@article{UlyanenkovKlemradtPietsch1998, author = {Ulyanenkov, A. and Klemradt, U. and Pietsch, Ullrich}, title = {Investigation of strain relaxation in GaInAs/GaAs superlattices by x-ray diffuse scattering}, year = {1998}, language = {en} } @article{UlyanenkovDarowskiGrenzeretal.1999, author = {Ulyanenkov, A. and Darowski, Nora and Grenzer, J{\"o}rg and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred}, title = {Evaluation of strain distribution in freestanding and bruied lateral nanostructures}, year = {1999}, language = {en} } @article{UlyanenkovBaumbachDarowskietal.1999, author = {Ulyanenkov, A. and Baumbach, Tilo and Darowski, Nora and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and Wiebach, T.}, title = {Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]}, year = {1999}, language = {en} } @article{TsirelsonAvilovLepeshovetal.2001, author = {Tsirelson, Vladimir G. and Avilov, Anatoly S. and Lepeshov, G. G. and Kuligin, A. K. and Stahn, Jochen and Pietsch, Ullrich and Spence, J. C. H.}, title = {Quantitative Analysis of the Inner-Crystal Electrostatic Potential of several Rock-Salt-Structure Crystals Using Accurate Electron-Diffraction Data}, issn = {1089-5647}, year = {2001}, language = {en} } @article{TsirelsonAbramovZavodniketal.1998, author = {Tsirelson, Vladimir G. and Abramov, Yury Fedorovich and Zavodnik, Valerie E. and Stash, Adam I. and Belokoneva, Elena L. and Stahn, Jochen and Pietsch, Ullrich and Feil, Dirk}, title = {Critical pionts in a crystal an procrystal}, year = {1998}, language = {en} } @article{ThuenemannKubowiczPietsch2000, author = {Th{\"u}nemann, Andreas F. and Kubowicz, Stephan and Pietsch, Ullrich}, title = {Ultra-thin solid polyelectrolyte-surfactant complex films : structure and wetting}, year = {2000}, language = {en} } @article{TalalaevTommElsaesseretal.2005, author = {Talalaev, V and Tomm, JW and Elsaesser, T and Zeimer, Ute and Fricke, J and Knauer, A and Kissel, H and Weyers, Markus and Tarasov, GG and Grenzer, J{\"o}rg and Pietsch, Ullrich}, title = {Carrier dynamics in laterally strain-modulated InGaAs quantum wells}, year = {2005}, abstract = {We investigate the transient recombination and transfer properties of nonequilibrium carriers in an In0.16Ga0.84As/GaAs quantum well (QW) with an additional lateral confinement implemented by a patterned stressor layer. The structure thus contains QW- and quantum-wire-like areas. At low excitation densities, photoluminescence (PL) transients from both areas are well described by a rate equation model for a three-level system with a saturable interlevel carrier transfer representing the lateral drift of carriers from the QW regions into the wires. Small-signal carrier lifetimes for QW, wires, and transfer time from QW to wire are 180, 190, and 28 ps, respectively. For high excitation densities the time constants of the observed transients increase, in agreement with the model. In addition, QW and wire PL lines merge indicating a smoothening of the potential difference, i.e., the effective carrier confinement caused by the stressor structure becomes weaker with increasing excitation. (c) 2005 American Institute of Physics}, language = {en} } @article{StoemmerMartinGeueetal.1998, author = {St{\"o}mmer, Ralph and Martin, C. R. and Geue, Thomas and G{\"o}bel, H. and Hub, W. and Pietsch, Ullrich}, title = {Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy}, year = {1998}, language = {en} } @article{StoemmerGoebelHubetal.1998, author = {St{\"o}mmer, Ralph and G{\"o}bel, H. and Hub, W. and Pietsch, Ullrich}, title = {X-ray scattering from silicon surfaces}, year = {1998}, language = {en} } @article{StruthDecherSchmittetal.1999, author = {Struth, Bernd and Decher, Gero and Schmitt, J. and Hofmeister, Wolfgang and Neißendorfer, Frank and Pietsch, Ullrich and Brezesinski, Gerald and M{\"o}hwald, Helmuth}, title = {Chemical modification of Topaz surfaces}, issn = {0928-4931}, year = {1999}, language = {en} } @article{StahnPucherPietschetal.1999, author = {Stahn, Jochen and Pucher, Andreas and Pietsch, Ullrich and Zellner, J. and Weckert, E.