@phdthesis{CamachoGonzalez2006,
  author    = {Camacho Gonz{\´a}lez, Francisco},
  title     = {Charge-Storage mechanisms in polymer electrets},
  url       = {http://nbn-resolving.de/urn:nbn:de:kobv:517-opus-8756},
  school      = {Universit{\"a}t Potsdam},
  year      = {2006},
  abstract  = {In view of the importance of charge storage in polymer electrets for electromechanical transducer applications, the aim of this work is to contribute to the understanding of the charge-retention mechanisms. Furthermore, we will try to explain how the long-term storage of charge carriers in polymeric electrets works and to identify the probable trap sites. Charge trapping and de-trapping processes were investigated in order to obtain evidence of the trap sites in polymeric electrets. The charge de-trapping behavior of two particular polymer electrets was studied by means of thermal and optical techniques. In order to obtain evidence of trapping or de-trapping, charge and dipole profiles in the thickness direction were also monitored. In this work, the study was performed on polyethylene terephthalate (PETP) and on cyclic-olefin copolymers (COCs). PETP is a photo-electret and contains a net dipole moment that is located in the carbonyl group (C = O). The electret behavior of PETP arises from both the dipole orientation and the charge storage. In contrast to PETP, COCs are not photo-electrets and do not exhibit a net dipole moment. The electret behavior of COCs arises from the storage of charges only. COC samples were doped with dyes in order to probe their internal electric field. COCs show shallow charge traps at 0.6 and 0.11 eV, characteristic for thermally activated processes. In addition, deep charge traps are present at 4 eV, characteristic for optically stimulated processes. PETP films exhibit a photo-current transient with a maximum that depends on the temperature with an activation energy of 0.106 eV. The pair thermalization length (rc) calculated from this activation energy for the photo-carrier generation in PETP was estimated to be approx. 4.5 nm. The generated photo-charge carriers can recombine, interact with the trapped charge, escape through the electrodes or occupy an empty trap. PETP possesses a small quasi-static pyroelectric coefficient (QPC): ~0.6 nC/(m²K) for unpoled samples, ~60 nC/(m²K) for poled samples and ~60 nC/(m²K) for unpoled samples under an electric bias (E ~10 V/µm). When stored charges generate an internal electric field of approx. 10 V/µm, they are able to induce a QPC comparable to that of the oriented dipoles. Moreover, we observe charge-dipole interaction. Since the raw data of the QPC-experiments on PETP samples is noisy, a numerical Fourier-filtering procedure was applied. Simulations show that the data analysis is reliable when the noise level is up to 3 times larger than the calculated pyroelectric current for the QPC. PETP films revealed shallow traps at approx. 0.36 eV during thermally-stimulated current measurements. These energy traps are associated with molecular dipole relaxations (C = O). On the other hand, photo-activated measurements yield deep charge traps at 4.1 and 5.2 eV. The observed wavelengths belong to the transitions in PETP that are analogous to the π - π* benzene transitions. The observed charge de-trapping selectivity in the photocharge decay indicates that the charge detrapping is from a direct photon-charge interaction. Additionally, the charge de-trapping can be facilitated by photo-exciton generation and the interaction of the photo-excitons with trapped charge carriers. These results indicate that the benzene rings (C6H4) and the dipolar groups (C = O) can stabilize and share an extra charge carrier in a chemical resonance. In this way, this charge could be de-trapped in connection with the photo-transitions of the benzene ring and with the dipole relaxations. The thermally-activated charge release shows a difference in the trap depth to its optical counterpart. This difference indicates that the trap levels depend on the de-trapping process and on the chemical nature of the trap site. That is, the processes of charge detrapping from shallow traps are related to secondary forces. The processes of charge de-trapping from deep traps are related to primary forces. Furthermore, the presence of deep trap levels causes the stability of the charge for long periods of time.},
  subject      = {Charge-Storage},
  language  = {en}
}