@article{DarowskiPaschkePietschetal.1998,
  author    = {Darowski, Nora and Paschke, K. and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and L{\"u}bbert, Daniel and Baumbach, Tilo},
  title     = {Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction},
  year      = {1998},
  language  = {en}
}
@article{DarowskiPaschkePietschetal.1997,
  author    = {Darowski, Nora and Paschke, K. and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and Baumbach, Tilo and Zeimer, Ute},
  title     = {Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction},
  year      = {1997},
  language  = {en}
}
@article{PaschkeGeueBarberkaetal.1997,
  author    = {Paschke, K. and Geue, Thomas and Barberka, Thomas Andreas and Bolm, A. and Pietsch, Ullrich and R{\"o}sch, M. and Batke, Edwin and Faller, F. and Kerkel, K. and Oshiniwo, J. and Forchel, Alfred},
  title     = {Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction},
  year      = {1997},
  language  = {en}
}