@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A scan based concrrent BIST approach for low cost on-line testing},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanSinghGoessel1999,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1999},
  language  = {en}
}
@article{SogomonyanGoessel1996,
  author    = {Sogomonyan, Egor S. and G{\"o}ssel, Michael},
  title     = {Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems},
  year      = {1996},
  language  = {en}
}
@article{SogomonyanGoessel1995,
  author    = {Sogomonyan, Egor S. and G{\"o}ssel, Michael},
  title     = {A new parity preserving multi-input signature analyser},
  year      = {1995},
  language  = {en}
}
@article{SinghSogomonyanGoesseletal.1999,
  author    = {Singh, Adit D. and Sogomonyan, Egor S. and G{\"o}ssel, Michael and Seuring, Markus},
  title     = {Testability evaluation of sequential designs incorporating the multi-mode scannable memory element},
  year      = {1999},
  language  = {en}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben f{\"u}r online-Fehlererkennungen und Selbstests},
  year      = {1998},
  language  = {de}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A structural approach for space compaction for concurrent checking and BIST},
  year      = {1998},
  language  = {en}
}
@article{SeuringGoessel1999,
  author    = {Seuring, Markus and G{\"o}ssel, Michael},
  title     = {A structural approach for space compaction for sequential circuits},
  year      = {1999},
  language  = {en}
}
@article{SeuringGoessel1999,
  author    = {Seuring, Markus and G{\"o}ssel, Michael},
  title     = {A structural method for output compaction of sequential automata implemented as circuits},
  year      = {1999},
  language  = {en}
}
@article{SaposhnikovMoshaninSaposhnikovetal.1999,
  author    = {Saposhnikov, Vl. V. V. V. and Moshanin, Vl. and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Experimental results for self-dual multi-output combinational circuits},
  year      = {1999},
  language  = {en}
}
@article{SaposhnikovSaposhnikovDimitrievetal.1998,
  author    = {Saposhnikov, Vl. V. and Saposhnikov, V. V. and Dimitriev, Alexej and G{\"o}ssel, Michael},
  title     = {Self-dual duplication for error detection},
  year      = {1998},
  language  = {en}
}
@article{SaposhnikovOtscheretnijSaposhnikovetal.1998,
  author    = {Saposhnikov, Vl. V. and Otscheretnij, Vitalij and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Design of Fault-Tolerant Circuits by self-dual Duplication},
  year      = {1998},
  language  = {en}
}
@article{SaposhnikovOcheretnijSaposhnikovetal.1999,
  author    = {Saposhnikov, Vl. V. and Ocheretnij, V. and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Modified TMR-system with reduced hardware overhead},
  year      = {1999},
  language  = {en}
}
@article{SaposhnikovMoshaninSaposhnikovetal.1997,
  author    = {Saposhnikov, Vl. V. and Moshanin, Vl. and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Self-dual multi output combinational circuits with output data compaction},
  year      = {1997},
  language  = {en}
}
@article{SaposhnikovDimitrievGoesseletal.1996,
  author    = {Saposhnikov, Vl. V. and Dimitriev, Alexej and G{\"o}ssel, Michael and Saposhnikov, Va. V.},
  title     = {Self-dual parity checking - a new method for on-line testing},
  year      = {1996},
  language  = {en}
}
@article{SaposhnikovMorosovSaposhnikovetal.1996,
  author    = {Saposhnikov, Va. V. and Morosov, Andrej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {Design of self-checking unidirectional combinational circuits with low area overhead},
  year      = {1996},
  language  = {en}
}
@article{SaposhnikovSaposhnikovGoesseletal.1999,
  author    = {Saposhnikov, V. V. and Saposhnikov, Vl. V. and G{\"o}ssel, Michael and Morosov, Andrej},
  title     = {A method of construction of combinational self-checking units with detection of all single faults},
  year      = {1999},
  language  = {en}
}
@article{SaposhnikovMorosovSaposhnikovetal.1998,
  author    = {Saposhnikov, V. V. and Morosov, Andrej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {A new design method for self-checking unidirectional combinational circuits},
  year      = {1998},
  language  = {en}
}
@article{RabenaltRichterPoehletal.2012,
  author    = {Rabenalt, Thomas and Richter, Michael and P{\"o}hl, Frank and G{\"o}ssel, Michael},
  title     = {Highly efficient test response compaction using a hierarchical x-masking technique},
  series = {IEEE transactions on computer-aided design of integrated circuits and systems},
  volume    = {31},
  journal   = {IEEE transactions on computer-aided design of integrated circuits and systems},
  number    = {6},
  publisher = {Inst. of Electr. and Electronics Engineers},
  address   = {Piscataway},
  issn      = {0278-0070},
  doi       = {10.1109/TCAD.2011.2181847},
  pages     = {950 -- 957},
  year      = {2012},
