@article{RabenaltGoesselLeininger2011,
  author    = {Rabenalt, Thomas and Goessel, Michael and Leininger, Andreas},
  title     = {Masking of X-Values by use of a hierarchically configurable register},
  series = {Journal of electronic testing : theory and applications},
  volume    = {27},
  journal   = {Journal of electronic testing : theory and applications},
  number    = {1},
  publisher = {Springer},
  address   = {Dordrecht},
  issn      = {0923-8174},
  doi       = {10.1007/s10836-010-5179-2},
  pages     = {31 -- 41},
  year      = {2011},
  abstract  = {In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.},
  language  = {en}
}