@article{ReichePietschFinketal.1992, author = {Reiche, J{\"u}rgen and Pietsch, Ullrich and Fink, Hans-Peter and Lemmetyinen, Helge}, title = {A comparison fo x-ray methods for structure refinement of Langmuir-Blodgett multilayers}, year = {1992}, abstract = {The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X- rays are described using the example of a stearic acid multilayer. Three different techniques for the determiantion of the electron density profile from reflectivity data are compared; a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the besft structure model is outlined.}, language = {en} } @article{ReicheBarberkaKnochenhaueretal.1994, author = {Reiche, J{\"u}rgen and Barberka, Thomas Andreas and Knochenhauer, Gerald and Woolley, Martin and Pietsch, Ullrich}, title = {Comprehensive structure investigation and computer modelling of perfluorododecanoic acid multilayers formed by in-vacuo thermal evaporation}, year = {1994}, language = {en} } @article{ReicheBarberkaJanietzetal.1994, author = {Reiche, J{\"u}rgen and Barberka, Thomas Andreas and Janietz, Dietmar and Hofmann, Dieter and Pietsch, Ullrich and Brehmer, Ludwig}, title = {X-ray structure investigation and computer modelling of Langmuir-Blodgett films formed from disc-shaped pentaalkines}, year = {1994}, language = {en} } @article{ReichePenacoradaGeueetal.1995, author = {Reiche, J{\"u}rgen and Penacorada, Florencio and Geue, Thomas and Pietsch, Ullrich and Brehmer, Ludwig}, title = {In-plane structure of uranylarachidate multilayers}, year = {1995}, language = {en} } @article{ReicheKnochenhauerBarberkaetal.1995, author = {Reiche, J{\"u}rgen and Knochenhauer, Gerald and Barberka, Thomas Andreas and Geue, Thomas and Pietsch, Ullrich and Brehmer, Ludwig and Hodge, P. and Tredgold, Richard H.}, title = {In-plane structure of perfluorotetra decanoic acid Langmuir-Blodgett films and films formed by vacuum deposition}, year = {1995}, language = {en} } @article{PietschHolyStroemmeretal.1995, author = {Pietsch, Ullrich and Hol{\´y}, Vaclav and Str{\"o}mmer, R. and Englisch, Uwe}, title = {X-ray and neutron diffuse scattering from multilayers of fatty acid salt molecules}, year = {1995}, language = {en} } @article{ReicheDietzelFreydanketal.1995, author = {Reiche, J{\"u}rgen and Dietzel, Birgit and Freydank, Anke-Christine and Geue, Thomas and Pietsch, Ullrich and Brehmer, Ludwig}, title = {Lateral structure of thermally treated oxadiazole Langmuir-Blodgett films}, year = {1995}, language = {en} } @article{EnglischBarberkaPietschetal.1995, author = {Englisch, Uwe and Barberka, Thomas Andreas and Pietsch, Ullrich and H{\"o}hne, U.}, title = {Investigation of the chain-chain interface in a lead-stearate multilayer using neutron reflectivity}, year = {1995}, language = {en} } @article{GeueStumpePietschetal.1995, author = {Geue, Thomas and Stumpe, Joachim and Pietsch, Ullrich and Haak, M. and Kaupp, G.}, title = {Photochemically induced changes of optical anisotropy and surface of LB-multilayers built up by an amphiphilic and liquid crystalline copolymer conating azobenzene moieties}, year = {1995}, language = {en} } @article{LichanotAzavantPietsch1996, author = {Lichanot, Albert and Azavant, P. and Pietsch, Ullrich}, title = {Ab-initio Hartree-Fock study of the electronic charge density of the cubic boron nitride and its comparison with the experiment}, year = {1996}, language = {en} } @article{PietschHansen1996, author = {Pietsch, Ullrich and Hansen, N. K.}, title = {A critical review of the valence charge density in GaAs}, year = {1996}, language = {en} } @article{StahnMoehlePietsch1996, author = {Stahn, Jochen and M{\"o}hle, Marcus and Pietsch, Ullrich}, title = {Accurate structure determination for GaAs using Pendell{\"o}sung oscillation}, year = {1996}, language = {en} } @article{SiebrechtSchreyerEnglischetal.1997, author = {Siebrecht, R. and Schreyer, A. and Englisch, Uwe and Pietsch, Ullrich and Zabel, Hartmut}, title = {The new reflectometer ADAM at the ILL}, year = {1997}, language = {en} } @article{PaschkeGeueBarberkaetal.1997, author = {Paschke, K. and Geue, Thomas and Barberka, Thomas Andreas and Bolm, A. and Pietsch, Ullrich and R{\"o}sch, M. and Batke, Edwin and Faller, F. and Kerkel, K. and Oshiniwo, J. and Forchel, Alfred}, title = {Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction}, year = {1997}, language = {en} } @article{HerrmannKauppGeueetal.1997, author = {Herrmann, A. and Kaupp, G. and Geue, Thomas and Pietsch, Ullrich}, title = {AFM and GID investigations of the gas-solid diazotation of 4-sulfanil-acid-monohydrat single crystals}, year = {1997}, language = {en} } @article{BolmEnglischPenacoradaetal.1997, author = {Bolm, A. and Englisch, Uwe and Penacorada, Florencio and Gerstenberger, M. and Pietsch, Ullrich}, title = {Temperature and time dependent investigations of cd- and uranyl-stearate multilayers by means of neutron reflectivity measurements}, year = {1997}, language = {en} } @article{RosePietschZeimer1997, author = {Rose, Dirk and Pietsch, Ullrich and Zeimer, Ute}, title = {Characterization of InGaAs single quantum wells buried in GaAs[001] by grazing incidence diffraction}, year = {1997}, language = {en} } @article{DarowskiPaschkePietschetal.1997, author = {Darowski, Nora and Paschke, K. and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and Baumbach, Tilo and Zeimer, Ute}, title = {Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction}, year = {1997}, language = {en} } @article{EnglischGutberletSeitzetal.1997, author = {Englisch, Uwe and Gutberlet, T. and Seitz, R. and Oeser, R. and Pietsch, Ullrich}, title = {Thermally induced rearrangement of fatty acid salt molecules in Langmuir-Blodgett multilayers}, year = {1997}, language = {en} } @article{NeissendorferBolmPietsch1997, author = {Neißendorfer, Frank and Bolm, A. and Pietsch, Ullrich}, title = {Energy dispersive X-ray reflectometry and X-ray grazing incidence diffraction from organic multilayers}, year = {1997}, language = {en} }