  abstract  = {This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range of x-densities. A major contribution of this paper is a technique that enables the efficient loading of the x-masking data into the masking logic in a parallel fashion using the scan chains. A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite testing. Experiments with industrial designs show that the proposed compactor enables compaction ratios exceeding 200x.},
  language  = {en}
}
@article{OtscheretnijSaposhnikovSaposhnikovetal.1999,
  author    = {Otscheretnij, Vitalij and Saposhnikov, Vl. V. and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Fault-tolerant self-dual circuits},
  year      = {1999},
  language  = {en}
}
@article{OtscheretnijGoesselSaposhnikovetal.1998,
  author    = {Otscheretnij, Vitalij and G{\"o}ssel, Michael and Saposhnikov, Vl. V. and Saposhnikov, V. V.},
  title     = {Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction},
  year      = {1998},
  language  = {en}
}
@article{OcheretnijGoesselSogomonyanetal.2006,
  author    = {Ocheretnij, Vitalij and G{\"o}ssel, Michael and Sogomonyan, Egor S. and Marienfeld, Daniel},
  title     = {Modulo p=3 checking for a carry select adder},
  doi       = {10.1007/s10836-006-6260-8},
  year      = {2006},
  abstract  = {In this paper a self-checking carry select adder is proposed. The duplicated adder blocks which are inherent to a carry select adder without error detection are checked modulo 3. Compared to a carry select adder without error detection the delay of the MSB of the sum of the proposed adder does not increase. Compared to a self-checking duplicated carry select adder the area is reduced by 20\%. No restrictions are imposed on the design of the adder blocks},
  language  = {en}
}
@article{MoschaninSaposhnikovSaposhnikovetal.1996,
  author    = {Moschanin, Wladimir and Saposhnikov, Vl. V. and Saposhnikov, Va. V. and G{\"o}ssel, Michael},
  title     = {Synthesis of self-dual multi-output combinational circuits for on-line Teting},
  year      = {1996},
  language  = {en}
}
@article{MorosovSaposhnikovSaposhnikovetal.1997,
  author    = {Morosov, Andrej and Saposhnikov, Vl. V. and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Design of self dual fault-secure combinational circuits},
  year      = {1997},
  language  = {en}
}
@article{MorosovSaposhnikovSaposhnikovetal.1997,
  author    = {Morosov, Andrej and Saposhnikov, V. V. and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {Ein Transformationsalgorithmus einer kombinatorischen Schaltung in eine monotone Schaltung},
  year      = {1997},
  language  = {de}
}
@article{MorosovSaposhnikovGoessel1998,
  author    = {Morosov, Andrej and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Self-Checking circuits with unidiectionally independent outputs},
  year      = {1998},
  language  = {en}
}
@article{MorosovGoesselHartje1999,
  author    = {Morosov, Andrej and G{\"o}ssel, Michael and Hartje, Hendrik},
  title     = {Reduced area overhead of the input party for code-disjoint circuits},
  year      = {1999},
  language  = {en}
}
@article{KunduSogomonyanGoesseletal.1996,
  author    = {Kundu, S. and Sogomonyan, Egor S. and G{\"o}ssel, Michael and Tarnick, Steffen},
  title     = {Self-checking comparator with one periodiv output},
  year      = {1996},
  language  = {en}
}
@article{HlawiczkaGoesselSogomonyan1997,
  author    = {Hlawiczka, A. and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A linear code-preserving signature analyzer COPMISR},
  isbn      = {0-8186-7810-0},
  year      = {1997},
  language  = {en}
}
@article{HilscherBraunRichteretal.2009,
  author    = {Hilscher, Martin and Braun, Michael and Richter, Michael and Leininger, Andreas and G{\"o}ssel, Michael},
  title     = {X-tolerant test data compaction with accelerated shift registers},
  issn      = {0923-8174},
  doi       = {10.1007/s10836-009-5107-5},
  year      = {2009},
  abstract  = {Using the timing flexibility of modern automatic test equipment (ATE) test response data can be compacted without the need for additional X-masking logic. In this article the test response is compacted by several multiple input shift registers without feedback (NF-MISR). The shift registers are running on a k-times higher clock frequency than the test clock. For each test clock cycle only one out of the k outputs of each shift register is evaluated by the ATE. The impact of consecutive X values within the scan chains is reduced by a periodic permutation of the NF-MISR inputs. As a result, no additional external control signals or test set dependent control logic is required. The benefits of the proposed method are shown by the example of an implementation on a Verigy ATE. Experiments on three industrial circuits demonstrate the effectiveness of the proposed approach in comparison to a commercial DFT solution.},
  language  = {en}
}
@article{HartjeSogomonyanGoessel1997,
  author    = {Hartje, Hendrik and Sogomonyan, Egor S. and G{\"o}ssel, Michael},
  title     = {Code disjoint circuits for partity codes},
  year      = {1997},
  language  = {en}
}
