@article{SumpfMaiwaldMulleretal.2012,
  author    = {Sumpf, Bernd and Maiwald, Martin and Muller, Andre and Ginolas, Arnim and Haeusler, Karl and Erbert, Goetz and Traenkle, Guenther},
  title     = {Reliable operation for 14 500 h of a wavelength-stabilized Diode Laser System on a Microoptical Bench at 671 nm},
  series = {IEEE transactions on components, packaging and manufacturing technology},
  volume    = {2},
  journal   = {IEEE transactions on components, packaging and manufacturing technology},
  number    = {1},
  publisher = {Inst. of Electr. and Electronics Engineers},
  address   = {Piscataway},
  issn      = {2156-3950},
  doi       = {10.1109/TCPMT.2011.2171342},
  pages     = {116 -- 121},
  year      = {2012},
  abstract  = {Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm x 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 degrees C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.},
  language  = {en}
}