@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A multi-mode scannable memory element for high test application efficiency and delay testing},
  year      = {1998},
  language  = {en}
}
@article{SeuringGoesselSogomonyan1998,
  author    = {Seuring, Markus and G{\"o}ssel, Michael and Sogomonyan, Egor S.},
  title     = {A structural approach for space compaction for concurrent checking and BIST},
  year      = {1998},
  language  = {en}
}
@article{SogomonyanSinghGoessel1998,
  author    = {Sogomonyan, Egor S. and Singh, Adit D. and G{\"o}ssel, Michael},
  title     = {A scan based concrrent BIST approach for low cost on-line testing},
  year      = {1998},
  language  = {en}
}