@article{HartjeGoesselSogomonyan1997,
  author    = {Hartje, Hendrik and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Synthesis of code-disjoint combinational circuits},
  year      = {1997},
  language  = {en}
}
@article{GoesselSogomonyanMorosov1999,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S. and Morosov, Andrej},
  title     = {A new totally error propagating compactor for arbitrary cores with digital interfaces},
  year      = {1999},
  language  = {en}
}
@article{GoesselSogomonyan1999,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {New totally self-checking ripple and carry look-ahead adders},
  year      = {1999},
  language  = {en}
}
@article{GoesselSogomonyan1998,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {On-line Test auf der Grundlage eines die Parit{\"a}t erhaltenden Signaturanalysators},
  year      = {1998},
  language  = {de}
}
@article{GoesselSogomonyan1996,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A new self-testing parity checker for ultra-reliable applications},
  year      = {1996},
  language  = {en}
}
@article{GoesselSogomonyan1996,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A parity-preserving multi-input signature analyzer and it application for concurrent checking and BIST},
  year      = {1996},
  language  = {en}
}
@article{GoesselSogomonyan1994,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design},
  year      = {1994},
  language  = {en}
}
@article{GoesselSogomonyan1994,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design},
  year      = {1994},
  language  = {en}
}
@article{GoesselMorosovSaposhnikovetal.1994,
  author    = {G{\"o}ssel, Michael and Morosov, Andrej and Saposhnikov, V. V. and Saposhnikov, VL. V.},
  title     = {Design of combinational self-testing devices with unidirectionally independent outputs},
  year      = {1994},
  language  = {en}
}
@article{GoesselDimitrievSaposhnikovetal.1999,
  author    = {G{\"o}ssel, Michael and Dimitriev, Alexej and Saposhnikov, V. V. and Saposhnikov, Vl. V.},
  title     = {Eine selbsttestende Struktur zur on-line Fehlererkennung in kombinatorischen Schaltungen},
  year      = {1999},
  language  = {de}
}
@article{Goessel1999,
  author    = {G{\"o}ssel, Michael},
  title     = {A new method of redundancy addition for circuit optimization},
  series = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  volume    = {1999, 08},
  journal   = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  publisher = {Univ.},
  address   = {Potsdam},
  issn      = {0946-7580},
  pages     = {9 Bl.},
  year      = {1999},
  language  = {en}
}
@article{GerberGoessel1994,
  author    = {Gerber, Stefan and G{\"o}ssel, Michael},
  title     = {Detection of permanent faults of a floating point adder by pseudoduplication},
  year      = {1994},
  language  = {en}
}
@article{DmitrievSaposhnikovSaposhnikovetal.1999,
  author    = {Dmitriev, Alexej and Saposhnikov, V. V. and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {Self-dual sequential circuits for concurrent chechking},
  isbn      = {0-7695-0390-X ; 0-7695-0391-8},
  year      = {1999},
  language  = {en}
}
@article{DimitrievSaposhnikovGoesseletal.1997,
  author    = {Dimitriev, Alexej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael and Saposhnikov, V. V.},
  title     = {On-line testing by self-dual duplication},
  year      = {1997},
  language  = {en}
}
@article{DimitrievSaposhnikovGoesseletal.1997,
  author    = {Dimitriev, Alexej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael and Saposhnikov, V. V.},
  title     = {Self-dual duplication - a new method for on-line testing},
  year      = {1997},
  language  = {en}
}
@article{DimitrievSaposhnikovSaposhnikovetal.1999,
  author    = {Dimitriev, Alexej and Saposhnikov, V. V. and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {Concurrent checking of sequential circuits by alternating inputs},
  year      = {1999},
  language  = {en}
}
@article{BogueJuergensenGoessel1995,
  author    = {Bogue, Ted and J{\"u}rgensen, Helmut and G{\"o}ssel, Michael},
  title     = {BIST with negligible aliasing through random cover circuits},
  year      = {1995},
  language  = {en}
}
@article{BogueJuergensenGoessel1994,
  author    = {Bogue, Ted and J{\"u}rgensen, Helmut and G{\"o}ssel, Michael},
  title     = {Design of cover circuits for monitoring the output of a MISR},
  isbn      = {0-8186-6307-3 , 0-8186-6306-5},
  year      = {1994},
  language  = {en}
}
@article{BogueGoesselJuergensenetal.1998,
  author    = {Bogue, Ted and G{\"o}ssel, Michael and J{\"u}rgensen, Helmut and Zorian, Yervant},
  title     = {Built-in self-Test with an alternating output},
  isbn      = {0-8186-8359-7},
  year      = {1998},
  language  = {en}
}
@article{BhattacharyaDimitrievGoessel2000,
  author    = {Bhattacharya, M. K. and Dimitriev, Alexej and G{\"o}ssel, Michael},
  title     = {Zero-aliasing space compresion using a single periodic output and its application to testing of embedded},
  year      = {2000},
  language  = {en}
}