}, title = {Experimental determination of electric field induced differences in structure factor phases in the order of 2\%}, year = {1999}, language = {en} } @article{StahnPucherGeueetal.1998, author = {Stahn, Jochen and Pucher, Andreas and Geue, Thomas and Daniel, A. and Pietsch, Ullrich}, title = {Electric field induced electron density response of GaAs and ZnSe}, year = {1998}, language = {en} } @article{StahnPietschBlahaetal.2001, author = {Stahn, Jochen and Pietsch, Ullrich and Blaha, Pawel and Schwarz, K. H.}, title = {Electric field induced charge-density variations in covalently bonded compounds}, year = {2001}, language = {en} } @article{StahnMoehlePietsch1996, author = {Stahn, Jochen and M{\"o}hle, Marcus and Pietsch, Ullrich}, title = {Accurate structure determination for GaAs using Pendell{\"o}sung oscillation}, year = {1996}, language = {en} } @article{StahnMoehlePietsch1998, author = {Stahn, Jochen and M{\"o}hle, Marcus and Pietsch, Ullrich}, title = {Comparison of theoretical and experimental structure amplitudes of GaAs}, year = {1998}, language = {en} } @article{StahnGeueGrenzeretal.2000, author = {Stahn, Jochen and Geue, Thomas and Grenzer, J{\"o}rg and Pietsch, Ullrich}, title = {Interaction of short-chain alkanes with surface and interfaces of multilayer films built from amphiphilic molecules: an in-situ X-ray and neutron scattering probe}, year = {2000}, language = {en} } @article{SiebrechtSchreyerEnglischetal.1997, author = {Siebrecht, R. and Schreyer, A. and Englisch, Uwe and Pietsch, Ullrich and Zabel, Hartmut}, title = {The new reflectometer ADAM at the ILL}, year = {1997}, language = {en} } @article{SendvonKozierowskiPanzneretal.2009, author = {Send, Sebastian and von Kozierowski, Marc and Panzner, Tobias and Gorfman, Semen and Nurdan, Kivanc and Walenta, Albert H. and Pietsch, Ullrich and Leitenberger, Wolfram and Hartmann, Robert and Str{\"u}der, Lothar}, title = {Energy-dispersive Laue diffraction by means of a frame-store pnCCD}, issn = {0021-8898}, doi = {10.1107/S0021889809039867}, year = {2009}, language = {en} } @article{SendAbboudLeitenbergeretal.2012, author = {Send, Sebastian and Abboud, Ali and Leitenberger, Wolfram and Weiss, Manfred S. and Hartmann, Robert and Str{\"u}der, Lothar and Pietsch, Ullrich}, title = {Analysis of polycrystallinity in hen egg-white lysozyme using a pnCCD}, series = {Journal of applied crystallography}, volume = {45}, journal = {Journal of applied crystallography}, number = {6}, publisher = {Wiley-Blackwell}, address = {Hoboken}, issn = {0021-8898}, doi = {10.1107/S0021889812015038}, pages = {517 -- 522}, year = {2012}, abstract = {A crystal of hen egg-white lysozyme was analyzed by means of energy-dispersive X-ray Laue diffraction with white synchrotron radiation at 2.7 angstrom resolution using a pnCCD detector. From Laue spots measured in a single exposure of the arbitrarily oriented crystal, the lattice constants of the tetragonal unit cell could be extracted with an accuracy of about 2.5\%. Scanning across the sample surface, Laue images with split reflections were recorded at various positions. The corresponding diffraction patterns were generated by two crystalline domains with a tilt of about 1 degrees relative to each other. The obtained results demonstrate the potential of the pnCCD for fast X-ray screening of crystals of macromolecules or proteins prior to conventional X-ray structure analysis. The described experiment can be automatized to quantitatively characterize imperfect single crystals or polycrystals.