@phdthesis{Weidling2016,
  author    = {Weidling, Stefan},
  title     = {Neue Ans{\"a}tze zur Verbesserung der Fehlertoleranz gegen{\"u}ber transienten Fehlern in sequentiellen Schaltungen},
  school      = {Universit{\"a}t Potsdam},
  pages     = {XII, 181},
  year      = {2016},
  language  = {de}
}
@article{KrstićWeidlingPetrovicetal.2016,
  author    = {Krstić, Miloš and Weidling, Stefan and Petrovic, Vladimir and Sogomonyan, Egor S.},
  title     = {Enhanced architectures for soft error detection and correction in combinational and sequential circuits},
  series = {Microelectronics reliability},
  volume    = {56},
  journal   = {Microelectronics reliability},
  publisher = {Elsevier},
  address   = {Oxford},
  issn      = {0026-2714},
  doi       = {10.1016/j.microrel.2015.10.022},
  pages     = {212 -- 220},
  year      = {2016},
  abstract  = {In this paper two new methods for the design of fault-tolerant pipelined sequential and combinational circuits, called Error Detection and Partial Error Correction (EDPEC) and Full Error Detection and Correction (FEDC), are described. The proposed methods are based on an Error Detection Logic (EDC) in the combinational circuit part combined with fault tolerant memory elements implemented using fault tolerant master-slave flip-flops. If a transient error, due to a transient fault in the combinational circuit part is detected by the EDC, the error signal controls the latching stage of the flip-flops such that the previous correct state of the register stage is retained until the transient error disappears. The system can continue to work in its previous correct state and no additional recovery procedure (with typically reduced clock frequency) is necessary. The target applications are dataflow processing blocks, for which software-based recovery methods cannot be easily applied. The presented architectures address both single events as well as timing faults of arbitrarily long duration. An example of this architecture is developed and described, based on the carry look-ahead adder. The timing conditions are carefully investigated and simulated up to the layout level. The enhancement of the baseline architecture is demonstrated with respect to the achieved fault tolerance for the single event and timing faults. It is observed that the number of uncorrected single events is reduced by the EDPEC architecture by 2.36 times compared with previous solution. The FEDC architecture further reduces the number of uncorrected events to zero and outperforms the Triple Modular Redundancy (TMR) with respect to correction of timing faults. The power overhead of both new architectures is about 26-28\% lower than the TMR. (C) 2015 Elsevier Ltd. All rights reserved.},
  language  = {en}
}
@article{KrstićWeidlingPetrovicetal.,
  author    = {Krstić, Miloš and Weidling, Stefan and Petrovic, Vladimir and Sogomonyan, Egor S.},
  title     = {Enhanced architectures for soft error detection and correction in combinational and sequential circuits},
  series = {Microelectronics Reliability},
  volume    = {56},
  journal   = {Microelectronics Reliability},
  issn      = {0026-2714},
  pages     = {212 -- 220},
  abstract  = {In this paper two new methods for the design of fault-tolerant pipelined sequential and combinational circuits, called Error Detection and Partial Error Correction (EDPEC) and Full Error Detection and Correction (FEDC), are described. The proposed methods are based on an Error Detection Logic (EDC) in the combinational circuit part combined with fault tolerant memory elements implemented using fault tolerant master-slave flip-flops. If a transient error, due to a transient fault in the combinational circuit part is detected by the EDC, the error signal controls the latching stage of the flip-flops such that the previous correct state of the register stage is retained until the transient error disappears. The system can continue to work in its previous correct state and no additional recovery procedure (with typically reduced clock frequency) is necessary. The target applications are dataflow processing blocks, for which software-based recovery methods cannot be easily applied. The presented architectures address both single events as well as timing faults of arbitrarily long duration. An example of this architecture is developed and described, based on the carry look-ahead adder. The timing conditions are carefully investigated and simulated up to the layout level. The enhancement of the baseline architecture is demonstrated with respect to the achieved fault tolerance for the single event and timing faults. It is observed that the number of uncorrected single events is reduced by the EDPEC architecture by 2.36 times compared with previous solution. The FEDC architecture further reduces the number of uncorrected events to zero and outperforms the Triple Modular Redundancy (TMR) with respect to correction of timing faults. The power overhead of both new architectures is about 26-28\% lower than the TMR.},
  language  = {en}
}
@article{DugWeidlingSogomonyanetal.2020,
  author    = {Dug, Mehmed and Weidling, Stefan and Sogomonyan, Egor and Jokic, Dejan and Krstić, Miloš},
  title     = {Full error detection and correction method applied on pipelined structure using two approaches},
  series = {Journal of circuits, systems and computers},
  volume    = {29},
  journal   = {Journal of circuits, systems and computers},
  number    = {13},
  publisher = {World Scientific},
  address   = {Singapore},
  issn      = {0218-1266},
  doi       = {10.1142/S0218126620502187},
  pages     = {15},
  year      = {2020},
  abstract  = {In this paper, two approaches are evaluated using the Full Error Detection and Correction (FEDC) method for a pipelined structure. The approaches are referred to as Full Duplication with Comparison (FDC) and Concurrent Checking with Parity Prediction (CCPP). Aforementioned approaches are focused on the borderline cases of FEDC method which implement Error Detection Circuit (EDC) in two manners for the purpose of protection of combinational logic to address the soft errors of unspecified duration. The FDC approach implements a full duplication of the combinational circuit, as the most complex and expensive implementation of the FEDC method, and the CCPP approach implements only the parity prediction bit, being the simplest and cheapest technique, for soft error detection. Both approaches are capable of detecting soft errors in the combinational logic, with single faults being injected into the design. On the one hand, the FDC approach managed to detect and correct all injected faults while the CCPP approach could not detect multiple faults created at the output of combinational circuit. On the other hand, the FDC approach leads to higher power consumption and area increase compared to the CCPP approach.},
  language  = {en}
}