@article{PhamPetreBerquezetal.2009,
  author    = {Pham, Cong Duc and Petre, Anca and Berquez, Laurent and Flores Su{\´a}rez, Rosaura and Mellinger, Axel and Wirges, Werner and Gerhard, Reimund},
  title     = {3D high-resolution mapping of polarization profiles in thin poly(vinylidenefluoride-trifluoroethylene) (PVDF- TrFE) films using two thermal techniques},
  issn      = {1070-9878},
  doi       = {10.1109/TDEI.2009.5128505},
  year      = {2009},
  abstract  = {In this paper, two non-destructive thermal methods are used in order to determine, with a high degree of accuracy, three-dimensional polarization distributions in thin films (12 mu m) of poly(vinylidenefluoride- trifluoroethylene) (PVDF-TrFE). The techniques are the frequency-domain Focused Laser Intensity Modulation Method (FLIMM) and time-domain Thermal-Pulse Tomography (TPT). Samples were first metalized with grid-shaped electrode and poled. 3D polarization mapping yielded profiles which reproduce the electrode-grid shape. The polarization is not uniform across the sample thickness. Significant polarization values are found only at depths beyond 0.5 mu m from the sample surface. Both methods provide similar results, TPT method being faster, whereas the FLIMM technique has a better lateral resolution.},
  language  = {en}
}