}, language = {en} } @article{SendAbboudHartmannetal.2013, author = {Send, Sebastian and Abboud, Ali and Hartmann, Robert and Huth, M. and Leitenberger, Wolfram and Pashniak, N. and Schmidt, J. and Str{\"u}der, Lothar and Pietsch, Ullrich}, title = {Characterization of a pnCCD for applications with synchrotron radiation}, series = {Nuclear instruments \& methods in physics research : a journal on accelerators, instrumentation and techniques applied to research in nuclear and atomic physics, materials science and related fields in physics ; A, Accelerators, spectrometers, detectors and associated equipment}, volume = {711}, journal = {Nuclear instruments \& methods in physics research : a journal on accelerators, instrumentation and techniques applied to research in nuclear and atomic physics, materials science and related fields in physics ; A, Accelerators, spectrometers, detectors and associated equipment}, number = {5}, publisher = {Elsevier}, address = {Amsterdam}, issn = {0168-9002}, doi = {10.1016/j.nima.2013.01.044}, pages = {132 -- 142}, year = {2013}, abstract = {In this work we study the response of a pnCCD by means of X-ray spectroscopy in the energy range between 6 key and 20 key and by Laue diffraction techniques. The analyses include measurements of characteristic detector parameters like energy resolution, count rate capability and effects of different gain settings. The limit of a single photon counting operation in white beam X-ray diffraction experiments is discussed with regard to the occurrence of pile-up events, for which the energy information about individual photons is lost. In case of monochromatic illumination the pnCCD can be used as a fast conventional CCD with a charge handling capacity (CHC) of about 300,000 electrons per pixel. If the CHC is exceeded, any surplus charge will spill to neighboring pixels perpendicular to the transfer direction due to electrostatic repulsion. The possibilities of increasing the number of storable electrons are investigated for different voltage settings by exposing a single pixel with X-rays generated by a microfocus X-ray source. The pixel binning mode is tested as an alternative approach that enables a pnCCD operation with significantly shorter readout times.}, language = {en} } @article{SaphiannikovaHennebergGeneetal.2004, author = {Saphiannikova, Marina and Henneberg, Oliver and Gene, T. M. and Pietsch, Ullrich and Rochon, Paul}, title = {Nonlinear effects during inscription of azobenzene surface relief gratings}, issn = {1520-6106}, year = {2004}, abstract = {Surface relief gratings were inscribed on azobenzene polymer films using a pulselike exposure of an Ar+ laser. The inscription process was initiated by a sequence of short pulses followed by much longer relaxation pauses. The development of the surface relief grating was probed by a He-Ne laser measuring the scattering intensity of the first- order grating peak. The growth time of the surface relief grating was found to be larger than the length of the pulses used. This unusual behavior can be considered as a nonlinear material response associated with the trans-cis isomerization of azobenzene moieties. In this study the polymer stress was assumed to be proportional to the number of cis-isomers. One-dimensional viscoelastic analysis was used to derive the polymer deformation. The rate of trans-cis isomerization increases with the intensity of the inscribing light; in the dark it is equal to the rate of thermal cis- trans isomerization. The respective relaxation times were estimated by fitting theoretical deformation curves to experimental data}, language = {en} } @article{SaphiannikovaGeueHennebergetal.2004, author = {Saphiannikova, Marina and Geue, Thomas and Henneberg, Oliver and Morawetz, Knut and Pietsch, Ullrich}, title = {Linear viscoelastic analysis of formation and relaxation of azobenzene polymer gratings}, doi = {10.1063/1.1642606}, year = {2004}, abstract = {Surface relief gratings on azobenzene containing polymer films were prepared under irradiation by actinic light. Finite element modeling of the inscription process was carried out using linear viscoelastic analysis. It was assumed that under illumination the polymer film undergoes considerable plastification, which reduces its original Young's modulus by at least three orders of magnitude. Force densities of about 10(11) N/m(3) were necessary to reproduce the growth of the surface relief grating. It was shown that at large deformations the force of surface tension becomes comparable to the inscription force and therefore plays an essential role in the retardation of the inscription process. In addition