@article{HesseKlierSgarzietal.2018,
  author    = {Hesse, Julia and Klier, Dennis Tobias and Sgarzi, Massimo and Nsubuga, Anne and Bauer, Christoph and Grenzer, Joerg and H{\"u}bner, Rene and Wislicenus, Marcus and Joshi, Tanmaya and Kumke, Michael Uwe and Stephan, Holger},
  title     = {Rapid Synthesis of Sub-10nm Hexagonal NaYF4-Based Upconverting Nanoparticles using Therminol((R))66},
  series = {ChemistryOpen : including thesis treasury},
  volume    = {7},
  journal   = {ChemistryOpen : including thesis treasury},
  number    = {2},
  publisher = {Wiley-VCH},
  address   = {Weinheim},
  issn      = {2191-1363},
  doi       = {10.1002/open.201700186},
  pages     = {159 -- 168},
  year      = {2018},
  abstract  = {We report a simple one-pot method for the rapid preparation of sub-10nm pure hexagonal (-phase) NaYF4-based upconverting nanoparticles (UCNPs). Using Therminol((R))66 as a co-solvent, monodisperse UCNPs could be obtained in unusually short reaction times. By varying the reaction time and reaction temperature, it was possible to control precisely the particle size and crystalline phase of the UCNPs. The upconversion (UC) luminescence properties of the nanocrystals were tuned by varying the concentrations of the dopants (Nd3+ and Yb3+ sensitizer ions and Er3+ activator ions). The size and phase-purity of the as-synthesized core and core-shell nanocrystals were assessed by using complementary transmission electron microscopy, dynamic light scattering, X-ray diffraction, and small-angle X-ray scattering studies. In-depth photophysical evaluation of the UCNPs was pursued by using steady-state and time-resolved luminescence spectroscopy. An enhancement in the UC intensity was observed if the nanocrystals, doped with optimized concentrations of lanthanide sensitizer/activator ions, were further coated with an inert/active shell. This was attributed to the suppression of surface-related luminescence quenching effects.},
  language  = {en}
}
@misc{HesseKlierSgarzietal.2018,
  author    = {Hesse, Julia and Klier, Dennis Tobias and Sgarzi, Massimo and Nsubuga, Anne and Bauer, Christoph and Grenzer, J{\"o}rg and H{\"u}bner, Ren{\´e} and Wislicenus, Marcus and Joshi, Tanmaya and Kumke, Michael Uwe and Stephan, Holger},
  title     = {Rapid synthesis of sub-10 nm hexagonal NaYF4-based upconverting nanoparticles using Therminol® 66},
  series = {Postprints der Universit{\"a}t Potsdam : Mathematisch-Naturwissenschaftliche Reihe},
  journal   = {Postprints der Universit{\"a}t Potsdam : Mathematisch-Naturwissenschaftliche Reihe},
  number    = {613},
  issn      = {1866-8372},
  doi       = {10.25932/publishup-42351},
  url       = {http://nbn-resolving.de/urn:nbn:de:kobv:517-opus4-423515},
  pages     = {10},
  year      = {2018},
  abstract  = {We report a simple one-pot method for the rapid preparation of sub-10nm pure hexagonal (-phase) NaYF4-based upconverting nanoparticles (UCNPs). Using Therminol((R))66 as a co-solvent, monodisperse UCNPs could be obtained in unusually short reaction times. By varying the reaction time and reaction temperature, it was possible to control precisely the particle size and crystalline phase of the UCNPs. The upconversion (UC) luminescence properties of the nanocrystals were tuned by varying the concentrations of the dopants (Nd3+ and Yb3+ sensitizer ions and Er3+ activator ions). The size and phase-purity of the as-synthesized core and core-shell nanocrystals were assessed by using complementary transmission electron microscopy, dynamic light scattering, X-ray diffraction, and small-angle X-ray scattering studies. In-depth photophysical evaluation of the UCNPs was pursued by using steady-state and time-resolved luminescence spectroscopy. An enhancement in the UC intensity was observed if the nanocrystals, doped with optimized concentrations of lanthanide sensitizer/activator ions, were further coated with an inert/active shell. This was attributed to the suppression of surface-related luminescence quenching effects.},
  language  = {en}
}
@article{SerranoMunozFritschMishurovaetal.2020,
  author    = {Serrano-Munoz, Itziar and Fritsch, Tobias and Mishurova, Tatiana and Trofimov, Anton and Apel, Daniel and Ulbricht, Alexander and Kromm, Arne and Hesse, Rene and Evans, Alexander and Bruno, Giovanni},
  title     = {On the interplay of microstructure and residual stress in LPBF IN718},
  series = {Journal of materials science},
  volume    = {56},
  journal   = {Journal of materials science},
  number    = {9},
  publisher = {Springer},
  address   = {New York},
  issn      = {0022-2461},
  doi       = {10.1007/s10853-020-05553-y},
  pages     = {5845 -- 5867},
  year      = {2020},
  abstract  = {The relationship between residual stresses and microstructure associated with a laser powder bed fusion (LPBF) IN718 alloy has been investigated on specimens produced with three different scanning strategies (unidirectional Y-scan, 90 degrees XY-scan, and 67 degrees Rot-scan). Synchrotron X-ray energy-dispersive diffraction (EDXRD) combined with optical profilometry was used to study residual stress (RS) distribution and distortion upon removal of the specimens from the baseplate. The microstructural characterization of both the bulk and the near-surface regions was conducted using scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD). On the top surfaces of the specimens, the highest RS values are observed in the Y-scan specimen and the lowest in the Rot-scan specimen, while the tendency is inversed on the side lateral surfaces. A considerable amount of RS remains in the specimens after their removal from the baseplate, especially in the Y- and Z-direction (short specimen dimension and building direction (BD), respectively). The distortion measured on the top surface following baseplate thinning and subsequent removal is mainly attributed to the amount of RS released in the build direction. Importantly, it is observed that the additive manufacturing microstructures challenge the use of classic theoretical models for the calculation of diffraction elastic constants (DEC) required for diffraction-based RS analysis. It is found that when the Reuss model is used for the calculation of RS for different crystal planes, as opposed to the conventionally used Kroner model, the results exhibit lower scatter. This is discussed in context of experimental measurements of DEC available in the literature for conventional and additively manufactured Ni-base alloys.},
  language  = {en}
}