@article{BogueJuergensenGoessel1995,
  author    = {Bogue, Ted and J{\"u}rgensen, Helmut and G{\"o}ssel, Michael},
  title     = {BIST with negligible aliasing through random cover circuits},
  year      = {1995},
  language  = {en}
}
@article{RabenaltRichterPoehletal.2012,
  author    = {Rabenalt, Thomas and Richter, Michael and P{\"o}hl, Frank and G{\"o}ssel, Michael},
  title     = {Highly efficient test response compaction using a hierarchical x-masking technique},
  series = {IEEE transactions on computer-aided design of integrated circuits and systems},
  volume    = {31},
  journal   = {IEEE transactions on computer-aided design of integrated circuits and systems},
  number    = {6},
  publisher = {Inst. of Electr. and Electronics Engineers},
  address   = {Piscataway},
  issn      = {0278-0070},
  doi       = {10.1109/TCAD.2011.2181847},
  pages     = {950 -- 957},
  year      = {2012},
  abstract  = {This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range of x-densities. A major contribution of this paper is a technique that enables the efficient loading of the x-masking data into the masking logic in a parallel fashion using the scan chains. A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite testing. Experiments with industrial designs show that the proposed compactor enables compaction ratios exceeding 200x.},
  language  = {en}
}
@article{HilscherBraunRichteretal.2009,
  author    = {Hilscher, Martin and Braun, Michael and Richter, Michael and Leininger, Andreas and G{\"o}ssel, Michael},
  title     = {X-tolerant test data compaction with accelerated shift registers},
  issn      = {0923-8174},
  doi       = {10.1007/s10836-009-5107-5},
  year      = {2009},
  abstract  = {Using the timing flexibility of modern automatic test equipment (ATE) test response data can be compacted without the need for additional X-masking logic. In this article the test response is compacted by several multiple input shift registers without feedback (NF-MISR). The shift registers are running on a k-times higher clock frequency than the test clock. For each test clock cycle only one out of the k outputs of each shift register is evaluated by the ATE. The impact of consecutive X values within the scan chains is reduced by a periodic permutation of the NF-MISR inputs. As a result, no additional external control signals or test set dependent control logic is required. The benefits of the proposed method are shown by the example of an implementation on a Verigy ATE. Experiments on three industrial circuits demonstrate the effectiveness of the proposed approach in comparison to a commercial DFT solution.},
  language  = {en}
}
@article{GoesselSogomonyan1996,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A new self-testing parity checker for ultra-reliable applications},
  year      = {1996},
  language  = {en}
}
@article{GerberGoessel1994,
  author    = {Gerber, Stefan and G{\"o}ssel, Michael},
  title     = {Detection of permanent faults of a floating point adder by pseudoduplication},
  year      = {1994},
  language  = {en}
}
@article{BhattacharyaDimitrievGoessel2000,
  author    = {Bhattacharya, M. K. and Dimitriev, Alexej and G{\"o}ssel, Michael},
  title     = {Zero-aliasing space compresion using a single periodic output and its application to testing of embedded},
  year      = {2000},
  language  = {en}
}
@article{DimitrievSaposhnikovSaposhnikovetal.1999,
  author    = {Dimitriev, Alexej and Saposhnikov, V. V. and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {Concurrent checking of sequential circuits by alternating inputs},
  year      = {1999},
  language  = {en}
}
@article{SaposhnikovOtscheretnijSaposhnikovetal.1998,
  author    = {Saposhnikov, Vl. V. and Otscheretnij, Vitalij and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Design of Fault-Tolerant Circuits by self-dual Duplication},
  year      = {1998},
  language  = {en}
}
@article{MoschaninSaposhnikovSaposhnikovetal.1996,
  author    = {Moschanin, Wladimir and Saposhnikov, Vl. V. and Saposhnikov, Va. V. and G{\"o}ssel, Michael},
  title     = {Synthesis of self-dual multi-output combinational circuits for on-line Teting},
  year      = {1996},
  language  = {en}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben f{\"u}r online-Fehlererkennungen und Selbstests},
  year      = {1998},
  language  = {de}
}
@article{SogomonyanGoessel1996,
  author    = {Sogomonyan, Egor S. and G{\"o}ssel, Michael},
  title     = {Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems},
  year      = {1996},
  language  = {en}
}
@article{MorosovGoesselHartje1999,
  author    = {Morosov, Andrej and G{\"o}ssel, Michael and Hartje, Hendrik},
  title     = {Reduced area overhead of the input party for code-disjoint circuits},
  year      = {1999},
  language  = {en}
}
@article{SeuringGoessel1999,
  author    = {Seuring, Markus and G{\"o}ssel, Michael},
  title     = {A structural method for output compaction of sequential automata implemented as circuits},
  year      = {1999},
  language  = {en}
}
@book{SeuringGoessel1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael},
  title     = {A structural approach for space compaction for sequential circuits},
  series = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  volume    = {1998, 05},
  journal   = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  publisher = {Univ.},
  address   = {Potsdam},
  issn      = {0946-7580},
  pages     = {16 Bl. : graph. Darst.},
  year      = {1998},
  language  = {en}
}
@article{HlawiczkaGoesselSogomonyan1997,
  author    = {Hlawiczka, A. and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A linear code-preserving signature analyzer COPMISR},
  isbn      = {0-8186-7810-0},
  year      = {1997},
  language  = {en}
}
@article{BogueGoesselJuergensenetal.1998,
  author    = {Bogue, Ted and G{\"o}ssel, Michael and J{\"u}rgensen, Helmut and Zorian, Yervant},
  title     = {Built-in self-Test with an alternating output},
  isbn      = {0-8186-8359-7},
  year      = {1998},
  language  = {en}
}
@article{OtscheretnijGoesselSaposhnikovetal.1998,
  author    = {Otscheretnij, Vitalij and G{\"o}ssel, Michael and Saposhnikov, Vl. V. and Saposhnikov, V. V.},
  title     = {Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1998},
  language  = {en}
}
@article{DimitrievSaposhnikovGoesseletal.1997,
  author    = {Dimitriev, Alexej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael and Saposhnikov, V. V.},
  title     = {Self-dual duplication - a new method for on-line testing},
  year      = {1997},
  language  = {en}
}
@article{SaposhnikovMoshaninSaposhnikovetal.1997,
  author    = {Saposhnikov, Vl. V. and Moshanin, Vl. and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Self-dual multi output combinational circuits with output data compaction},
  year      = {1997},
  language  = {en}
}
@book{SeuringGoesselSogomonyan1997,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A structural approach for space compaction for concurrent checking and BIST},
  series = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  volume    = {1997, 01},
  journal   = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  publisher = {Univ. Potsdam},
  address   = {Potsdam [u.a.]},
  issn      = {0946-7580},
  pages     = {19 S. : Ill.},
  year      = {1997},
  language  = {en}
}
@article{GoesselSogomonyan1998,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {On-line Test auf der Grundlage eines die Parit{\"a}t erhaltenden Signaturanalysators},
  year      = {1998},
  language  = {de}
}
@article{MorosovSaposhnikovGoessel1998,
  author    = {Morosov, Andrej and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Self-Checking circuits with unidiectionally independent outputs},
  year      = {1998},
  language  = {en}
}