to surface profiling the gradual development of an accompanying density grating was predicted for the regime of continuous exposure. Surface grating development under pulselike exposure cannot be explained in the frame of an incompressible fluid model. However, it was easily reproduced using the viscoelastic model with finite compressibility. (C) 2004 American Institute of Physics}, language = {en} } @article{RosePietschZeimer1997, author = {Rose, Dirk and Pietsch, Ullrich and Zeimer, Ute}, title = {Characterization of InGaAs single quantum wells buried in GaAs[001] by grazing incidence diffraction}, year = {1997}, language = {en} } @article{ReinholdGeueHuberetal.2009, author = {Reinhold, Beate and Geue, Thomas and Huber, Patrick and Sant, Tushar and Pietsch, Ullrich and Sztucki, Michael}, title = {In situ and ex situ SAXS investigation of colloidal sedimentation onto laterally patterned support}, issn = {0743-7463}, doi = {10.1021/La803078b}, year = {2009}, abstract = {We report on in situ investigations of colloidal ordering during gravity sedimentation from a colloidal suspension onto a prepatterned support using a polymeric surface relief grating (SRG) as the support. The ordering of colloids with a diameter of 420 nm was investigated by means of grazing-incidence small-angle X-ray scattering (GISAXS) and transmission SAXS using a preparation cell guaranteeing stable temperature and humidity. GISAXS was used for in situ monitoring of the time evolution of colloidal ordering within the whole illuminated sample area. The onset of ordering was indicated by the increase of integrated intensity within a small time frame shortly before complete evaporation of the dispersant. Single domains of coated samples were investigated ex situ by SAXS in transmission geometry where the irradiated sample area was 200 x 200 mu m(2) only. Domains with the typical size of a few millimeters were observed varying in orientation and crystallographic structure for various positions at the sample. They were mainly oriented along the grooves of the grating, confirming the influence of the underlying grating on colloidal ordering.}, language = {en} } @article{ReichePietschFinketal.1992, author = {Reiche, J{\"u}rgen and Pietsch, Ullrich and Fink, Hans-Peter and Lemmetyinen, Helge}, title = {A comparison fo x-ray methods for structure refinement of Langmuir-Blodgett multilayers}, year = {1992}, abstract = {The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X- rays are described using the example of a stearic acid multilayer. Three different techniques for the determiantion of the electron density profile from reflectivity data are compared; a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the besft structure model is outlined.}, language = {en} } @article{ReichePenacoradaGeueetal.1995, author = {Reiche, J{\"u}rgen and Penacorada, Florencio and Geue, Thomas and Pietsch, Ullrich and Brehmer, Ludwig}, title = {In-plane structure of uranylarachidate multilayers}, year = {1995}, language = {en} } @article{ReichePenacoradaGeueetal.1997, author = {Reiche, J{\"u}rgen and Penacorada, Florencio and Geue, Thomas and Pietsch, Ullrich and Brehmer, Ludwig}, title = {Monolayers and multilayers of uranyl arachidate : in-plane structure of uranyl arachidate multilayers}, year = {1997}, abstract = {The molecular in-plane structure of uranyl arachidate Langmuir-Blodgett (LB) films formed at different subphase pH values was analysed by means of X-ray grazing-incidence diffraction. For multilayers formed at low subphase pH a reorganisation of the arachidic acid film structure is confirmed. At appropriate subphase pH values, reorganisation of the film structure, e.g. via the formation of three-dimensional crystallites, is prevented by the presence of the uranyl ions and by the subsequent introduction of conformational disorder (gauche defects) in the alkyl chains. The observation of a macroscopic flow-induced in-plane texture in these uranyl arachidate LB films has profound implications for the design of ordered, supramolecular structures by the Langmuir-Blodgett technique.