@article{SinghSogomonyanGoesseletal.1999,
  author    = {Singh, Adit D. and Sogomonyan, Egor S. and G{\"o}ssel, Michael and Seuring, Markus},
  title     = {Testability evaluation of sequential designs incorporating the multi-mode scannable memory element},
  year      = {1999},
  language  = {en}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A scan based concrrent BIST approach for low cost on-line testing},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanSinghGoessel1999,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1999},
  language  = {en}
}