@article{HennebergChiGeueetal.2001,
  author    = {Henneberg, Oliver and Chi, Li Feng and Geue, Thomas and Saphiannikova, Marina and Pietsch, Ullrich and Rochon, Paul and Natansohn, Almeria},
  title     = {Atomic force microscopy inspection of the early state of formation of polymer surface relief grating},
  year      = {2001},
  language  = {en}
}
@article{LeitenbergerHartmannPietschetal.2008,
  author    = {Leitenberger, Wolfram and Hartmann, Robert and Pietsch, Ullrich and Andritschke, Robert and Starke, Ines and Str{\"u}der, Lothar},
  title     = {Application of a pnCCD in X-ray diffraction : a three-dimensional X-ray detector},
  doi       = {10.1107/S0909049508018931},
  year      = {2008},
  abstract  = {The first application of a pnCCD detector for X-ray scattering experiments using white synchrotron radiation at BESSY II is presented. A Cd arachidate multilayer was investigated in reflection geometry within the energy range 7 keV < E < 35 keV. At fixed angle of incidence the two-dimensional diffraction pattern containing several multilayer Bragg peaks and respective diffuse-resonant Bragg sheets were observed. Since every pixel of the detector is able to determine the energy of every incoming photon with a resolution Delta E/E similar or equal to 10(-2). a three-dimensional dataset is finally obtained. In order to achieve this energy resolution the detector was operated in the so-called single-photon- counting mode. A full dataset was evaluated taking into account all photons recorded within 10(5) detector frames at a readout rate of 200 Hz. By representing the data in reciprocal-space coordinates, it becomes obvious that this experiment with the pnCCD detector provides the same information as that obtained by combining a large number of monochromatic scattering experiments using conventional area detectors.},
  language  = {en}
}
@article{PietschDarowskiUlyanenkovetal.2000,
  author    = {Pietsch, Ullrich and Darowski, Nora and Ulyanenkov, A. and Grenzer, J{\"o}rg and Wang, K. H. and Forchel, Alfred},
  title     = {Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data},
  year      = {2000},
  language  = {en}
}
@article{SendAbboudLeitenbergeretal.2012,
  author    = {Send, Sebastian and Abboud, Ali and Leitenberger, Wolfram and Weiss, Manfred S. and Hartmann, Robert and Str{\"u}der, Lothar and Pietsch, Ullrich},
  title     = {Analysis of polycrystallinity in hen egg-white lysozyme using a pnCCD},
  series = {Journal of applied crystallography},
  volume    = {45},
  journal   = {Journal of applied crystallography},
  number    = {6},
  publisher = {Wiley-Blackwell},
  address   = {Hoboken},
  issn      = {0021-8898},
  doi       = {10.1107/S0021889812015038},
  pages     = {517 -- 522},
  year      = {2012},
  abstract  = {A crystal of hen egg-white lysozyme was analyzed by means of energy-dispersive X-ray Laue diffraction with white synchrotron radiation at 2.7 angstrom resolution using a pnCCD detector. From Laue spots measured in a single exposure of the arbitrarily oriented crystal, the lattice constants of the tetragonal unit cell could be extracted with an accuracy of about 2.5\%. Scanning across the sample surface, Laue images with split reflections were recorded at various positions. The corresponding diffraction patterns were generated by two crystalline domains with a tilt of about 1 degrees relative to each other. The obtained results demonstrate the potential of the pnCCD for fast X-ray screening of crystals of macromolecules or proteins prior to conventional X-ray structure analysis. The described experiment can be automatized to quantitatively characterize imperfect single crystals or polycrystals.},
  language  = {en}
}
@article{HerrmannKauppGeueetal.1997,
  author    = {Herrmann, A. and Kaupp, G. and Geue, Thomas and Pietsch, Ullrich},
  title     = {AFM and GID investigations of the gas-solid diazotation of 4-sulfanil-acid-monohydrat single crystals},
  year      = {1997},
  language  = {en}
}
@article{StahnMoehlePietsch1996,
  author    = {Stahn, Jochen and M{\"o}hle, Marcus and Pietsch, Ullrich},
  title     = {Accurate structure determination for GaAs using Pendell{\"o}sung oscillation},
  year      = {1996},
  language  = {en}
}
@article{LichanotAzavantPietsch1996,
  author    = {Lichanot, Albert and Azavant, P. and Pietsch, Ullrich},
  title     = {Ab-initio Hartree-Fock study of the electronic charge density of the cubic boron nitride and its comparison with the experiment},
  year      = {1996},
  language  = {en}
}
@article{LeitenbergerPietsch2007,
  author    = {Leitenberger, Wolfram and Pietsch, Ullrich},
  title     = {A monolithic Fresnel bimirror for hard X-rays and its application for coherence measurements},
  issn      = {0909-0495},
  doi       = {10.1107/S0909049507003846},
  year      = {2007},
  abstract  = {Experiments using a simple X-ray interferometer to measure the degree of spatial coherence of hard X-rays are reported. A monolithic Fresnel bimirror is used at small incidence angles to investigate synchrotron radiation in the energy interval 5-50 keV with monochromatic and white beam. The experimental setup was equivalent to a Young's double-slit experiment for hard X-rays with slit dimensions in the micrometre range. From the high-contrast interference pattern the degree of coherence was determined.},
  language  = {en}
}
@article{PietschHansen1996,
  author    = {Pietsch, Ullrich and Hansen, N. K.},
  title     = {A critical review of the valence charge density in GaAs},
  year      = {1996},
  language  = {en}
}
@article{ReichePietschFinketal.1992,
  author    = {Reiche, J{\"u}rgen and Pietsch, Ullrich and Fink, Hans-Peter and Lemmetyinen, Helge},
  title     = {A comparison fo x-ray methods for structure refinement of Langmuir-Blodgett multilayers},
  year      = {1992},
  abstract  = {The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X- rays are described using the example of a stearic acid multilayer. Three different techniques for the determiantion of the electron density profile from reflectivity data are compared; a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the besft structure model is outlined.},
  language  = {en}
}