}, language = {en} } @article{ReicheKnochenhauerDieteletal.1997, author = {Reiche, J{\"u}rgen and Knochenhauer, Gerald and Dietel, Reinhard and Freydank, Anke-Christine and Zetzsche, Thomas and Pietsch, Ullrich and Brehmer, Ludwig and Barberka, Thomas Andreas and Geue, Thomas}, title = {Structure of thermally treated oxadiazoleamide Langmuir-Blodgett films}, year = {1997}, abstract = {The thermal treatment of Y-type Langmuir-Blodgett (LB) films formed from the amphiphilic derivative of 2,5- diphenyl-1,3,4-oxadiazole 1 results in changes of the molecular packing. These changes have been analysed by a combination of X-ray specular reflectivity data, X-ray grazing incidence diffraction data and scanning force microscopy images, On the basis of these experimental data we have simulated possible supramolecular structures, These simulations provide insight into the intermolecular interactions giving rise to the observed structural transitions. The crystalline structure induced by thermal treatment of the LB films is characterized by a uniaxial texture, which is correlated with the dipping direction during deposition of the LB film.}, language = {en} } @article{ReicheKnochenhauerBarberkaetal.1995, author = {Reiche, J{\"u}rgen and Knochenhauer, Gerald and Barberka, Thomas Andreas and Geue, Thomas and Pietsch, Ullrich and Brehmer, Ludwig and Hodge, P. and Tredgold, Richard H.}, title = {In-plane structure of perfluorotetra decanoic acid Langmuir-Blodgett films and films formed by vacuum deposition}, year = {1995}, language = {en} } @article{ReicheDietzelFreydanketal.1995, author = {Reiche, J{\"u}rgen and Dietzel, Birgit and Freydank, Anke-Christine and Geue, Thomas and Pietsch, Ullrich and Brehmer, Ludwig}, title = {Lateral structure of thermally treated oxadiazole Langmuir-Blodgett films}, year = {1995}, language = {en} } @article{ReicheBarberkaKnochenhaueretal.1994, author = {Reiche, J{\"u}rgen and Barberka, Thomas Andreas and Knochenhauer, Gerald and Woolley, Martin and Pietsch, Ullrich}, title = {Comprehensive structure investigation and computer modelling of perfluorododecanoic acid multilayers formed by in-vacuo thermal evaporation}, year = {1994}, language = {en} } @article{ReicheBarberkaJanietzetal.1994, author = {Reiche, J{\"u}rgen and Barberka, Thomas Andreas and Janietz, Dietmar and Hofmann, Dieter and Pietsch, Ullrich and Brehmer, Ludwig}, title = {X-ray structure investigation and computer modelling of Langmuir-Blodgett films formed from disc-shaped pentaalkines}, year = {1994}, language = {en} } @article{ReddyGuptaGomeetal.2009, author = {Reddy, Raghavendra V. and Gupta, Ajay and Gome, Anil and Leitenberger, Wolfram and Pietsch, Ullrich}, title = {In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L1(0) ordering in Fe-57/Pt multilayers}, issn = {0953-8984}, doi = {10.1088/0953-8984/21/18/186002}, year = {2009}, abstract = {In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L1(0) phase formation in [Fe(19 angstrom)/ Pt(25 angstrom)](x10) multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L1(0) phase, (ii) the ordered fct L1(0) FePt peaks start to appear at 320°C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Mossbauer spectroscopies are used to study the magnetic properties of the as- deposited and 400°C annealed multilayers. The magnetic data for the 400°C annealed sample indicate that the magnetization is at an angle of ~50° from the plane of the film.}, language = {en} } @article{PoloucekPietschGeueetal.2001, author = {Poloucek, P. and Pietsch, Ullrich and Geue, Thomas and Symietz, Christian and Brezesinski, Gerald}, title = {X-ray reflectivity analysis of thin complex Langmuir-Blodgett films}, year = {2001}, language = {en} } @article{PietschZeimerHofmannetal.2001, author = {Pietsch, Ullrich and Zeimer, Ute and Hofmann, L. and Grenzer, J{\"o}rg and Gramlich, S.}, title = {Strain induced compositional modulations in AlGaAs overlayers induced by lateral surface gratings}, issn = {0272-9172}, year = {2001}, language = {en} } @article{PietschZeimerGrenzeretal.2003, author = {Pietsch, Ullrich and Zeimer, Ute and Grenzer, J{\"o}rg and Grigorian, Souren A. and Fricke, J. and Gramlich, S. and Bugge, F. and Weyers, Markus and Trankle, G.