SN  - 1041-1135
SN  - 1941-0174
VL  - 26
IS  - 3
SP  - 253
EP  - 256
PB  - Inst. of Electr. and Electronics Engineers
CY  - Piscataway
ER  - 
TY  - JOUR
A1  - Sumpf, Bernd
A1  - Maiwald, Martin
A1  - Muller, Andre
A1  - Ginolas, Arnim
A1  - Haeusler, Karl
A1  - Erbert, Goetz
A1  - Traenkle, Guenther
T1  - Reliable operation for 14 500 h of a wavelength-stabilized Diode Laser System on a Microoptical Bench at 671 nm
JF  - IEEE transactions on components, packaging and manufacturing technology
N2  - Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm x 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 degrees C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.
KW  - High-power lasers
KW  - laser resonators
KW  - Raman spectroscopy
KW  - reliability
KW  - semiconductor lasers
Y1  - 2012
U6  - https://doi.org/10.1109/TCPMT.2011.2171342
SN  - 2156-3950
VL  - 2
IS  - 1
SP  - 116
EP  - 121
PB  - Inst. of Electr. and Electronics Engineers
CY  - Piscataway
ER  -