TY  - GEN
A1  - Müller, Bernd Randolf
A1  - Kupsch, Andreas
A1  - Laquai, Rene
A1  - Nellesen, Jens
A1  - Tillmann, Wolfgang
A1  - Kasperovich, Galina
A1  - Bruno, Giovanni
T1  - Microstructure Characterisation of Advanced Materials via 2D and 3D X-Ray Refraction Techniques
T2  - Materials Science Forum
N2  - 3D imaging techniques have an enormous potential to understand the microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this conference paper we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. We demonstrate showcases of ceramics and composite materials, where microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. We present in situ analysis of the damage evolution in an Al/Al2O3 metal matrix composite during tensile load and the identification of void formation (different kinds of defects, particularly unsintered powder hidden in pores, and small inhomogeneity’s like cracks) in Ti64 parts produced by selective laser melting using synchrotron X-ray refraction radiography and tomography.
KW  - X-ray refraction
KW  - radiography
KW  - tomography
KW  - synchrotron X-ray refraction radiography
KW  - CT
KW  - microscopy
KW  - creep
KW  - porosity
KW  - damage evolution
KW  - additive manufacturing
KW  - metal matrix composite
Y1  - 2018
SN  - 978-3-0357-1208-7
U6  - https://doi.org/10.4028/www.scientific.net/MSF.941.2401
SN  - 0255-5476
VL  - 941
SP  - 2401
EP  - 2406
PB  - Trans Tech Publications Ltd
CY  - Zurich
ER  -