}, title = {Influence of lateral patterning geometry on lateral carrier confinement in strain-modulated InGaAs- nanostructures}, year = {2003}, language = {en} } @article{PietschTsirelsonGorfan2003, author = {Pietsch, Ullrich and Tsirelson, Vladimir G. and Gorfan, S. V.}, title = {X-ray scattering amplitude of an atom in a permanent external electric field}, year = {2003}, language = {en} } @article{PietschStahnDavaasambuuetal.2001, author = {Pietsch, Ullrich and Stahn, Jochen and Davaasambuu, Jav and Pucher, Andreas}, title = {Electric field induced charge density variations in partially-ionic compounds}, issn = {0022-3697}, year = {2001}, language = {en} } @article{PietschSaphiannikovaHennebergetal.2004, author = {Pietsch, Ullrich and Saphiannikova, Marina and Henneberg, Oliver and Geue, Thomas}, title = {Non-linear effects during inscription of azobenzene surface relief gratings}, year = {2004}, language = {en} } @article{PietschRochonNatansohn2000, author = {Pietsch, Ullrich and Rochon, Paul and Natansohn, Almeria}, title = {Formation of a buried lateral density grating in azopenzene polymer films}, year = {2000}, language = {en} } @article{PietschPanznerPfeifferetal.2005, author = {Pietsch, Ullrich and Panzner, Tobias and Pfeiffer, Franz and Robinson, Ian K.}, title = {Substrate morphology repetition in "thick" polymer films}, year = {2005}, abstract = {Using Grazing-incidence small-angle scattering (GISAXS) technique we investigated the surface morphology of polymer films spin-coated on different silicon substrates. As substrates we used either technologically smooth silicon wafers or the same silicon wafer coated with thin aluminium or gold films which show a granular structure at the surface. Although the polymer thickness exceeds 300 nm the GISAXS pattern of the film shows the same in-plane angle distribution Delta2theta as the underlying substrate. Annealing the polymer films at a temperature above its glass transition temperature Delta2theta changed from a broad to a narrow distribution as it is typically for films on pure silicon. The experiment can be interpreted by roughness replication and density fluctuation within the polymer film created while spin-coating at room temperature. Due to the low segment mobility there are density fluctuations which repeat the surface morphology of the substrate. Above the glass temperature the polymer density can be homogenized independently from the morphology of the substrate. (C) 2004 Elsevier B.V. All rights reserved}, language = {en} } @article{PietschPanznerLeitenbergeretal.2005, author = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Vartanyants, Ivan A.}, title = {Coherence experiments using white synchrotron radiation}, year = {2005}, abstract = {Experiments at the bending magnet beamline at BESSY II (EDR beamline) profit from the excellent coherence properties of third generation synchrotron sources. Considering the exponentially decaying incident spectrum, and because no optical elements are installed except slits and vacuum windows, coherence experiments can be performed between 5 keV < E < 15 keV. First, the energy dependence of spatial coherence properties were determined measuring diffraction at single and double pinholes. Next, the coherent white radiation was used to probe the morphology of thin films in reflection geometry. The recorded intensity maps (reflectivity versus sample position) provide speckle patterns which reveal the locally varying sample morphology. Setting the incident angle, alpha(i), smaller or larger than the critical angle of total external reflection, alpha(c), one should be able to separate the surface height profile from the subsurface density modulation of a sample. The validity of this approach is verified at the example of reciprocal space maps taken from a polymer surface where we could reconstruct the lateral height profile from speckle data. (C) 2004 Elsevier B.V. All rights reserved}, language = {en} } @article{PietschPanznerLeitenbergeretal.2005, author = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Vartanyants, Ivan A.