@article{KowarikGerlachLeitenbergeretal.2007,
  author    = {Kowarik, Stefan and Gerlach, Andreas and Leitenberger, Wolfram and Hu J, Witte and W{\"o}ll, Christoph and Schreiber, Frank},
  title     = {Energy-dispersive X-ray reflectivity and GID for real-time growth studies of pentacene thin films},
  issn      = {0040-6090},
  doi       = {10.1016/j.tsf.2006.12.020},
  year      = {2007},
  abstract  = {We use energy-dispersive X-ray reflectivity and grazing incidence diffraction (GID) to follow the growth of the crystalline organic semiconductor pentacene on silicon oxide in-situ and in real-time. The technique allows for monitoring Bragg reflections and measuring X-ray growth oscillations with a time resolution of 1 min in a wide q-range in reciprocal space extending over 0.25-0.80 angstrom(-1), i.e. sampling a large number of Fourier components simultaneously. A quantitative analysis of growth oscillations at several q-points yields the evolution of the surface roughness, showing a marked transition from layer-by-layer growth to strong roughening after four monolayers of pentacene have been deposited. (c) 2006 Elsevier B.V. All rights reserved.},
  language  = {en}
}
@article{ReddyPuranikGuptaetal.2007,
  author    = {Reddy, Raghavendra V. and Puranik, Shikha and Gupta, Ajay and Leitenberger, Wolfram},
  title     = {Study of FePt films prepared by reactive sputtering},
  year      = {2007},
  language  = {en}
}
@article{PietschPanznerLeitenbergeretal.2005,
  author    = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Vartanyants, Ivan A.},
  title     = {Coherence experiments using white synchrotron radiation},
  year      = {2005},
  abstract  = {Experiments at the bending magnet beamline at BESSY II (EDR beamline) profit from the excellent coherence properties of third generation synchrotron sources. Considering the exponentially decaying incident spectrum, and because no optical elements are installed except slits and vacuum windows, coherence experiments can be performed between 5 keV < E < 15 keV. First, the energy dependence of spatial coherence properties were determined measuring diffraction at single and double pinholes. Next, the coherent white radiation was used to probe the morphology of thin films in reflection geometry. The recorded intensity maps (reflectivity versus sample position) provide speckle patterns which reveal the locally varying sample morphology. Setting the incident angle, alpha(i), smaller or larger than the critical angle of total external reflection, alpha(c), one should be able to separate the surface height profile from the subsurface density modulation of a sample. The validity of this approach is verified at the example of reciprocal space maps taken from a polymer surface where we could reconstruct the lateral height profile from speckle data. (C) 2004 Elsevier B.V. All rights reserved},
  language  = {en}
}
@article{LeitenbergerPietsch2007,
  author    = {Leitenberger, Wolfram and Pietsch, Ullrich},
  title     = {A monolithic Fresnel bimirror for hard X-rays and its application for coherence measurements},
  issn      = {0909-0495},
  doi       = {10.1107/S0909049507003846},
  year      = {2007},
  abstract  = {Experiments using a simple X-ray interferometer to measure the degree of spatial coherence of hard X-rays are reported. A monolithic Fresnel bimirror is used at small incidence angles to investigate synchrotron radiation in the energy interval 5-50 keV with monochromatic and white beam. The experimental setup was equivalent to a Young's double-slit experiment for hard X-rays with slit dimensions in the micrometre range. From the high-contrast interference pattern the degree of coherence was determined.},
  language  = {en}
}
@article{PietschPanznerLeitenbergeretal.2005,
  author    = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Vartanyants, Ivan A.},
  title     = {Coherence experiments at the EDR-beamline of BESSY II},
  year      = {2005},
  language  = {en}
}
@article{LeitenbergerWendrockBischoffetal.2004,
  author    = {Leitenberger, Wolfram and Wendrock, Horst and Bischoff, Lothar and Weitkamp, Timm},
  title     = {Pinhole interferometry with coherent hard X-rays},
  year      = {2004},
  abstract  = {This paper discusses the experimental realisation of two types of X-ray interferometer based on pinhole diffraction. In both interferometers the beam splitter was a thin metal foil containing micrometer pinholes to divide the incident X-ray wave into two coherent waves. The interference pattern was studied using an energy-dispersive detector to simultaneously investigate in a large spectral range the diffraction properties of the white synchrotron radiation. For a highly absorbing pinhole mask the interference fringes from the classical Young's double-pinhole experiment were recorded and the degree of coherence of X-rays could be determined. In the case of low absorption of the metal foil at higher X-ray energies (> 15 keV) the interference pattern of a point diffraction interferometer was observed using the same set-up. The spectral refraction index of the metal foil was determined},
  language  = {en}
}
@article{PietschLeitenbergerWendrocketal.2003,
  author    = {Pietsch, Ullrich and Leitenberger, Wolfram and Wendrock, Horst and Bischoff, Lothar and Panzner, Tobias and Grenzer, J{\"o}rg and Pucher, Andreas},
  title     = {Double pinhole diffraction of white synchrotron radiation},
  year      = {2003},
  language  = {en}
}
@article{PietschPanznerLeitenbergeretal.2003,
  author    = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Grenzer, J{\"o}rg and Bodenthin, Th. and Geue, Thomas and M{\"o}hwald, Helmuth},
  title     = {Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II},
  year      = {2003},
  language  = {en}
}
@article{AbboudSendPashniaketal.2013,
  author    = {Abboud, Ali and Send, Sebastian and Pashniak, N. and Leitenberger, Wolfram and Ihle, Sebastian and Huth, M. and Hartmann, Robert and Str{\"u}der, Lothar and Pietsch, Ullrich},
  title     = {Sub-pixel resolution of a pnCCD for X-ray white beam applications},
  series = {Journal of instrumentation},
  volume    = {8},
  journal   = {Journal of instrumentation},
  number    = {3},
  publisher = {IOP Publ. Ltd.},
  address   = {Bristol},
  issn      = {1748-0221},
  doi       = {10.1088/1748-0221/8/05/P05005},
  pages     = {17},
  year      = {2013},
  abstract  = {A new approach to achieve sub-pixel spatial resolution in a pnCCD detector with 75 x 75 mu m(2) pixel size is proposed for X-ray applications in single photon counting mode. The approach considers the energy dependence of the charge cloud created by a single photon and its split probabilities between neighboring pixels of the detector based on a rectangular model for the charge cloud density. For cases where the charge of this cloud becomes distributed over three or four pixels the center position of photon impact can be reconstructed with a precision better than 2 mu m. The predicted charge cloud sizes are tested at selected X-ray fluorescence lines emitting energies between 6.4 keV and 17.4 keV and forming charge clouds with size (rms) varying between 8 mu m and 10 mu m respectively. The 2 mu m enhanced spatial resolution of the pnCCD is verified by means of an x-ray transmission experiment throughout an optical grating.},
  language  = {en}
}
@article{LeitererLeitenbergerEmmerlingetal.2006,
  author    = {Leiterer, York and Leitenberger, Wolfram and Emmerling, Franziska and Th{\"u}nemann, Andreas F. and Panne, Ulrich},
  title     = {The use of an acoustic levitator to follow crystallization in small droplets by energydispersive X-ray diffraction},
  issn      = {0021-8898},
  doi       = {10.1107/S0021889806024915},
  year      = {2006},
  language  = {en}
}