TY  - JOUR
A1  - Eckert, Sebastian
A1  - Beye, Martin
A1  - Pietzsch, Annette
A1  - Quevedo, Wilson
A1  - Hantschmann, Markus
A1  - Ochmann, Miguel
A1  - Ross, Matthew
A1  - Minitti, Michael P.
A1  - Turner, Joshua J.
A1  - Moeller, Stefan P.
A1  - Schlotter, William F.
A1  - Dakovski, Georgi L.
A1  - Khalil, Munira
A1  - Huse, Nils
A1  - Föhlisch, Alexander
T1  - Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids
JF  - Applied physics letters
N2  - The discovery of ultrafast X-ray induced optical reflectivity changes enabled the development of X-ray/optical cross correlation techniques at X-ray free electron lasers worldwide. We have now linked through experiment and theory the fundamental excitation and relaxation steps with the transient optical properties in finite solid samples. Therefore, we gain a thorough interpretation and an optimized detection scheme of X-ray induced changes to the refractive index and the X-ray/optical cross correlation response. (C) 2015 AIP Publishing LLC.
Y1  - 2015
U6  - https://doi.org/10.1063/1.4907949
SN  - 0003-6951
SN  - 1077-3118
VL  - 106
IS  - 6
PB  - American Institute of Physics
CY  - Melville
ER  -