}, title = {Coherence experiments at the EDR-beamline of BESSY II}, year = {2005}, language = {en} } @article{PietschPanznerLeitenbergeretal.2003, author = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Grenzer, J{\"o}rg and Bodenthin, Th. and Geue, Thomas and M{\"o}hwald, Helmuth}, title = {Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II}, year = {2003}, language = {en} } @article{PietschMukhopadhyaySanyaletal.2004, author = {Pietsch, Ullrich and Mukhopadhyay, M. K. and Sanyal, M. K. and Datta, A. and Mukherjee, M. and Geue, Thomas and Grenzer, J{\"o}rg}, title = {Transition from two-dimensional to three-dimensional melting in Langmuir-Blodgett films}, year = {2004}, abstract = {Results of energy-dispersive x-ray reflectivity and grazing incidence diffraction studies of Langmuir-Blodgett films exhibited evolution of conventional three-dimensional melting from continuous melting, characteristic of two- dimensional systems, as a function of deposited monolayers. Continuous expansion followed by a sharp phase transition of the in-plane lattice was observed before the melting point and found to be independent of number of deposited layers. Evolution of conventional melting with an increase in the number of monolayers could be quantified by measuring stiffness against tilting of the vertical stack of molecules, which are kept together by an internal field. The internal field as defined in this model reduces as the in-plane lattice expands and the sample temperature approaches melting point. The sharpness of the melting transition, which has been approximated by a Langevin function, increases with the number of deposited monolayers}, language = {en} } @article{PietschLeitenbergerWendrocketal.2003, author = {Pietsch, Ullrich and Leitenberger, Wolfram and Wendrock, Horst and Bischoff, Lothar and Panzner, Tobias and Grenzer, J{\"o}rg and Pucher, Andreas}, title = {Double pinhole diffraction of white synchrotron radiation}, year = {2003}, language = {en} } @article{PietschKubowiczThuenemannetal.2003, author = {Pietsch, Ullrich and Kubowicz, Stephan and Th{\"u}nemann, Andreas F. and Geue, Thomas and Watson, M. D. and Tchebotareva, N. and M{\"u}llen, K.}, title = {X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface}, year = {2003}, language = {en} } @article{PietschJarreSaldittetal.2004, author = {Pietsch, Ullrich and Jarre, A. and Salditt, T. and Panzner, Tobias and Pfeiffer, F.}, title = {White beam x-ray waveguide optics}, year = {2004}, abstract = {We report a white beam x-ray waveguide (WG) experiment. A resonant beam coupler x-ray waveguide (RBC) is used simultaneously as a broad bandpass (or multibandpass) monochromator and as a beam compressor. We show that, depending on the geometrical properties of the WG, the exiting beam consists of a defined number of wavelengths which can be shifted by changing the angle of incidence of the white x-ray synchrotron beam. The characteristic far-field pattern is recorded as a function of exit angle and energy. This x-ray optical setup may be used to enhance the intensity of coherent x-ray WG beams since the full energetic acceptance of the WG mode is transmitted. (C) 2004 American Institute of Physics}, language = {en} } @book{PietschHolyBaumbach2004, author = {Pietsch, Ullrich and Hol{\´y}, V{\´a}clav and Baumbach, Tilo}, title = {High resolution X-ray scattering from thin films and lateral nanostructures}, series = {Advanced texts in physics : physics and astronomy online library}, journal = {Advanced texts in physics : physics and astronomy online library}, edition = {2. ed.}, publisher = {Springer}, address = {New York}, isbn = {0-387-40092-3}, pages = {XVI, 408 S. : graph. Darst.}, year = {2004}, language = {en} } @article{PietschHolyStroemmeretal.1995, author = {Pietsch, Ullrich and Hol{\´y}, Vaclav and Str{\"o}mmer, R. and Englisch, Uwe}, title = {X-ray and neutron diffuse scattering from multilayers of fatty acid salt molecules}, year = {1995}, language = {en} }