@article{RabenaltRichterPoehletal.2012,
  author    = {Rabenalt, Thomas and Richter, Michael and P{\"o}hl, Frank and G{\"o}ssel, Michael},
  title     = {Highly efficient test response compaction using a hierarchical x-masking technique},
  series = {IEEE transactions on computer-aided design of integrated circuits and systems},
  volume    = {31},
  journal   = {IEEE transactions on computer-aided design of integrated circuits and systems},
  number    = {6},
  publisher = {Inst. of Electr. and Electronics Engineers},
  address   = {Piscataway},
  issn      = {0278-0070},
  doi       = {10.1109/TCAD.2011.2181847},
  pages     = {950 -- 957},
  year      = {2012},
  abstract  = {This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range of x-densities. A major contribution of this paper is a technique that enables the efficient loading of the x-masking data into the masking logic in a parallel fashion using the scan chains. A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite testing. Experiments with industrial designs show that the proposed compactor enables compaction ratios exceeding 200x.},
  language  = {en}
}
@phdthesis{Rabenalt2011,
  author    = {Rabenalt, Thomas},
  title     = {Datenkompaktierung f{\"u}r Diagnose und Test},
  address   = {Potsdam},
  pages     = {116 S.},
  year      = {2011},
  language  = {de}
}
@article{RabenaltGoesselLeininger2011,
  author    = {Rabenalt, Thomas and Goessel, Michael and Leininger, Andreas},
  title     = {Masking of X-Values by use of a hierarchically configurable register},
  series = {Journal of electronic testing : theory and applications},
  volume    = {27},
  journal   = {Journal of electronic testing : theory and applications},
  number    = {1},
  publisher = {Springer},
  address   = {Dordrecht},
  issn      = {0923-8174},
  doi       = {10.1007/s10836-010-5179-2},
  pages     = {31 -- 41},
  year      = {2011},
  abstract  = {In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.},
  language  = {en}
}