TY  - JOUR
A1  - Patel, Dhananjay I.
A1  - Noack, Sebastian
A1  - Vacogne, Charlotte D.
A1  - Schlaad, Helmut
A1  - Bahr, Stephan
A1  - Dietrich, Paul
A1  - Meyer, Michael
A1  - Thissen, Andreas
A1  - Linford, Matthew R.
T1  - Poly(L-lactic acid), by near-ambient pressure XPS
JF  - Surface Science Spectra
N2  - Near ambient pressure - x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at 2500Pa or higher. With NAP-XPS, one can analyze moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission we show C 1s, O 1s, and survey NAP-XPS spectra from poly(L-lactic acid). The C 1s and O 1s envelopes were fit with three and two Gaussian-Lorentzian sum functions, respectively. Water vapor (800Pa) was used as the residual gas for charge compensation, which was confirmed by the sharp peak at 535.0 eV in the O 1s narrow scan. The uniqueness plot corresponding to the C 1s fit shows that the fit parameters had statistical significance. C 1s and O 1s spectra of PLLA damaged by exposure to x-rays for ca. 1 hour are also included. Published by the AVS.
KW  - near-ambient pressure X-ray photoelectron spectroscopy
KW  - NAP-XPS
KW  - XPS
KW  - Water Vapor
Y1  - 2019
U6  - https://doi.org/10.1116/1.5110309
SN  - 1055-5269
SN  - 1520-8575
VL  - 26
IS  - 2
PB  - American Institute of Physics
CY  - Melville
ER  -