@article{KrstićWeidlingPetrovicetal.2016,
  author    = {Krstić, Miloš and Weidling, Stefan and Petrovic, Vladimir and Sogomonyan, Egor S.},
  title     = {Enhanced architectures for soft error detection and correction in combinational and sequential circuits},
  series = {Microelectronics reliability},
  volume    = {56},
  journal   = {Microelectronics reliability},
  publisher = {Elsevier},
  address   = {Oxford},
  issn      = {0026-2714},
  doi       = {10.1016/j.microrel.2015.10.022},
  pages     = {212 -- 220},
  year      = {2016},
  abstract  = {In this paper two new methods for the design of fault-tolerant pipelined sequential and combinational circuits, called Error Detection and Partial Error Correction (EDPEC) and Full Error Detection and Correction (FEDC), are described. The proposed methods are based on an Error Detection Logic (EDC) in the combinational circuit part combined with fault tolerant memory elements implemented using fault tolerant master-slave flip-flops. If a transient error, due to a transient fault in the combinational circuit part is detected by the EDC, the error signal controls the latching stage of the flip-flops such that the previous correct state of the register stage is retained until the transient error disappears. The system can continue to work in its previous correct state and no additional recovery procedure (with typically reduced clock frequency) is necessary. The target applications are dataflow processing blocks, for which software-based recovery methods cannot be easily applied. The presented architectures address both single events as well as timing faults of arbitrarily long duration. An example of this architecture is developed and described, based on the carry look-ahead adder. The timing conditions are carefully investigated and simulated up to the layout level. The enhancement of the baseline architecture is demonstrated with respect to the achieved fault tolerance for the single event and timing faults. It is observed that the number of uncorrected single events is reduced by the EDPEC architecture by 2.36 times compared with previous solution. The FEDC architecture further reduces the number of uncorrected events to zero and outperforms the Triple Modular Redundancy (TMR) with respect to correction of timing faults. The power overhead of both new architectures is about 26-28\% lower than the TMR. (C) 2015 Elsevier Ltd. All rights reserved.},
  language  = {en}
}
@article{OcheretnijGoesselSogomonyanetal.2006,
  author    = {Ocheretnij, Vitalij and G{\"o}ssel, Michael and Sogomonyan, Egor S. and Marienfeld, Daniel},
  title     = {Modulo p=3 checking for a carry select adder},
  doi       = {10.1007/s10836-006-6260-8},
  year      = {2006},
  abstract  = {In this paper a self-checking carry select adder is proposed. The duplicated adder blocks which are inherent to a carry select adder without error detection are checked modulo 3. Compared to a carry select adder without error detection the delay of the MSB of the sum of the proposed adder does not increase. Compared to a self-checking duplicated carry select adder the area is reduced by 20\%. No restrictions are imposed on the design of the adder blocks},
  language  = {en}
}
@article{SinghSogomonyanGoesseletal.1999,
  author    = {Singh, Adit D. and Sogomonyan, Egor S. and G{\"o}ssel, Michael and Seuring, Markus},
  title     = {Testability evaluation of sequential designs incorporating the multi-mode scannable memory element},
  year      = {1999},
  language  = {en}
}
@article{GoesselSogomonyan1999,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {New totally self-checking ripple and carry look-ahead adders},
  year      = {1999},
  language  = {en}
}
@article{GoesselSogomonyanMorosov1999,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S. and Morosov, Andrej},
  title     = {A new totally error propagating compactor for arbitrary cores with digital interfaces},
  year      = {1999},
  language  = {en}
}
@article{SogomonyanSinghGoessel1999,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1999},
  language  = {en}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben f{\"u}r online-Fehlererkennungen und Selbstests},
  year      = {1998},
  language  = {de}
}
@article{GoesselSogomonyan1998,
  author    = {G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {On-line Test auf der Grundlage eines die Parit{\"a}t erhaltenden Signaturanalysators},
  year      = {1998},
  language  = {de}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1998},
  language  = {en}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A structural approach for space compaction for concurrent checking and BIST},
  year      = {1998},
  language  = {en}
}