@article{HilscherBraunRichteretal.2009,
  author    = {Hilscher, Martin and Braun, Michael and Richter, Michael and Leininger, Andreas and G{\"o}ssel, Michael},
  title     = {X-tolerant test data compaction with accelerated shift registers},
  issn      = {0923-8174},
  doi       = {10.1007/s10836-009-5107-5},
  year      = {2009},
  abstract  = {Using the timing flexibility of modern automatic test equipment (ATE) test response data can be compacted without the need for additional X-masking logic. In this article the test response is compacted by several multiple input shift registers without feedback (NF-MISR). The shift registers are running on a k-times higher clock frequency than the test clock. For each test clock cycle only one out of the k outputs of each shift register is evaluated by the ATE. The impact of consecutive X values within the scan chains is reduced by a periodic permutation of the NF-MISR inputs. As a result, no additional external control signals or test set dependent control logic is required. The benefits of the proposed method are shown by the example of an implementation on a Verigy ATE. Experiments on three industrial circuits demonstrate the effectiveness of the proposed approach in comparison to a commercial DFT solution.},
  language  = {en}
}
@article{RabenaltRichterPoehletal.2012,
  author    = {Rabenalt, Thomas and Richter, Michael and P{\"o}hl, Frank and G{\"o}ssel, Michael},
  title     = {Highly efficient test response compaction using a hierarchical x-masking technique},
  series = {IEEE transactions on computer-aided design of integrated circuits and systems},
  volume    = {31},
  journal   = {IEEE transactions on computer-aided design of integrated circuits and systems},
  number    = {6},
  publisher = {Inst. of Electr. and Electronics Engineers},
  address   = {Piscataway},
  issn      = {0278-0070},
  doi       = {10.1109/TCAD.2011.2181847},
  pages     = {950 -- 957},
  year      = {2012},
  abstract  = {This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range of x-densities. A major contribution of this paper is a technique that enables the efficient loading of the x-masking data into the masking logic in a parallel fashion using the scan chains. A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite testing. Experiments with industrial designs show that the proposed compactor enables compaction ratios exceeding 200x.},
  language  = {en}
}
@article{DimitrievSaposhnikovGoesseletal.1997,
  author    = {Dimitriev, Alexej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael and Saposhnikov, V. V.},
  title     = {On-line testing by self-dual duplication},
  year      = {1997},
  language  = {en}
}
@article{SaposhnikovMorosovSaposhnikovetal.1998,
  author    = {Saposhnikov, V. V. and Morosov, Andrej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {A new design method for self-checking unidirectional combinational circuits},
  year      = {1998},
  language  = {en}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A structural approach for space compaction for concurrent checking and BIST},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanGoessel1995,
  author    = {Sogomonyan, Egor S. and G{\"o}ssel, Michael},
  title     = {A new parity preserving multi-input signature analyser},
  year      = {1995},
  language  = {en}
}
@article{SaposhnikovMorosovSaposhnikovetal.1996,
  author    = {Saposhnikov, Va. V. and Morosov, Andrej and Saposhnikov, Vl. V. and G{\"o}ssel, Michael},
  title     = {Design of self-checking unidirectional combinational circuits with low area overhead},
  year      = {1996},
  language  = {en}
}
@book{SaposhnikovSaposhnikovMorozovetal.2004,
  author    = {Saposhnikov, V. V. and Saposhnikov, Vl. V. and Morozov, Alexei and G{\"o}ssel, Michael},
  title     = {Necessary and Sufficient Conditions for the Existence of Self-Checking Circuits ba Use of Complementary Circuits},
  series = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  volume    = {2004, 1},
  journal   = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  publisher = {Univ.},
  address   = {Potsdam},
  issn      = {0946-7580},
  pages     = {11 S.},
  year      = {2004},
  language  = {en}
}
@article{GoesselSogomonyan1996,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A parity-preserving multi-input signature analyzer and it application for concurrent checking and BIST},
  year      = {1996},
  language  = {en}
}
@article{MorosovSaposhnikovSaposhnikovetal.1997,
  author    = {Morosov, Andrej and Saposhnikov, Vl. V. and Saposhnikov, V. V. and G{\"o}ssel, Michael},
  title     = {Design of self dual fault-secure combinational circuits},
  year      = {1997},
  language  = {en}
}
@article{SaposhnikovSaposhnikovDimitrievetal.1998,
  author    = {Saposhnikov, Vl. V. and Saposhnikov, V. V. and Dimitriev, Alexej and G{\"o}ssel, Michael},
  title     = {Self-dual duplication for error detection},
  year      = {1998},
  language  = {en}
}
@article{SeuringGoessel1999,
  author    = {Seuring, Markus and G{\"o}ssel, Michael},
  title     = {A structural approach for space compaction for sequential circuits},
  year      = {1999},
  language  = {en}
}
@article{HartjeGoesselSogomonyan1997,
  author    = {Hartje, Hendrik and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Synthesis of code-disjoint combinational circuits},
  year      = {1997},
  language  = {en}
}
@article{SinghSogomonyanGoesseletal.1999,
  author    = {Singh, Adit D. and Sogomonyan, Egor S. and G{\"o}ssel, Michael and Seuring, Markus},
  title     = {Testability evaluation of sequential designs incorporating the multi-mode scannable memory element},
  year      = {1999},
  language  = {en}
}
@article{SaposhnikovSaposhnikovGoesseletal.1999,
  author    = {Saposhnikov, V. V. and Saposhnikov, Vl. V. and G{\"o}ssel, Michael and Morosov, Andrej},
  title     = {A method of construction of combinational self-checking units with detection of all single faults},
  year      = {1999},
  language  = {en}
}
@article{GoesselSogomonyan1994,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design},
  year      = {1994},
  language  = {en}
}
@article{GoesselSogomonyanMorosov1999,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S. and Morosov, Andrej},
  title     = {A new totally error propagating compactor for arbitrary cores with digital interfaces},
  year      = {1999},
  language  = {en}
}
@article{GoesselMorosovSaposhnikovetal.1994,
  author    = {G{\"o}ssel, Michael and Morosov, Andrej and Saposhnikov, V. V. and Saposhnikov, VL. V.},
  title     = {Design of combinational self-testing devices with unidirectionally independent outputs},
  year      = {1994},
  language  = {en}
}
@book{MarienfeldSogomonyanOcheretnijetal.2005,
  author    = {Marienfeld, Daniel and Sogomonyan, Egor S. and Ocheretnij, V. and G{\"o}ssel, Michael},
  title     = {Self-checking Output-duplicated Booth-2 Multiplier},
  series = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  volume    = {2005, 1},
  journal   = {Preprint / Universit{\"a}t Potsdam, Institut f{\"u}r Informatik},
  publisher = {Univ.},
  address   = {Potsdam},
  issn      = {0946-7580},
  year      = {2005},
  language  = {en}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A scan based concrrent BIST approach for low cost on-line testing},
  year      = {1998},
  language  = {en}
}