@article{BogueGoesselJuergensenetal.1998,
  author    = {Bogue, Ted and G{\"o}ssel, Michael and J{\"u}rgensen, Helmut and Zorian, Yervant},
  title     = {Built-in self-Test with an alternating output},
  isbn      = {0-8186-8359-7},
  year      = {1998},
  language  = {en}
}
@article{GoesselSogomonyan1998,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {On-line Test auf der Grundlage eines die Parit{\"a}t erhaltenden Signaturanalysators},
  year      = {1998},
  language  = {de}
}
@article{MorosovSaposhnikovGoessel1998,
  author    = {Morosov, Andrej and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Self-Checking circuits with unidiectionally independent outputs},
  year      = {1998},
  language  = {en}
}
@article{OtscheretnijGoesselSaposhnikovetal.1998,
  author    = {Otscheretnij, Vitalij and G{\"o}ssel, Michael and Saposhnikov, Vl. V. and Saposhnikov, V. V.},
  title     = {Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction},
  year      = {1998},
  language  = {en}
}
@article{SaposhnikovMorosovSaposhnikovetal.1998,
  author    = {Saposhnikov, V. V. and Morosov, Andrej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {A new design method for self-checking unidirectional combinational circuits},
  year      = {1998},
  language  = {en}
}
@article{SaposhnikovOtscheretnijSaposhnikovetal.1998,
  author    = {Saposhnikov, Vl. V. and Otscheretnij, Vitalij and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Design of Fault-Tolerant Circuits by self-dual Duplication},
  year      = {1998},
  language  = {en}
}
@article{SaposhnikovSaposhnikovDimitrievetal.1998,
  author    = {Saposhnikov, Vl. V. and Saposhnikov, V. V. and Dimitriev, Alexej and G{\"o}ssel, Michael},
  title     = {Self-dual duplication for error detection},
  year      = {1998},
  language  = {en}
}
@book{SeuringGoessel1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael},
  title     = {A structural approach for space compaction for sequential circuits},
  series = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  volume    = {1998, 05},
  journal   = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  publisher = {Univ.},
  address   = {Potsdam},
  issn      = {0946-7580},
  pages     = {16 Bl. : graph. Darst.},
  year      = {1998},
  language  = {en}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben f{\"u}r online-Fehlererkennungen und Selbstests},
  year      = {1998},
  language  = {de}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A structural approach for space compaction for concurrent checking and BIST},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A scan based concrrent BIST approach for low cost on-line testing},
  year      = {1998},
  language  = {en}
}